Nicolet is50 ftir

Scanning electron
micrographs are
obtained using a Zeiss Ultra 60. Atomic force microscopy is performed
using a Bruker Dimension Icon. Water contact angle measurements are
taken with a Kruss DSA100E. Surface infrared spectroscopy measurements
are made using a Thermo-Fischer Nicolet iS50 FTIR equipped with variable
angle reflectance accessory by Harrick VariGATR and a germanium crystal.
The film thickness is measured with ellipsometry with a JA Woollam
M-20000 DI ellipsometer.

Ellipsometry measurements were performed
on a JA Woollam M-20000 DI ellipsometer using a Cauchy model for the
polymer layer. Infrared spectroscopy measurements were performed on
a Thermo-Fisher Nicolet iS50 FTIR equipped with a variable angle reflectance
accessory by Harrick VariGATR and a germanium crystal. X-ray photoelectron
spectroscopy (XPS) measurements were taken on a Thermo-Fisher K-Alpha
Plus XPS/UPS instrument with a monochromatic Al X-ray Source (1.486
eV). Survey spectra (1350 to −10 eV) were taken with 1 eV steps;
high resolution O 1s, N 1s, C 1s, and Si 2p spectra were taken with
0.1 eV steps.