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Quantamaster c 60 2000 spectrofluorometer

Manufactured by Horiba
Sourced in United States

The QuantaMaster C-60/2000 is a spectrofluorometer, a device used to measure the fluorescence properties of samples. It is capable of performing steady-state and time-resolved fluorescence measurements across a wide range of wavelengths.

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3 protocols using quantamaster c 60 2000 spectrofluorometer

1

Thermal, Optical, and Morphological Characterization of Nanomaterials

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Thermal gravimetric analysis (TGA) was carried out under a nitrogen atmosphere. The samples were heated to 900 °C at 10 °C min−1 and held for 30 min. Elemental analysis (C, H, N, B) was performed by Mikroanalytisches Laboratorium Kolbe (Oberhausen, Germany). UV-Vis absorption spectra were recorded using a Cary 60 UV/Vis spectrophotometer (Agilent Technologies, Mulgrave, Victoria, Australia). Fluorescence emission was measured using a QuantaMaster C-60/2000 spectrofluorometer (Photon Technology International, Lawrenceville, NJ, USA). The surface morphologies of particles were observed using a scanning electron microscope (SEM) (JSM-6700F, JEOL, Tokyo, Japan) and a transmission electron microscope (TEM) (JEM-1400 Plus). The hydrodynamic diameters of the nanoparticles were measured in water at 25 °C by dynamic light scattering (DLS) using a Zetasizer Nano ZS instrument (Malvern Instruments, Worcestershire, UK).
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2

Characterization of Silica Particles

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Attenuated total reflection (ATR)
infrared spectra were recorded using a Perkin-Elmer FTIR instrument
(Perkin-Elmer Instruments). The fluorescence emission was measured
using a QuantaMaster C-60/2000 spectrofluorometer (Photon Technology
International, Lawrenceville, NJ, USA). 1H and 13C NMR spectra were recorded on a superconducting magnet NMR spectroscopy
400 MHz (Bruker B-ACS60). Solid-state 11B MAS NMR experiments
were performed on a Bruker 500 MHz Avance III instrument in the Chemical
Biological Center, Umeå University. X-ray photoelectron spectroscopy
(XPS) analysis was carried out using a spectrometer with a Mg Kα (excitation 1253.6 eV) X-ray source. For fluorescence
microscopy imaging, samples were deposited on a glass slide and observed
under a Nikon Eclipse E400 epifluorescence microscope equipped with
a CCD camera. The conditions of measurement were: exposure time: 0.2
s, readout rate: 1 MHz at 16-bit, preamplifier gain: 5×, output
amplifier: conventional. Elemental analysis was carried out using
a Vario EL CHNS elemental analyzer (Elementar, Germany). The surface
morphologies of silica particles were observed with a scanning electron
microscope (SEM; JEOLJSM-T300). Thermal gravimetric analysis (TGA)
was performed in synthetic air using a TGS-2 thermogravimetric analyzer
(Perkin–Elmer, USA). The samples were heated from 40 to 700
°C at 10 °C/min and held for 30 min.
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3

Characterization of Silica Nanoparticles

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Attenuated total reflection (ATR) infrared spectra were recorded at room temperature in the range of 4000-525 cm À1 with a resolution of 4 cm À1 and 16 scans using a Perkin-Elmer FT-IR instrument. Thermal gravimetric analysis (TGA) was performed in synthetic air. The samples were heated to 700 1C at 10 1C min À1 and held for 30 min. Elemental analysis (C, H, N) was carried out using an Elemental Analyser, Model 1108 (Carlo-Erba, Milan, Italy). Elemental analysis for Br and B content was performed by Mikroanalytisches Laboratorium Kolbe (Germany). UV-Vis absorption spectra were recorded using a Cary 60 UV/Vis spectrophotometer (Agilent Technologies). Fluorescence emission was measured using a QuantaMaster C-60/2000 spectrofluorometer (Photon Technology International, Lawrenceville, NJ).
The surface morphologies of silica particles were observed using a scanning electron microscope (Thermal Field Emission SEM LEO 1560, Zeiss, Oberkochen, Germany) and a transmission electron microscope (Tecnai Spirit BioTWIN, FEI Company, Oregon, USA). The hydrodynamic diameter of the nanoparticles was measured at 25 1C by dynamic light scattering using a Zetasizer Nano ZS instrument (Malvern Instruments, United Kingdom).
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