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2010 high resolution transmission electron microscope

Manufactured by JEOL
Sourced in Japan

The 2010 High Resolution Transmission Electron Microscope is a laboratory instrument designed for the analysis of microscopic samples. It uses a beam of electrons to produce high-resolution images of the internal structure and composition of materials at the nanoscale level.

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2 protocols using 2010 high resolution transmission electron microscope

1

High-Resolution TEM Sample Preparation

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Transmission electron microscopy (TEM) images were collected by using a JEOL 2010 High Resolution Transmission Electron Microscope operating at 300 kV. Specimens were prepared by sonicating the sample in isopropanol and by depositing a drop of the suspension on carbon‐coated grids.
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2

Microscopic Characterization of DPP Samples

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Scanning electron microscope analysis was acquired using JSM-5400 LV JEOL, Tokyo, Japan. Samples were coated with 20 nm gold using a gold sputter (JEOL JFC-1100E). An acceleration voltage of 15 kV was used during capturing at different magnifications. TEM images were obtained using a JEOL 2010 high resolution transmission electron microscope, Tokyo, Japan. DPP samples were treated with osmium tetroxide and sliced according to the reported method [68 (link)].
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