The surface morphology of LZH was studied with a JEOL JSM-7610F field emission SEM at an accelerating voltage of 5 kV. The specific surface area of LZH was measured with a Micromeritics ASAP 2020 BET N2 (Norcross, GA, U.S.A.) surface area analyzer at 77 K. The crystallinity was analyzed with a Rigaku Miniflex-600 XRD (Chapel Hill, NC-U.S.A.), equipped with Cu-Kα lamp (λ = 0.154 nm). The high-resolution XPS measurement was carried out on a ThermoFisher 250 ESCALAB XPS platform. A monochromatic Al Kα X-ray source with a beam energy of 1486 eV and a 180° hemisphere electron analyzer was utilized with an overall energy resolution of better than 500 meV. All of the core level spectra were taken with a normal emission and a pass energy of 20 eV. The binding energy positions were calibrated with respect to the adventitious C–C signal at 284.8 eV. Zeta potential analysis of the LZH material was conducted on a Malvern Zetasizer Ultra equipment. The analysis of phosphate and other anions were conducted on a Dionex Ion Chromatography System (ICS-5000).
Miniflex 600 xrd
Manufactured by Rigaku
Sourced in Japan, United States
The Miniflex 600 XRD is a compact X-ray diffractometer designed for qualitative and quantitative phase analysis. It features a 600 W X-ray source and a high-speed detector, enabling fast and efficient data collection. The Miniflex 600 XRD is capable of analyzing a wide range of materials, including powders, thin films, and small samples.
Automatically generated - may contain errors
Lab products found in correlation
Jsm 7610f, by JEOL (2 mentions)
Ics 5000, by Thermo Fisher Scientific (1 mentions)
Camera eos600d, by Canon (1 mentions)
U 3900 spectrophotometer, by Hitachi (1 mentions)
Fs5 spectrofluorometer, by Edinburgh Instruments (1 mentions)
Jem 1011, by JEOL (1 mentions)
2100 hrtem, by JEOL (1 mentions)
Talos f200x tem, by Thermo Fisher Scientific (1 mentions)
Avance nmr spectrometer, by Bruker (1 mentions)
Uv visible spectrophotometer, by Shimadzu (1 mentions)
Vibrating sample magnetometer, by Lake Shore Cryotronics (1 mentions)
7 protocols using miniflex 600 xrd
1
Comprehensive Characterization of LZH Material
2
Multi-Technique Materials Characterization
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X-ray diffraction (XRD) patterns of samples were gauged by Rigaku MiniFlex/600 XRD (Tokyo, Japan, CuKα1, λ = 0.154056 nm) equipment. Fourier transforms infrared (FT-IR) spectra was characterized by a NEXUS 670 spectrophotometer (Thermo Nicolet, Waltham, MA, USA). U-3900 spectrophotometer (Hitachi, Tokyo, Japan) was used to test transmission spectra. Excitation and emission spectra, internal quantum efficiency (IQE), and decay curves were investigated with a FS5 spectrofluorometer (Edinburgh Instruments, Livingston, UK) equipped with a 150 W Xe lamp. XEL spectra were accomplished on an OmniFluo960-X-ray scintillator fluorescence spectrometer (Zolix Instruments, Beijing, China). Pictures of X-ray imaging were taken by a Canon camera (EOS600D).
3
Structural Characterization of CsPbBr3 Perovskite Quantum Dots
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Structural characterization: Quantum dot structure and morphology of the CsPbBr3 perovskite were analyzed via transmission electron microscopy (TEM; JEOL JEM-1011, JEOL, Tokyo, Japan). The samples were prepared by adding a few drops of dilute PQD solution onto TEM grids. The crystallization structures and the crystal phase of CsPbBr3 PQDs were characterized using X-ray diffraction (XRD) analysis (Miniflex 600 XRD, Rigaku, Japan) with a copper Kα radiation source (λ = 1.5418 Å). The scanning range was 2θ = 10°–80° for a scan rate of 3° min−1 with a step size of 0.02°.
