Mesp v2

Spin-polarized conductive AFM measurements (I–V measurements) were performed using the JSPM-4210 scanning probe microscope (JEOL). In this experiment, OCA films were deposited on freshly cleaved HOPG substrates by spin coating from toluene solution (2500 rpm, 30 s), followed by annealing at 50 °C for 1 h to evaporate the solvent. The I–V measurements were recorded in the contact mode by applying the bias voltage to the tip (cantilever). CoCr tips (MESP-V2, Bruker) that were magnetized in the up and down magnetic field orientations were used for the I–V measurements. At least 40 I–V traces were recorded and averaged for each chiral state or magnetic field orientation. For each I–V measurement, the tip was placed in a new position.

To prepare the samples for the c‐AFM measurements, solutions (5 mg mL⁻¹) composed of the R/S/rac‐MBA_MoS₂ powders in DMF solvents were drop casted onto fresh quartz substrates, which were initially sputtered with Ti (6 nm) and Au (50 nm) layers (Nano PVD‐S10A, Nanotechnology, England). These samples were annealed at 100 °C to evaporate the solvent. The typical film thickness was controlled to ≈5 µm. The I–V measurements were obtained using an SPA‐400 AFM system with a NanoNavi IIe controller. The CoCr tips (MESP‐V2, Bruker) were premagnetized in different field orientations, such as magnetic north (Tip_Up), south (Tip_Down), and no magnetic orientation (Tip₀), using a strong permanent magnet. Then, these were used immediately for the I–V scans of the three samples in contact mode. Relatively flat domains with typical roughness of ≈200 nm were selected and the measurements were recorded for more than 40 times from −10 to +10 V, and the average I–V measurements were reported. Each curve was obtained by placing the tip in a new position to avoid damaging the sample.

KPFM was performed using a conductive AFM Enviroscope system (Veeco Instruments, now Bruker) in a tapping mode at room temperature, equipped with a magnetic Co/Cr-coated tip (MESP-V2, Bruker) with a radius at the apex below 30 nm). We used a the double-pass technique, mechanically oscillating the cantilever at its first (fundamental) resonance (between 75 and 85 kHz, tip-dependent) for topography imaging in the first pass, and electrostatically oscillating the cantilever at the same frequency in the second pass while tracing the topography at a lift height of 30 nm. The amplitude of the AC excitation applied was 1 V. And the Co-MOF-3 dispersion samples were dropped onto conductive HOPG support. The LED laser powers of 5, 15, 50 W were used to irradiate the samples. The direction of light irradiation was almost parallel to the HOPG plate.