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Tcc900

Manufactured by Edinburgh Instruments
Sourced in United Kingdom

The TCC900 is a temperature control system developed by Edinburgh Instruments. It is designed to provide precise temperature control for a variety of laboratory applications. The core function of the TCC900 is to accurately regulate the temperature of samples or devices under test.

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6 protocols using tcc900

1

Quantification of Perovskite Metasurface Reflections

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The normal-incidence reflection characteristics of the perovskite metasurfaces were quantified, incident polarizations parallel and perpendicular to the grating and slit lines (TE and TM orientations, respectively), using a microspectrophotometer (Jasco MV2000), through a 36x objective with a circular sampling aperture size of 15 µm  15 µm.
Photoluminescence: Micro-photoluminescence measurements were performed using free space excitation and collection through visible-near infrared microscope objective (Olympus 80x, NA=0.90). The samples were excited with a ps-pulsed laser diode emitting at 640±5 nm wavelength with 10 MHz repetition rate, focused to a beam size of 2 micrometer.
Luminescence was detected using a Peltier-cooled photomultiplier tube (Hamamatsu H7422 series) coupled to a grating spectrometer (Edinburgh Instruments F900 and Bentham TMS300). Time-resolved decay traces were acquired by a time-correlated single photon counting acquisition module (Edinburgh Instruments, TCC900) at selected wavelength of 760±5 nm.
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2

Time-Resolved Photoluminescence Spectroscopy

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This repetition rate of 80 MHz and 700 nm wavelength. The repetition rate was reduced to 4 MHz by an acousto-optic pulse picker (APE select) and the initial wavelength halved (to 350 nm) via second harmonic generation (APE harmonic generator). These pulses were used to excite the samples with an average power of ∼1.5 mW. The PL emission of the samples was collected and focused into a monochromator (Spex 1870c) and detected at the centre of the blue and green PL bands (436 nm and 524 nm, respectively) by a Hamamatsu R3809U-50 multi-channel plate. A 400 nm long pass filter was placed in front of the detector to reduce the amount of light scattered from the excitation laser. The time correlation of the detected photons was performed with the use of a PC electronic card from Edinburgh Instruments (TCC900). The measured instrument response function (IRF) for this system is about 0.1 ns.
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3

Perovskite Photoluminescence Characterization

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PL measurements were performed at room temperature (RT) using free-space excitation and collection through a visible-near-infrared microscope objective (Nikon 20×, Nikon Corporation, Tokyo, Japan, NA = 0.40). The sample was excited via a 30 kHz picosecond pulsed diode laser (Master Oscillator Fibre Amplifier, Picoquant, Picoquant GmbH, Berlin, Germany, excitation wavelength at 355 nm, pulse width 50 ps, and power of 10 μW). The PL measurement was based on epifluorescence method. PL spectra were detected using AvaSpec-HERO spectrometer (Avantes BV, Apeldoorn, The Netherlands). The emission was then selected by a band filter at 500 ± 25 nm and detected by a single-photon avalanche photodiode (APD) connected to a time-correlated single-photon counting acquisition module (Edinburgh Instruments, TCC900, Edinburgh Instruments Ltd., Livingstone, United Kingdom). Absorption spectra of perovskite crystals were obtained using ultraviolet-visible (UV-vis) spectrometer (Shimadzu, Model UV-2450). PLQY measurements were carried out by placing the sample inside a Labsphere integrating sphere coupled to a Newton 920 Charge Coupled Device (Andor) through an optical fibre for photon counting. Cobolt 320 nm continuous-wave diode laser was used as an excitation source.
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4

Cryogenic Optical Characterization of Samples

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The cold finger
of a commercial closed-cycle compressed helium
cryostat (ARS DE-202) was used to characterize the samples. This cryo-generator
has a heating resistance and a thermometer, with which the temperature
can be controlled from 10 K to room temperature. For time-integrated
PL measurements, we used a continuous wave laser diode at 405 nm.
In time-resolved PL (TRPL) experiments, we used for excitation a 200
fs pulsed Ti:sapphire (Coherent Mira 900D, 76 MHz of repetition rate)
laser doubled to 400 nm with a BBO crystal. The backscattered PL signal
was dispersed by a double 0.3 m focal length grating spectrograph/spectrometer
(1200 g/mm with 750 nm blaze) and detected by an Andor Newton 970
EMCCD camera (for time-integrated PL spectra) and by a Si Micro Photon
Device (MPD) single photon avalanche diode (SPAD) photodetector connected
through a multimode optical fiber to the monochromator (for time-resolved
PL spectra); the SPAD was attached to a time correlated single photon
counting electronic board (TCC900 from Edinburgh Instruments).
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5

Time-resolved Photoluminescence Spectroscopy

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The trPL spectroscopy was performed in a confocal system with Micro Photon Devices single-photon avalanche photodiode and a time-correlated single-photon counting acquisition module (Edinburgh Instruments, TCC900). For the excitation, we used a pulsed diode laser at 355 nm with a repetition rate of 10 MHz, while we filtered the emission at 640 ± 20 nm. For all the trPL measurements using the diode laser, the temporal resolution was 200 ps. For the femtosecond laser PL lifetime measurements, the output from a 1-kHz, 50-fs Coherent Libra Regenerative Amplifier (800 nm) that was frequency doubled using a beta-barium borate crystal (to 400 nm) was used as the pump source. The emission from the samples was detected by an Optronis Optoscope streak camera system, which has an ultimate temporal resolution of 10 ps.
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6

Fluorescence Lifetime Analysis of DPH

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Fluorescence lifetimes were recorded on an Edinburgh Instruments FL920 with a TCSPC card (TCC-900) and a picosecond diodelaser (375 nm, pulse-width 60 ps; EPL-375, Edinburgh Instruments). The instrument response function (IRF) was measured using a solution of Ludox® and was ~85 ps. Lifetime decays were obtained by setting the emission polarizer to 54.7° from the vertical (magic angle) to avoid artifacts caused by rotational anisotropy. DPH was excited at 358 nm and its emission was detected at 430 nm. The raw decay data were analyzed using the equation: I(t)=f1exp(tτ1)+f2exp(tτ2)+f3exp(tτ3) where, fi are the normalized pre-exponential factors representing the fractional contribution of the lifetime components τi. Lifetime components were extracted by deconvoluting the IRF in a least-square fitting program based on the Marquardt algorithm. The reduced chi-square (χ2) values were significantly improved when a three-exponential fit was used compared to either mono- or bi-exponential decays. The number-averaged mean lifetimes were calculated using: τ=ifiτi
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