The size and morphology of Mn3O4 NPs were determined using a JEOL JEM-2100 transmission electron microscope (TEM). X-ray diffraction (XRD) measurements were conducted on a Bruker D4 diffractometer. The surface zeta potential and hydrodynamic size were measured using a Malvern Zetasizer Nano ZS. The T1-relaxivities and T1 images were obtained with a conventional spin echo acquisition (repetition time, TR, 1000 ms) with echo time, TE, of 50 ms, and a section thickness of 1 mm in a 4.7 T small animal scanner (Agilent Technologies, Santa Clara, CA). Relaxivity values of r1 were calculated through curve fitting of 1/T1 (s−1) versus the manganese concentration (mM). The concentration of Mn was determined by ICP-AES (VISTAMPXICP Varian, USA).
D4 diffractometer
Manufactured by Bruker
The D4 ENDEAVOR is a versatile X-ray diffractometer designed for a wide range of applications in materials science, pharmaceuticals, geology, and more. It features a compact and robust design, enabling high-quality data collection with minimal user intervention. The instrument's core function is to perform X-ray diffraction analysis, which is a powerful technique for the identification and characterization of crystalline materials.
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Lab products found in correlation
4.7 t small animal scanner, by Agilent Technologies (1 mentions)
Zetasizer nano z, by Malvern Panalytical (1 mentions)
Jem 2100 transmission electron microscope, by JEOL (1 mentions)
Topas software, by Bruker (1 mentions)
Ir prestige 21 spectrometer, by Shimadzu (1 mentions)
Tecnai g2 20 twin transmission, by Thermo Fisher Scientific (1 mentions)
Uv 2550 spectrometer, by Shimadzu (1 mentions)
4 protocols using d4 diffractometer
1
Characterization of Mn3O4 Nanoparticles
2
Quantitative XRD Analysis of Powder Samples
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XRD measurements were performed on powered samples. A few grams (3–5 g) of samples were ground to below a fineness of 15 µm, with an internal standard of 10 wt% added metallic silicon. Both the sample and the internal standard were premixed and ground for 20 min under cycloxhexane (~7 mL) using sintered corundum grinding elements with a McCrone micronizer mill. Afterwards, the slurry was poured into a ceramic dish and transferred to an oven. The slurry was kept for a few minutes at 65 °C in the oven. Subsequently, the dried powder was pressed in a bottom-loaded XRD holder and prepared for XRD measurement. XRD diffractograms were acquired from 10° to 130° 2-theta with a Bruker D4 diffractometer using Co-Kα radiation and a Lynxeye position-sensitive detector. The Bruker Topas software was used to perform the Rietveld quantification of the phases. The Rietveld fitting error obtained on the amorphous phase in the samples showed a high-precision with general statistical errors of less than 1.0% absolute.
3
Calcium Phosphate Phase Characterization
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Calcium phosphate phase determination of BCA and BPA formulations was carried out using XRD. Three pastes of each formulation were prepared, each was kept in a glass vial for 24 h and ground with a mortar and pestle after complete setting to get CaP powder. The powder samples were examined using a Bruker D4 Diffractometer in a Flat-plate geometry using Cu Kα12, 40 kV and 30 mA X-ray radiation.
4
Characterization of Nanoparticle Properties
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The size and morphology of nanoparticles were characterized by FEI Tecnai G2 20 TWIN transmission electron microscope (TEM) at 200 kV. TEM samples were prepared by dipping the copper grid into a diluted nanoparticles' solution. Powder X-ray diffraction (XRD) measurements of the nanoparticle samples were conducted on a Bruker D4 diffractometer (Cu Kα radiation, λ = 1.54056 Å) of which the 2θ range is from 10 to 90° and the scanning rate is 0.5°/min. Fourier transform infrared (FTIR) spectra were collected using an IRPRESTIGE-21 spectrometer (Shimadzu). Nanoparticles were mixed with KBr and tableted into pellet to make FTIR samples. E2 release studies were carried out on Shimadzu UV 2550 spectrometer. The upconversion luminescence (UCL) spectra were collected by using Edinburgh FLS-920 spectrometer equipped with an excitation source of 0-3 W adjustable 980 nm semiconductor laser (Connet Fiber Optics, China). All the photoluminescence studies were carried out at room temperature.
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