FTIR tests of the samples were acquired using a Nicolet IS50-Nicolet Continuum produced by Thermo Fisher Scientific, Ltd., where attenuated total reflection (ATR) mode was employed for sample detection. XPS analysis was performed on a Kratos Axis Ultra-DLD X-ray photoelectron spectrometer. The XRD test was performed on the PANalytical (X’Pert PRO) instrument with an X-ray of λ = 0.154 nm, operated at 40 kV and 40 mA, and the XRD profiles were collected in the 2θ range of 5°–60°. The SAXS measurements were carried out at Xeuss 3.0 SAXS system (Xenocs, France) with an X-ray of λ = 0.154 nm. The sample-to-detector distance was 1500 mm, and the exposure time was set as 600 s. The anti-freezing properties of hydrogel fibers were measured on DSC (NETZSCH 3500 Sirius) with a heating/cooling rate of 10 °C/min under nitrogen flow. All hydrogel samples were soaked in deionized water for 2 h for removing as much Gly as possible to complete freeze-drying. The freeze-dried hydrogels were brittlely exposed to cross sections with liquid nitrogen and sputtered with gold, followed by SEM (HITACHI SU8220) test.
Axis ultra dld x ray
Manufactured by Shimadzu
The Axis Ultra-DLD X-ray is a high-performance analytical instrument that utilizes X-ray photoelectron spectroscopy (XPS) technology. It is designed to provide detailed information about the chemical composition and surface properties of a wide range of materials.
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Lab products found in correlation
3 protocols using axis ultra dld x ray
1
Characterization of Hydrogel Fibers
2
Characterizing C/SL Material Properties
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The morphology of
the material was characterized by QUANTA 200 scanning electron microscope.
The X-ray pattern of C/SL was measured by the TDF-3200 and Cu Kα
radiation source (k = 1.540598 Å). The diffraction
angle of 2θ was 5–80°, and the detection rate was
0.02° min–1. The composition of the sample
was characterized by Raman spectroscopy (Raman, ATC0400-UV). Fourier
transform infrared spectroscopy (FTIR) was used to study the surface
groups on the material surface. A Thermo Scientific spectrometer,
Nicolet 5700, was used with a resolution of 4 cm–1, a collection rate of 20 min–1, and a spectral
range of 4000–400 cm–1. The samples to be
tested and KBr were pressed in the ratio of 1:100. The elemental content
of the sample was characterized and analyzed with an element analyzer
(Perkinemer 2400II). XPS was performed on a Kratos Axis Ultra DLD
X-ray photoelectron spectrometer using monochromatic Al Kα (1486.6
eV) X-rays and an analytical chamber with a base pressure of 10–9
Torr. C/SL solution (0.1 mol L–1) was prepared from
aqueous solutions of HCl (0.10 mol L–1) and NaOH
(0.10 mol L–1) in the pH range of 4.0–10.0.
25.0 mL of aliquot of each solution and 0.2 g L–1 C/SL sample were added into the polypropylene bottle and shaken
for 24 h. The pH of the mixed solution was measured, and a graph of
ΔpH (pHlast–pHinitial) versus pH
initial was drawn. pHpzc represents the point where ΔpH
= 0.
the material was characterized by QUANTA 200 scanning electron microscope.
The X-ray pattern of C/SL was measured by the TDF-3200 and Cu Kα
radiation source (k = 1.540598 Å). The diffraction
angle of 2θ was 5–80°, and the detection rate was
0.02° min–1. The composition of the sample
was characterized by Raman spectroscopy (Raman, ATC0400-UV). Fourier
transform infrared spectroscopy (FTIR) was used to study the surface
groups on the material surface. A Thermo Scientific spectrometer,
Nicolet 5700, was used with a resolution of 4 cm–1, a collection rate of 20 min–1, and a spectral
range of 4000–400 cm–1. The samples to be
tested and KBr were pressed in the ratio of 1:100. The elemental content
of the sample was characterized and analyzed with an element analyzer
(Perkinemer 2400II). XPS was performed on a Kratos Axis Ultra DLD
X-ray photoelectron spectrometer using monochromatic Al Kα (1486.6
eV) X-rays and an analytical chamber with a base pressure of 10–9
Torr. C/SL solution (0.1 mol L–1) was prepared from
aqueous solutions of HCl (0.10 mol L–1) and NaOH
(0.10 mol L–1) in the pH range of 4.0–10.0.
25.0 mL of aliquot of each solution and 0.2 g L–1 C/SL sample were added into the polypropylene bottle and shaken
for 24 h. The pH of the mixed solution was measured, and a graph of
ΔpH (pHlast–pHinitial) versus pH
initial was drawn. pHpzc represents the point where ΔpH
= 0.
3
Comprehensive Material Characterization Techniques
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UV-visible absorbance measurements were performed using an Agilent Technologies Cary 8454 UV-visible spectrometer.
Scanning electron microscope (SEM) images were obtained on a FEI Helios 600 Nanolab Dual Beam System focused ion beam (FIB) equipped with an Oxford Instruments, INCA PentaFET-x3 X-ray detector with the electron beam set to 2 keV and a beam current of 0.69 nA.
XPS spectra were acquired by using a Kratos Axis Ultra DLD X-ray photoelectron spectrometer with a base pressure of 6 × 10–9 Torr, a monochromatic Al Kα X-ray source, and an analyzer pass energy of either 80 eV or 20 eV for survey and high resolution scans respectively.
X-ray diffraction were used to characterize the prepared NiO films. A Rigaku SmartLab was utilized which consisted of an X-ray source (3 kW Cu tube) and the detector – a 0D scintillation detector.
Scanning electron microscope (SEM) images were obtained on a FEI Helios 600 Nanolab Dual Beam System focused ion beam (FIB) equipped with an Oxford Instruments, INCA PentaFET-x3 X-ray detector with the electron beam set to 2 keV and a beam current of 0.69 nA.
XPS spectra were acquired by using a Kratos Axis Ultra DLD X-ray photoelectron spectrometer with a base pressure of 6 × 10–9 Torr, a monochromatic Al Kα X-ray source, and an analyzer pass energy of either 80 eV or 20 eV for survey and high resolution scans respectively.
X-ray diffraction were used to characterize the prepared NiO films. A Rigaku SmartLab was utilized which consisted of an X-ray source (3 kW Cu tube) and the detector – a 0D scintillation detector.
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