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Gensys 10 series

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Gensys 10 Series is a line of UV-Vis spectrophotometers designed for routine laboratory analysis. The instruments provide accurate and reliable absorbance measurements across a range of wavelengths. The Gensys 10 Series features a compact design and intuitive software interface for simple operation.

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2 protocols using gensys 10 series

1

Characterization of Silver Nanoparticles

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In this study, the AgNP solution samples without any rinsing were directly analyzed by an UV-Vis (Gensys 10 Series, Thermo Scientific, Waltham, MA, USA). The morphological properties of the Ag nanoparticles were studied using an H-7100 (Hitachi, Tokyo, Japan) TEM. XRD (Empyrean, Malvern Panalytical, Malvern, UK) was used to further characterize the nanoparticles. Measurements of the Ag conductive ink viscosities were carried out using a DV3T viscometer (Brookfield Engineering Laboratories, Middleboro, MA, USA). The surface tension of Ag conductive ink was assessed using Model 100SB (Sindatek Instruments, New Taipei, Taiwan). Finally, electrical resistivity of the patterns was measured using a Surfcorder ET3000 microfigure measuring instrument (Kosaka Laboratory, Tokyo, Japan) and a Keithley 2000-EM4P four-point probe analyzer (Tektronix, Beaverton, OR, USA).
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2

Characterization of Copper Nanoparticle Ink

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In this study, the CuNP solution samples without any rinsing were directly analyzed by UV–vis (Gensys 10 Series, Thermo Scientific, Waltham, MA, USA). The morphological properties of the CuNPs were studied using an H-7100 TEM (Hitachi, Tokyo, Japan). Measurement of the Cu conductive ink viscosity was carried out using a DV3T viscometer (Brookfield Engineering Laboratories, Middleboro, MA, USA). XRD (Empyrean, Malvern Panalytical, Malvern, UK) was used to further characterize the CuNPs. The surface tension of Cu conductive ink was assessed using a Model 100SB device (Sindatek Instruments, New Taipei, Taiwan). Fourier-transform infrared (FTIR) spectroscopy (FT/IR-6000, Jasco International Co., Tokyo, Japan) was used to confirm the functional groups change of PET before and after surface modification, and atomic force microscopy (AFM; XE-100, Park Scientific Instruments, Sunnyvale, CA, USA) was used to measure the surface roughness. Finally, the electrical resistivity of the patterns was measured using a Surfcorder ET3000 microfigure measuring instrument (Kosaka Laboratory, Tokyo, Japan) and a Keithley 2000-EM4P four-point probe analyzer (Tektronix, Beaverton, OR, USA).
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