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Jsm 6510lvs scanning electron microscope

Manufactured by JEOL

The JSM-6510LVS is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-quality images of samples through the use of an electron beam that scans the surface of the specimen. The JSM-6510LVS is capable of operating in both high and low vacuum modes, allowing for the examination of a wide range of sample types.

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2 protocols using jsm 6510lvs scanning electron microscope

1

SEM Imaging of Epithelial Cells

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The epithelial cells grown on filter inserts were fixed 30 min after the application of osmotic changes with 10% paraformaldehyde and 1% glutaraldehyde/0.1 M HEPES buffer for 2 h. Then the cells were post-fixed with 1% osmium tetroxide/0.1 M HEPES buffer for 60 min, followed by the dehydration with ethanol in a similar manner as described in the previous subsection. Next, the ethanol was replaced with t-butanol, and the epithelia were frozen at −20°C followed by the sublimation of t-butanol. The filters were mounted on aluminum planchets with carbon adhesive, and coated with platinum using an ion coater. The samples were then observed by a JSM-6510LVS scanning electron microscope (JEOL).
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2

SEM Analysis of Epithelial Cultures

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Epithelia grown on filters under the ‘Apical’ and ‘Basal’ conditions were fixed with 10% paraformaldehyde and 1% glutaraldehyde/0.1 M HEPES buffer for 2 h, post-fixed with 1% osmium tetroxide/0.1 M HEPES buffer for 60 min, and dehydrated with ethanol in a similar manner as described in Transmission electron microscopy. The ethanol was then replaced with t-butanol, and the epithelia were frozen at −20°C followed by the sublimation of t-butanol. The filters were mounted on aluminum planchets with carbon adhesive and coated with platinum using an ion coater, and the samples were observed by a JSM-6510LVS scanning electron microscope (JEOL).
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