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Asap2460 sorption analyzer

Manufactured by Micromeritics
Sourced in United States

The ASAP2460 sorption analyzer is a laboratory instrument designed to measure the surface area and porosity characteristics of solid materials. It uses the principles of gas adsorption to determine these properties.

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2 protocols using asap2460 sorption analyzer

1

Comprehensive Material Characterization Protocol

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The morphology of all samples was observed through scanning electron microscopy (SEM) conducted on an FEI Apreo S instrument. The X-ray diffraction (XRD) patterns were acquired using a Rigaku SmartLab SE X-ray diffractometer. N2 adsorption–desorption isotherms were measured at −196 °C with a Micromeritics ASAP2460 sorption analyzer. The Au content measurement of all samples was performed using inductively coupled plasma atomic emission spectroscopy (ICP-AES) on a Agilent 725 instrument. X-ray photoelectron spectroscopy (XPS) was performed using a Thermo ESCA LAB Xi+ spectrometer to analyze the state of the gold and manganese species in the samples, and the results were calibrated using the C 1s peak at 284.8 eV. Fourier-transform infrared (FT-IR) spectra were collected on a Thermo Nicolet iS20 spectrometer. Thermogravimetric analysis (TGA) of the samples, at temperatures ranging from 25–800 °C, was performed using a Henven HTG-4 analyzer.
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2

Comprehensive Characterization of Materials

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X-ray diffraction (XRD) of the materials were carried out on a D/max 2500 PC diffractometer (Rigaku Company, Japan). The test conditions were Cu Kα radiation (λ = 0.15406 nm), 40 kV, 150 mA, 2θ 5°–80° and step length 0.02°. N2 adsorption isotherms were measured on an ASAP2460 sorption analyzer (Micromeritics, Norcross, Georgia, USA). NH3-TPD tests were performed on a CHEMBET3000 chemical adsorption instrument (Quantachrome Company, USA). Scanning electron microscope (SEM) of the materials were carried out on SUPRA55 instrument (Zeiss Company, Japan). X-ray photoelectron spectroscopy (XPS) of the materials were carried out on K-Alpha instrument (Thermo Fisher Scientific Company, USA). Test conditions: the excitation source was Al-Kα (1486.8 eV), the background vacuum was 5.0 × 10−7 mBar, and the variable carbon C 1s = 284.80 eV was used as the standard for nuclear power correction. Electron-coupled plasma atomic emission spectrometry (ICP) of the materials were carried out on Vista-AX instrument (Varian Company, USA). FT-IR spectra after adsorption of pyridine (Py-IR) of the materials were carried out on Nicolet 9700 instrument (Thermo Fisher Scientific Company, USA).
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