The FA0.92Cs0.04MA0.04PbI3 films were made on ITO substrates. The pre-patterned ITO substrates (1.5 × 1.5 cm2) were bought from PsiOTec Ltd and ultrasonically cleaned with soap, deionized water, acetone, and IPA in succession for 10 min. The as-cleaned ITO substrates were treated with UV-O3 for 30 min and transferred to a N2-filled glovebox. The XRD measurements of FA0.92Cs0.04MA0.04PbI3 were performed with Rigaku D/Max-B X-ray diffractometer with Bragg–Brentano parafocusing geometry, a diffracted beam monochromator, and a conventional cobalt target X-ray tube set to 40 kV and 30 mA. The photoluminescence (PL) was detected by Ocean Optics QE Pro. The 540 nm excitation light was made by Pico Quant PDL 800-D.
D max b x ray diffractometer
Manufactured by Rigaku
The D/Max-B X-ray diffractometer is a laboratory instrument designed for the analysis of crystalline materials. It uses X-ray diffraction technology to provide detailed information about the structure and composition of various solid samples.
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3 protocols using d max b x ray diffractometer
1
Fabrication and Characterization of FA0.92Cs0.04MA0.04PbI3 Films
2
Synthesis and Characterization of n=3 Layered Perovskite
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The successful synthesis of layered perovskite single crystal with n = 3 was confirmed by the UV/vis absorption and XRD measurement. The Absorption spectra were recorded using an Evolution 201 UV/Visible Spectrophotometer. The X-ray diffraction patterns were obtained by a Rigaku D/Max-B X-ray diffractometer in the Bragg–Brentano parafocusing geometry. A conventional copper target X-ray tube equipped in the diffracted-beam monochromator was set to 45 kV and 40 mA.
3
Comprehensive Characterization of Optoelectronic Materials
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The device's current density–luminance–voltage (J–L–V) characteristics were measured using a programmed Keithley 2400 source-measure unit and a Konica-Minolta chroma meter CS-100A. Electroluminescent (EL) spectra were recorded with an Ocean Optics USB4000 UV-vis spectrometer. UV-vis absorption spectra were characterized with a Shimadzu UV-2600 spectrophotometer. Steady-state PL spectra and time-resolved PL decay curves were acquired with a Hitachi F4600 fluorophotometer using an excitation wavelength of 405 nm. X-ray diffraction (XRD) patterns were measured with a Rigaku D/Max-B X-ray diffractometer equipped with a Cu Kα radiation source. Morphologies of the samples were studied using a JSF-7100 scanning electron microscope (SEM) and a Hitachi atomic force microcope (AFM). Ultraviolet photoelectron spectroscopy (UPS) measurements were performed using an ESCALAB 250Xi system. Transmission electron microscopy measurements were carried out with a FEI Talos F200 scanning/transmission electron microscope.
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