4
Characterization of CsPbBr3 Perovskite Quantum Dots
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High-resolution transmission
electron microscopy (HR-TEM) was conducted using a 2100 HR-TEM (JEOL,
Japan) at an accelerating voltage of 200 kV. The HR-TEM was equipped
with an energy-dispersive X-ray spectrometer, which was used to perform
elemental analysis and generate lateral distribution maps of the elements
at selected locations on the samples. Elements in the samples emitted
X-rays with characteristic wavelengths after excitation by the incident
electron beam. A JSM-6380 scanning electron microscope (SEM, JEOL)
was also used to examine the morphologies of the films. The crystal
phases in the CsPbBr3 PQD films were determined via X-ray
diffraction (XRD) analysis using a Miniflex 600 XRD (Rigaku, Japan)
equipped with a copper Kα radiation source (λ = 1.5418
Å). Scanning from (2θ) 10–80° was performed
at a scan rate of 3° min–1 with a step size
of 0.02°.
electron microscopy (HR-TEM) was conducted using a 2100 HR-TEM (JEOL,
Japan) at an accelerating voltage of 200 kV. The HR-TEM was equipped
with an energy-dispersive X-ray spectrometer, which was used to perform
elemental analysis and generate lateral distribution maps of the elements
at selected locations on the samples. Elements in the samples emitted
X-rays with characteristic wavelengths after excitation by the incident
electron beam. A JSM-6380 scanning electron microscope (SEM, JEOL)
was also used to examine the morphologies of the films. The crystal
phases in the CsPbBr3 PQD films were determined via X-ray
diffraction (XRD) analysis using a Miniflex 600 XRD (Rigaku, Japan)
equipped with a copper Kα radiation source (λ = 1.5418
Å). Scanning from (2θ) 10–80° was performed
at a scan rate of 3° min–1 with a step size
of 0.02°.
5
Characterization of Modified Halloysite Nanotubes
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The surface morphology of the samples was studied with a JEOL JSM-7610F field emission SEM at an accelerating voltage of 5 kV. TEM images were obtained by placing the sample on lacey carbon film using an FEI Talos F200X TEM, and operating the TEM at 200 kV; the TEM is equipped with an STEM and an energy dispersive X-ray spectroscope (EDX). The specific surface area of HNT and modified HNT was measured with a Micromeritics ASAP 2020 BET N2 (Norcross, GA, U.S.A.) surface area analyzer at 77 K. A Rigaku ZSX Primus II Wavelength Dispersive XRF (Austin, TX, U.S.A.) was used to perform elemental analysis, while crystallinity was analyzed with a Rigaku Miniflex-600 XRD (Chapel Hill, NC-U.S.A.), equipped with Cu-Kα lamp (λ = 0.154 nm). Surface charge was measured with a Mobius (Santa Barbara, CA, U.S.A.) zeta potential analyzer.
6
Structural Analysis of Polymer Blends
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The molecular (re) arrangement of the native polymers and the composite nanosystem was determined using a benchtop X-Ray Diffractometer (MiniFlex600 XRD, Rigaku Corp., Tokyo, Japan) incorporated with a highintensity D/tex ultra-high speed 1D detector, a 600 W X-ray generator, and a counter monochromator. The XRD profiles of each sample (i.e., PA, PLA, and PA-PLA blends) were analyzed with phase determination of each sample correlated by the peak intensity presented in the DSC thermograms.
7
Characterization of Fluorinated Molecular Probes
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NMR spectra of the pure fluoroprobe and its modified analogues were recorded on a Bruker Avance NMR spectrometer (1H, 500 MHz). Powder XRD studies were conducted using Rigaku Miniflex 600 XRD instrument operating at 1.54 Å with a CuKα source. A Jeol/JEM 2100 high resolution transmission electron microscope (HRTEM) operating at 200 kV was used to record the TEM images. The magnetic properties were analysed using a Lake Shore Cryotronics vibrating sample magnetometer (VSM). The UV/visible absorption spectrum was recorded on a Shimadzu UV/visible spectrophotometer in the range 190–1100 nm. Horiba Flouoromax-4- spectrofluorometer was used for fluorescence measurement.
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