Dimension fastscan afm system
The Dimension FastScan AFM system is a high-speed atomic force microscope (AFM) developed by Bruker. The system is designed to provide fast and accurate topographical imaging of surfaces at the nanoscale level. The core function of the Dimension FastScan AFM is to enable rapid acquisition of high-resolution images without compromising image quality.
8 protocols using dimension fastscan afm system
Graphene Oxide Characterization and Separation
Atomic Force Microscopy of DNA-Protein Interactions
Visualizing DNA-Protein Interactions on Mica
Atomic Force Microscopy Analysis of gltA Promoter
Binding Dynamics of SsrB on csgD Promoter
Visualizing Actin Filament Dynamics with AFM
For topography imaging of actin filaments, 0.8 μM of actin filaments in 30 μL F buffer containing indicated protein was deposited on 0.01% poly-L-lysine coated glass coverslips and incubated for extra 30 minutes before image. The coverslips were rinsed three times in F buffer to remove unattached actin filaments and 30 μl of F buffer was added to the sample immediately to prevent drying. A silicon nitride probe (Scanasyst Fluid+, Bruker) with nominal tip radius of 2 nm was used. All samples were imaged with a Bruker Dimension FastScan AFM system and Nanoscope V controller operating under ScanAsyst fluid mode. AFM images were acquired at a maximum scan rate of 2.5 Hz and 256 × 256 data points per image. Raw AFM data were analyzed using Bruker Nanoscope Analysis 1.90 software.
Unidirectional Ribbon Formation on Graphene
The AFM measurements were carried out in “tapping in fluid” mode using a Dimension FastScan AFM system (Bruker, Santa Babara, CA, USA). In the examination of the effect of AFM tip scanning, the AFM images (Fig.
AFM Imaging of Gel Assembly/Disassembly
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