Libra 200 mc schottky field emission gun instrument

MWCNTs and hybrid materials synthesized in this work were characterized using various physical and chemical analysis techniques. XRD analysis of the MWCNTs samples and hybrid materials was performed at a CuK_α-radiation on a Bruker D8 Discover X-ray diffractometer (Bruker Corporation, Billerica, MA, USA) in the θ-2θ symmetrical geometry with a Gobel mirror, an equatorial Soller slit with the angular divergence of 2.5°, and a slit of 1.5 mm on the primary beam. The obtained diffraction patterns were processed using EVA with the PDF-2 (2012) powder diffraction database.
The surface morphology of the synthesized materials was examined by SEM using Supra 50VP (Carl Zeiss AG, Oberkochen, Germany) scanning electron microscope. The structure of the MWCNTs, pyrolytic chromium and pyrolytic iron coatings grown by deposition from COL and Fe(CO)₅ on the surface of the MWCNTs was studied by TEM with a LIBRA 200 MC Schottky field-emission gun instrument (Carl Zeiss AG, Oberkochen, Germany) operating at 200 kV and the information resolution limit of 0.12 nm. These equipments are the property of the Center “Physics and technology of micro- and nanostructures” at Institute for Physics of Microstructures of Russian academy of sciences.

XRD analysis of the MWCNT samples and hybrid materials was performed with CuK_α-radiation using Bruker D8 Discover X-ray diffractometer (Bruker Corporation, Billerica, MA, USA) in the θ-2θ symmetrical geometry with a Gobel mirror, an equatorial Soller slit with the angular divergence of 2.5°, and a slit of 1.5 mm on the primary beam. The obtained diffraction patterns were processed using DIFFRAC.EVA software with the PDF-2 (2012) powder diffraction database.
The surface morphology of the synthesized materials was examined by SEM using Supra 50VP (Carl Zeiss AG, Oberkochen, Germany) scanning electron microscope. The structure of the MWCNT and Cu coatings deposited on the surface of the MWCNT was studied by TEM with a LIBRA 200 MC Schottky field-emission gun instrument (Carl Zeiss AG, Oberkochen, Germany) operating at 200 kV and the information resolution limit of 0.12 nm. EDS data were obtained using a Hitachi Regulus 8100 scanning electron microscope equipped with a Bruker XFlash 6–60 energy dispersive X-ray detector.
XRD, TEM, HRTEM, SEM, and EDS measurements were conducted using equipment of the Center “Physics and technology of micro- and nanostructures” at the Institute for Physics of Microstructures of RAS (N. Novgorod, Russia) and Syktyvkar State University (Syktyvkar, Russia).