The morphological, surface, and porous structures of the CS-HAP microsponges were investigated using an optical microscope (OPM; Leica DM2700P, Germany) and a scanning electron microscope (SEM; Zeiss Supra 40, Germany). The phase composition of nHAP was characterized by an X-ray diffractometer (XRD; Philips X’Pert PRO SUPER, Netherlands) with Cu Kα radiation. The elemental composition and distribution of the CS-HAP surface were measured by energy-dispersive X-ray spectroscopy (EDX) using an SEM equipped with an X-ray detector (Oxford Instruments, Ultim Max, UK).
X pert pro super
Manufactured by Philips
Sourced in Netherlands, United States
The X'Pert Pro Super is a powder X-ray diffractometer designed for material analysis. It is capable of performing phase identification, quantitative analysis, and structural characterization of a wide range of materials, including ceramics, metals, polymers, and nanomaterials. The instrument features advanced optics and detection systems to provide high-quality data for research and industrial applications.
Automatically generated - may contain errors
Lab products found in correlation
Arm200f, by JEOL (4 mentions)
H 7700, by Hitachi (3 mentions)
H 7650, by Hitachi (2 mentions)
S 4800, by Hitachi (2 mentions)
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Supra 40, by Zeiss (1 mentions)
Dm2700p, by Leica camera (1 mentions)
Ultim max, by Oxford Instruments (1 mentions)
Optima 7300 dv, by PerkinElmer (1 mentions)
7500 series, by Agilent Technologies (1 mentions)
Su8020, by Hitachi (1 mentions)
Autolab, by Metrohm (1 mentions)
Escalab 250, by Thermo Fisher Scientific (1 mentions)
Supra 40, by Hitachi (1 mentions)
Asap 2020, by Micromeritics (1 mentions)
Su8220, by Hitachi (1 mentions)
Asap 2460, by Micromeritics (1 mentions)
Jsm 6700f, by JEOL (1 mentions)
Jem 2010f, by JEOL (1 mentions)
Atomscan advantage, by Thermo Fisher Scientific (1 mentions)
15 protocols using x pert pro super
1
Characterizing CS-HAP Microsponge Structure
2
Characterization of Catalytic Nanostructures
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The morphology of the catalysts were tested on a JEOL-2100F transmission electron microscopy (TEM) at 200 kV. The field emission scanning electron microscopy (SEM) images and EDS were taken on a Gemini SEM 500 scanning electron microscope. The EDS were conducted in 26FEI Talos F200X at 200 KV. Sub-Å-resolution aberration-corrected HAADF-STEM measurements were conducted on a JEM-ARM 200 F instrument at the accelerating voltage of 200 kV. The powder X-ray diffraction (XRD) patterns were collected on Philips X’ pert Pro Super diffractometer with Cu Kα radiation (λ = 1.5418 Å). The concentration of Ru atoms was directly measured by inductively coupled plasma atomic emission spectroscopy (Optima 7300 DV, PerkinElmer, USA). XPS measurements were tested on an ESCALAB MKII instrument equipped with an Mg Kα source (hν = 1253.6 eV). P solid-state NMR spectra were conducted on an AVANCE III 400WB instrument.
3
Characterization of Ru-Based Nanocatalysts
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Transmission electron microscopy (TEM) and Field-Emission Scanning Electron Microscopy (SEM) images were obtained from a Hitachi H7700 and SU8020 (Tokyo, Japan) at an accelerating voltage of 100 KV. The data of high-revolution TEM images and EDS elemental mapping were obtained from a JEM-2100F (Tokyo, Japan). The catalyst solution was applied onto 300-mesh copper grids coated with formvar/carbon support film (Beijing Zhongjing Key Technology Co., Ltd., Beijing, China). The powder X-ray diffraction (XRD) patterns were obtained on Philips X’Pert Pro Super with a Cu Ka radiation source (λ = 1.541841 Å). X-ray photoelectron spectra (XPS) were measured using an Al Kα radiation source on a Thermo Fisher ESCALAB 250Xi (Waltham, MA, USA). The peak shifts caused by apparent charging were calibrated using the carbon C 1s peak set to 284.8 eV. All spectra were collected in ambient conditions. All electrochemical performances were conducted with an electrochemical workstation (Autolab, Metrohm, Herisau, Switzerland). The noble metal mass content of Ru in Ru1W0.14Zn1.47Ox and RuZnOx nanocages were determined by inductively coupled plasma-Mass Spectrometry (ICP-MS, Agilent Technologies 7500 series, Santa Clara, CA, USA).
4
Multianalytical Characterization of Pt Catalysts
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XRD patterns were recorded by using a Philips X’Pert Pro Super diffractometer with Cu-Kα radiation (λ = 1.54178 Å). XPS measurements were conducted on an ESCALAB 250 (Thermo-VG Scientific, USA) with an Al Kα X-ray source (1486.6 eV protons) in Constant Analyser Energy (CAE) mode with a pass energy of 30 eV for all spectra. ICP-AES (Atomscan Advantage, Thermo Jarrell Ash, USA) was used to determine the loading amount of Pt. TEM images were taken using a Hitachi H-7700 transmission electron microscope at an acceleration voltage of 100 kV. HAADF analysis was collected on a Titan Themis Z transmission electron microscope with double aberration.
