The X-ray Diffraction (XRD, Rigaku SmartLab, Rigaku Corporation., Tokyo, Japan) and SEM techniques (JSM-5910LV, JEOL Ltd., Tokyo, Japan) were performed to observe the crystalline phases and microstructure. The energy-dispersive X-ray spectroscopy (EDX, JSM-5910LV, JEOL Ltd., Tokyo, Japan) technique was used to identify the chemical compositions of products in the spectrum.
Jsm 5910lv
Manufactured by JEOL
Sourced in Japan, United States, France
The JSM-5910LV is a low-vacuum scanning electron microscope (SEM) designed for imaging and analysis of a wide range of samples. It features a high-resolution electron optical system, a user-friendly interface, and advanced imaging capabilities.
Automatically generated - may contain errors
Lab products found in correlation
D8 advance, by Bruker (2 mentions)
Smartlab, by Rigaku (2 mentions)
Eos rebel xs, by Canon (2 mentions)
Dmi5000 m, by Leica Microsystems (2 mentions)
Pw 1830, by Philips (1 mentions)
Jfc 1600, by JEOL (1 mentions)
Jsm 5600lv, by JEOL (1 mentions)
Lsm 510 meta, by Zeiss (1 mentions)
Jsx3400r, by JEOL (1 mentions)
Sigma 500, by Zeiss (1 mentions)
Spectrum, by PerkinElmer (1 mentions)
F2.8 ex dg os, by Merck Group (1 mentions)
Axio vision, by Merck Group (1 mentions)
Easyscan 2, by Nanosurf (1 mentions)
Axiovision, by Zeiss (1 mentions)
Spi module sputter coater, by SPI Supplies (1 mentions)
Sdd detector, by Thermo Fisher Scientific (1 mentions)
Nss software, by Thermo Fisher Scientific (1 mentions)
Park xe 70, by Park Systems (1 mentions)
38 protocols using jsm 5910lv
1
Characterization of Crystalline Phases
2
Scanning Electron Microscopy of Miniscrews
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Scanning electron microscopy examinations were performed with JEOL JSM-5910LV(JEOL Ltd. Tokyo, Japan) and Energy scatter spectrometer INCAx-sight 7274 (OXFORD Industries, England) with 133-eV resolution. Images of 10 miniscrews (5 DT, 5 OE) from each group were taken at 20x, 40x, 100x, 200x, 500x, 1000x, 2000x, 5000x and 10000x magnifications to examine surface modifications.
3
Characterizing Hydrous Peridotite Samples
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The chemical composition of pre-sintered samples and experimental run products after seismic velocity measurements were investigated using the Cameca SX100 electron probe micro analyzer at the Laboratoire Magmas et Volcans of Clermont-Ferrand. Energy-dispersive X-ray spectroscopy (EDS) chemical mapping was used to determine the mineral proportions. Micro-textures of the samples were observed with a Scanning Electron Microscope (SEM) JEOL Jeol JSM-5910 LV at the Laboratoire Magmas et Volcans of Clermont-Ferrand. For imaging, an accelerating voltage of 15 kV and working distance of 11.4 mm were used, and for chemical mapping an accelerating voltage of 10 kV and working distance of 19.3 mm were used. The fine melt micro-textures were observed with ZEISS supra 55VP field emission gun (FEG) SEM with an acceleration voltage of 15 kV and working distance of 9.7 mm (2MATech, Aubière, France).
Powder X-ray analysis using Philips PW 1830 (Cobalt wave-length) was carried out prior to the seismic velocity measurements to ensure the absence of additional hydrous phases, such as super hydrous phase-B in pre-sintered samples. No evidence for additional hydrous phases was found in the pre-synthesized hydrous peridotite samples.
Powder X-ray analysis using Philips PW 1830 (Cobalt wave-length) was carried out prior to the seismic velocity measurements to ensure the absence of additional hydrous phases, such as super hydrous phase-B in pre-sintered samples. No evidence for additional hydrous phases was found in the pre-synthesized hydrous peridotite samples.
