AFM and CP-AFM measurements were performed on a Bruker AFM Multimode MMAFM-2 equipped with a Peak Force TUNA Application Module (Bruker). Pure SAMs of SC10 before exchange and mixed-monolayers of FSC11 were characterized by AFM. While individual C60 cages could not be resolved Fig. S16† shows clear qualitative differences before and after exchange, but low roughnesses (Ra ≈ 1 nm) and no signs of aggregation or other irregularities. See ESI† for details.
Afm multimode mmafm 2
Manufactured by Bruker
The Bruker AFM Multimode MMAFM-2 is a high-performance atomic force microscope designed for advanced surface characterization. It provides nanoscale imaging, measurement, and analysis capabilities. The core function of the MMAFM-2 is to enable users to obtain high-resolution topographical and material property data of surfaces and nanostructures.
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3 protocols using afm multimode mmafm 2
1
Characterization of SAM Monolayers by AFM
2
I-V Measurements of Au/Mica SAMs
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I–V measurements were performed on a Bruker AFM Multimode MMAFM-2 equipped with a Peak Force TUNA Application Module. The Au on mica substrates were removed from the flowbox immediately prior to measurement, which occurred under ambient conditions by contacting the SAM with a Au-coated SI3N4 tip with a nominal radius of 30 nm (NPG-10, Bruker; resonant frequency: 65 kHz, spring constant: 0.35 N m–1). The AFM tip was grounded and the samples were biased from –1.0 V → 1.0 V → –1.0 V on AuMica. 11 trace/re-trace cycles per junction were performed and the top electrode was removed from SAMs between junctions.
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I–V measurements were performed on a Bruker AFM Multimode MMAFM-2 equipped with a Peak Force TUNA Application Module. The Au on mica substrates were removed from the flowbox immediately prior to measurement, which occurred under ambient conditions by contacting the SAM with a Au-coated SI3N4 tip with a nominal radius of 30 nm (NPG-10, Bruker; resonant frequency: 65 kHz, spring constant: 0.35 N m–1). The AFM tip was grounded and the samples were biased from –1.0 V → 1.0 V → –1.0 V on AuMica. 11 trace/re-trace cycles per junction were performed and the top electrode was removed from SAMs between junctions.
3
Conductive Probe AFM Characterization
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I–V measurements were performed
on a Bruker AFM Multimode MMAFM-2 equipped
with a Peak Force TUNA Application Module (Bruker). The SAMs were
contacted with an Au-coated silicon nitride tip with a nominal radius
of 30 nm (NPG-10, Bruker; tip A, resonant frequency = 65 kHz, spring
constant = 0.35 N/m; tip B, resonant frequency = 23 kHz, spring constant
= 0.12 N/m; tip D, resonant frequency = 18 kHz, spring constant =
0.06 N/m; tip A was chosen in this work) in TUNA mode. The AFM tip
was grounded and for all loading forces, T4C4 on AuTS were
biased from −1.0 to +1.0 V and from +1.0 to −1.0 V while
C10 on were biased from −1.5 to +1.5 V and from +1.5 to −1.5
V on AuTS to record the I–V curves: a max of 10 trace/retrace cycles per junction
were performed and the top electrode was removed from SAMs between
junctions. Between different samples, a new tip was used. The total
number of I–V traces recorded
by CP-AFM is summarized in theSupporting Information , Table S3. It is difficult to determine Vtrans for an individual I–V trace
due to the inherent noise in the raw data. The peaks of Gaussian fits
of histograms of I for each value of V at different loading forces obtained by CP-AFM were plotted and
transformed into axes of ln(I/V2) versus 1/V. The position of the Vtrans was determined manually by the center
of the dips in the plots.
on a Bruker AFM Multimode MMAFM-2 equipped
with a Peak Force TUNA Application Module (Bruker). The SAMs were
contacted with an Au-coated silicon nitride tip with a nominal radius
of 30 nm (NPG-10, Bruker; tip A, resonant frequency = 65 kHz, spring
constant = 0.35 N/m; tip B, resonant frequency = 23 kHz, spring constant
= 0.12 N/m; tip D, resonant frequency = 18 kHz, spring constant =
0.06 N/m; tip A was chosen in this work) in TUNA mode. The AFM tip
was grounded and for all loading forces, T4C4 on AuTS were
biased from −1.0 to +1.0 V and from +1.0 to −1.0 V while
C10 on were biased from −1.5 to +1.5 V and from +1.5 to −1.5
V on AuTS to record the I–V curves: a max of 10 trace/retrace cycles per junction
were performed and the top electrode was removed from SAMs between
junctions. Between different samples, a new tip was used. The total
number of I–V traces recorded
by CP-AFM is summarized in the
due to the inherent noise in the raw data. The peaks of Gaussian fits
of histograms of I for each value of V at different loading forces obtained by CP-AFM were plotted and
transformed into axes of ln(I/V2) versus 1/V. The position of the Vtrans was determined manually by the center
of the dips in the plots.
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