Jsm 7001f sem system
The JSM-7001F is a Scanning Electron Microscope (SEM) system manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of samples. The JSM-7001F features a field emission electron source, which enables high-resolution imaging and excellent analytical capabilities. The system is equipped with various detectors and analysis tools to support a variety of applications.
Lab products found in correlation
3 protocols using jsm 7001f sem system
SEM-based Characterization of Gold Nanorods
Dried Blood Spheroids Surface Characteristics
Hydrogel Microstructure Visualization
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