All electrochemical measurements were achieved on a RST 5200F electrochemical workstation (Zhengzhou Shiruisi Instrument Co. Ltd., China). Transmission electron microscope (TEM) images were recorded by a JEOL-1400 microscope (JEOL, Japan). Scanning electron microscope (SEM) images were obtained from JSM-6700F microscope (JEOL, Japan). FT-IR spectra were collected by using a FT-IR-410 infrared spectrometer (JASCO, Japan). Surface area measurements were performed on Micromeritics ASAP 2020M surface area and porosity analyzer (Quantachrome, United States).
Ft ir 410 infrared spectrometer
The FT-IR-410 is an infrared spectrometer that uses Fourier transform technology to analyze the absorption and transmission of infrared light by a sample. It is designed to identify and quantify the chemical composition of materials.
Lab products found in correlation
2 protocols using ft ir 410 infrared spectrometer
Electrochemical Immunoassay for SCCA Detection
All electrochemical measurements were achieved on a RST 5200F electrochemical workstation (Zhengzhou Shiruisi Instrument Co. Ltd., China). Transmission electron microscope (TEM) images were recorded by a JEOL-1400 microscope (JEOL, Japan). Scanning electron microscope (SEM) images were obtained from JSM-6700F microscope (JEOL, Japan). FT-IR spectra were collected by using a FT-IR-410 infrared spectrometer (JASCO, Japan). Surface area measurements were performed on Micromeritics ASAP 2020M surface area and porosity analyzer (Quantachrome, United States).
Synthesis and Characterization of Fluorescent L-Cys Coated Fe3O4 Nanoparticles
Transmission electron microscope (TEM) images were obtained from a Tecnai G220 TEM (FEI Company, USA). Energy Dispersive X-Ray Spectroscopy (EDS) was recorded by JEOL JSM-6700 F microscope (Japan). FT-IR spectra were collected using a FT-IR-410 infrared spectrometer (JASCO, Japan). Ultraviolet absorption spectra were obtained from a Lambda35 UV-Vis spectrophotometer (PerkinElmer, America). Fluorescence spectra were obtained from a LS-55 fluorescence spectrophotometer (PerkinElmer, America).
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