5
Morphological Analysis of Materials
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SEM (Zersss Supra 40) and TEM (Hitachi H7700) were performed to investigate the morphology of the samples. The STEM and HRTEM images, and EDX elemental mappings, were obtained on Atomic-Resolution Analytical Microscope (JEM-ARM 200F) with an acceleration voltage of 200 kV. N2 adsorption/desorption analysis was taken on an ASAP 2020 (Micromeritics, USA) at 77 K. XRD was conducted on a Philips X’Pert Pro Super with Cu Kα radiation (λ = 1.541841 Å). ICP-AES results were taken by Optima 7300 DV instrument. The UPS was conducted on the BL10B beamline and XPS was conducted on the BL11U beamline of National Synchrotron Radiation Laboratory in Hefei (China).
6
Characterization of Cu-Coated Graphite Electrodes
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The morphologies of CuNWs, G@Cu, and G@Cu-CuNWs were observed by the SEM (JEOL-6700F). The electrode samples for the cross-sectional SEM observation were prepared using argon (Ar) ion beam at 10 keV in ion beam sampling (EMTIC 3X, Leica Company) to cut out the flat surface. To protect the cross-sectional up-surface damage from the Ar ion beam, Pt was predeposited on the surface of the electrode via magnetron sputtering (Kurt J. Lesker Lab18). The SEM images of the obtained cross-sectional surfaces were taken in a SE mode at 5 keV (SU8220, Hitachi). The elementary mapping was collected by energy disperse spectroscopy (Oxford Aztec X-Max 80) . Powder x-ray diffraction patterns (Philips X’Pert PRO SUPER) demonstrated that the Cu nanoparticles were coated on the graphite particles. The TGA measurements were performed by TG Q5000 IR to reveal the content of Cu on the G@Cu particles. The weight loss of TGA was recorded from 298 to 1073 K in heating steps of 5 K min−1 under a constant air flow. The electronic conductivity of the electrode was tested by a M-3 Mini type four-probe tester. The thickness of the electrode was measured on the cross-sectional SEM image, and the corresponding compact density was calculated via the formula ρcompact=Ma/S × L, where Ma is the mass of the graphite, S is the bottom surface area of the electrode, and L is the thickness of the electrode.
7
Comprehensive Materials Characterization Protocol
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TEM, HAADF-STEM, and STEM-EDX images were collected on a JEOL ARM-200F field-emission transmission electron microscope operating at 200 KV accelerating voltage. XRD pattern was recorded by using a Philips X’Pert Pro Super diffractometer with Cu-Kα radiation (λ = 1.54178 Å). ICP-AES (Atomscan Advantage, Thermo Jarrell Ash, USA) was used to determine the concentration of Al. The BET surface areas of the samples were measured on a Micromeritics ASAP 2460 adsorption apparatus. The numbers of surface Pd and Pt in Pd/C and Pt/C were determined by CO pulse chemisorption (VDsorb-91i). UV-Vis tests were conducted on a TU-1901 at room temperature. The Al K-edge XANES was performed at 08U1A beamline of SSRF.
8
Characterization of K-MnO2 Nanorods and Nanofibers
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The morphology and size of the K–MnO2 nanorods and K–MnO2@PDA nanofibers were examined using field emission scanning electron microscopy (FESEM, JSM-6700F) and high-resolution transmission electron microscopy (HR-TEM, JEOL JEM-2010F). Powder diffraction data were collected using an X-ray diffractometer (XRD, Philips X'Pert Pro Super). Thermogravimetric analysis (TG) was performed in N2 using a Pyris Diamond TG analyzer (PerkinElmer Inc., USA). The samples were heated from 30 °C to 800 °C at a heating rate of 5 °C min−1. The EM parameters were measured using a two-port vector network analyzer (Agilent E5071C).
9
Characterization of Ir Single Atoms
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XRD patterns were recorded using a Philips X’Pert Pro Super diffractometer with Cu-Kα radiation (λ = 1.54178 Å). HAADF-STEM images were taken on a JEOL ARM−200F field-emission transmission electron microscope operating at an accelerating voltage of 200 kV using Mo-based TEM grids. EDX elemental mapping images were taken on an FEI Talos F200X high-resolution transmission electron microscope using Mo-based TEM grids. ICP-MS (Atomscan Advantage, Thermo Jarrell Ash, USA) analyses were used to determine the mass loadings of Ir single atoms and the dissolved amount of Co species. The distance between Ir single atoms was measured on HAADF-STEM images by Nano Measurer software.
10
Characterization of BNC-Cu and NC-Cu Nanocomposites
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The as-synthesized BNC-Cu and NC-Cu were characterized by various analytical techniques. X-ray diffraction (XRD) was performed on a Philips X’Pert Pro Super diffractometer with Cu-Kα radiation (λ = 1.54178 Å). The morphology of the samples was observed by scanning electron microscopy (SEM, Zersss Supra 40) and transmission electron microscopy (TEM, Hitachi H-7650). HAADF-STEM images, energy-dispersive X-ray Spectroscopy (EDS) elemental mapping, and electron energy loss spectroscopy (EELS) were carried out on JEOL ARM-200F field-emission transmission electron microscope operating at an accelerating voltage of 200 kV using Mo-based TEM grids. Raman spectra were taken on a Raman microscope (Renishaw®) excited with a 785 nm excitation laser. X-ray photoelectron spectroscopy (XPS) measurements were performed on a VG ESCALAB MK II X-ray photoelectron spectrometer with Mg Kα = 1253.6 eV as the exciting source. Soft X-ray absorption spectra (B K-edge, N K-edge, and C K-edge) were carried out at the Catalysis and Surface Science Endstation at the BL11U beamline in the National Synchrotron Radiation Laboratory (NSRL) in Hefei, China.
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