4
Scanning Electron Microscopy of Samples
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The morphology was examined using scanning electron microscopy (SEM, JEOL JSM–5910LV JEOL Co., Ltd., Tokyo, Japan) with a magnification of 2000× at 15 KV. The samples were broken in liquid nitrogen followed by coating with a thin layer of gold.
5
Lateritic Soil Properties and Soil-Cement-FGD Gypsum Mixtures
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The experiments to determine the physical properties of lateritic soil and the strength development of soil–cement–FGD gypsum mixtures are detailed as follows:
Physical properties Specific gravity tests in accordance with ASTM D854 [62 ]; Soil particle size distribution by wet sieving tests in accordance with ASTM D422-63e2 [63 ]; Soil particle size distribution by hydrometer tests in accordance with ASTM D422-63e2 [63 ]; Liquid limit tests and plastic limit tests in accordance with ASTM D4318 [64 (link)].
Strength development of soil–cement–FGD gypsum mixtures Modified Proctor compaction tests in accordance with ASTM D1557 [56 (link)]; Unconfined compressive strength (UCS) tests in accordance with ASTM D1633 [57 (link)]; California Bearing Ratio (CBR) tests in accordance with ASTM D1883 [58 (link)]; Microstructure analyses by a scanning electron microscope (SEM), JEOL JSM-5910LV (JEOL Ltd., Tokyo, Japan).
6
Microscopic Analysis of Rice Particles
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The morphology of rice particles was characterized using scanning electron microscope (SEM) (JEOL JSM-5910LV, JEOL Ltd., Tokyo, Japan). The samples were placed on the surface of the stub and coated with gold before examination. The excitation voltage of 10-20 kV under low vacuum mode (0.7 -0.8 torr) and 10,000 magnifications were used.
7
SEM Analysis of H&E Stained Liver
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H&E stained liver sections were used for SEM analysis. In a typical procedure, the coverslip was carefully removed from the mounted H&E stained liver sections using xylene. The sections were dried overnight at 80 °C. Next, the sections were cut and put on a copper stub. The sample stubs were subjected to gold sputtering. Finally, the liver sections were observed with SEM (JEOL JSM-5910LV).
8
Microbe Cell Morphology Analysis by SEM
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The cell morphology of the microbes in untreated and treated TOJ was examined and compared by SEM (JSM-5910LV, JEOL, Tokyo, Japan). Samples were prepared by chemical tissue stabilization techniques using glutaraldehyde. The samples were dried with a critical point dryer (CPD; K850, Quorum, Mytchett, UK). For SEM analysis, a few milligrams of sample was attached to carbon tape on a brass stub and sputtered with gold for 45 s. The SEM was operated at an accelerating voltage of 15 kV and images were taken.
9
Scanning Electron Microscopy of Paste Microstructures
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SEM (JEOL JSM-5910LV, gold coated, WD: 11 mm, EHT: 15 kV, JEOL Inc., Pleasanton, CA, USA) was used to observe the pastes’ microstructures. Harden specimens were coated with gold before the examination.
10
Examining Bacterial Colonization in Rice Roots
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To confirm the colonization of the inoculated Sinomonas sp. ORF15-23 and Bacillus sp. strain CRF17-18 in the KDML105 rice roots under different NaCl concentrations, the microstructure of the rice roots from all treatments was examined under a scanning electron microscope (SEM) using lateral root samples of all the inoculated isolates. The roots were cut into 1 cm segments and were prefixed in 4% glutaraldehyde solution overnight and washed with 0.1 M sodium cacodylate buffer three times for 30 min each. Osmium tetraoxide buffer (1%) was used for post fixation. After a series of dehydration steps in acetone, the samples were dried in a critical point dryer and mounted on aluminum stubs, sputter-coated with gold, and viewed under low-vacuum scanning electron microscope (JEOL, model JSM5910LV, Tokyo, Japan) at Faculty of Science, Chiang Mai University.
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