PXRD data of the powders were recorded on a Bruker D2 PHASER diffractometer (Bruker AXS, Karlsruhe, Germany) with a LynxEYE detector using a Cu Kα1.2 radiation source (λ = 1.5418 Å). All samples were measured at 295 K. Data were collected in the Bragg–Brentano (θ/2θ) horizontal geometry ranging from 5° to 70° (2θ). A step size of 0.02° (2θ) at 1.0 sec/step was used. The optics of the D2 PHASER diffractometer consisted of a 2.0° Soller slit module, a 0.6 mm shutter and a Ni filter. The X-ray tube operated at 30 kV and 10 mA. XRPD patterns were processed using the Diffrac.Eva V 3.2 software, (Bruker AXS, Karlsruhe, Germany).
Diffrac eva v 3
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Diffrac.EVA v.3.2 is a software application developed by Bruker for the analysis of X-ray diffraction data. It provides a platform for visualizing, processing, and interpreting X-ray diffraction patterns.
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6 protocols using diffrac eva v 3
1
PXRD Characterization of Powders
2
Structural Analysis by X-ray Diffraction
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X-ray diffraction studies were carried out using a D2 Phaser (Bruker AXS, Karlsruhe, Germany) apparatus equipped with a horizontal goniometer operating in the 2Theta mode with a one-dimensional LYNXEYE® detector. The X-ray source was CuKα radiation at a current of 10 mA and a voltage of 30 kV. The diffractometer was calibrated with a corundum standard provided by Bruker AXS. A low-background holder was used to obtain patterns of all examined samples. Studies were performed at room temperature over a 2θ range of 5° to 35° with a step size of 0.02° and a 1 s irradiation time per step. During the test, the samples were rotated at a speed of 15 rpm. The obtained XRPD patterns were evaluated using Diffrac.Eva V 3.2 software (Bruker AXS, Karlsruhe, Germany).
3
Solid Phase Identification via XRPD Analysis
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XRPD studies were performed to identify the solid phases and to verify the crystalline nature of the investigated samples. X-ray diffraction patterns were collected at ambient temperature using a D2 Phaser (Bruker AXS, Karlsruhe, Germany) powder diffraction system equipped with a horizontal goniometer operating in the 2θ mode. An LYNXEYE detector and CuKα radiation tube (operating at 30 kV and 10 mA) were used. The instruments were calibrated with a corundum standard supplied by Bruker AXS. Samples were scanned over a 2θ range of 5° to 40° with a step size of 0.02° and a 1-s exposure time per step using a low-background holder. The XRPD patterns were analyzed using Diffrac.Eva V3.2 (Bruker AXS, Karlsruhe, Germany) software.
4
Characterization of Powdered Samples by X-ray Diffractometry
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The Bruker D2 Phaser X-ray diffractometer (Bruker AXS, Karlsruhe, Germany) operating in Bragg–Brentano (θ/2θ) geometry, equipped with a LYNXEYE detector (based on silicon strip technology) and copper anode (Cu-Kα), was used to collect the data for this study. The powdered samples were analyzed on a zero-background sample holder. All measurements were taken at room temperature using a step scan mode with the step of 0.02° (2θ) and 0.2 s per step across the angular range 5° ≤ (2θ) ≤ 70°. The optics of the D2 PHASER diffractometer comprised a system of a Soller slit module with 2.5°, a divergence slit with 0.6 mm and a nickel filter. The X-ray tube operated at 30 kV and 10 mA. The collected XRD patterns were evaluated using Diffrac.EVA v.3.2 (Bruker AXS, Karlsruhe, Germany) software.
5
Starch Crystallinity Analysis by PXRD
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The analysis of starch was supplemented by X-ray diffraction measurements (PXRD). The powder PXRD data were recorded on a Bruker D2 PHASER diffractometer (Bruker AXS, Karlsruhe, Germany) with a Lynxeye detector using Cu Kα radiation (0.15418 nm). All samples were measured at 295 K with 3.0 mm slit and 1.0 mm shutter. Diffractograms were obtained between 7.5° and 40° (2) (step size of 0.02° (2) and 0.25 s per step). The X-ray generator operated at 30 kV and 10 mA. The PXRD patterns were processed using the software Diffrac.Eva V 3.2. (Bruker AXS). The percentage of crystallinity and amorphousness of the tested starch samples in relation to SN was determined.
6
Powder XRD Analysis of Materials
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The powder XRD measurements were performed on a Bruker D2 PHASER diffractometer (Bruker AXS, Karlsruhe, Germany) with a LynxEYe detector using Cu Kα1.2 radiation (1.5418 Å). Diffractograms were obtained in the Bragg-Brentano (θ/2θ) horizontal geometry between 5° and 70° (2θ) using a step scan mode with the step of 0.02° (2θ) and 0.2 s per step. All samples were studied in air at room temperature. The optics of the D2 PHASER diffractometer was a system of Soller slit module with 2.5°, a divergence slit with 0.6 mm and a nickel filter. The X-ray tube operated at 30 kV and 10 mA. The XRD patterns were processed using the software Diffrac.EVA v.3.2 (BRUKER AXS, Karlsruhe, Germany).
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