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X maxn 150 silicon drift detector

Manufactured by Oxford Instruments

The X-MaxN 150 Silicon Drift detector is an energy-dispersive X-ray spectroscopy (EDS) detector designed for elemental analysis. It utilizes a silicon drift detector sensor to provide high-resolution X-ray spectroscopy capabilities. The core function of the X-MaxN 150 is to detect and analyze the energy of X-rays emitted from a sample during electron microscopy or similar analytical techniques.

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4 protocols using x maxn 150 silicon drift detector

1

Morphological and Elemental Analysis of Ni Electrodes

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Micrographs of the deposited Ni electrodes were
obtained by scanning electron microscopy (SEM) in an Apreo SEM (ThermoFisher
Scientific) with an acceleration voltage of 15 kV and an electron
beam current of 1.6 nA. The chemical composition of the electrode
was investigated by energy dispersive X-ray spectroscopy (EDX) using
an Oxford Instruments X-MaxN 150 Silicon Drift detector coupled to
the Apreo SEM. EDX data was processed with the Pathfinder X-ray Microanalysis
software v1.3. The quantification of chemical elements was performed
in automatic mode.
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2

Gold Electrode Preparation and Characterization

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Gold disc electrodes (8 mm diameter)
were cut from a polycrystalline gold foil (0.5 mm thick, MaTecK, 99.995%)
and prepared by polishing and flame annealing according to the procedure
we have previously described.28 (link) The gold
electrode cleanliness was assured by scanning electron microscopy
(SEM) performed using an Apreo SEM (ThermoFisher Scientific). Micrographs
were obtained using an acceleration voltage of 10 kV and an electron
beam current of 0.4 nA. Additionally, elemental analysis of the surface
composition was performed using energy dispersive X-ray spectrometry
(EDX) (Oxford Instruments X-MaxN 150 silicon drift detector).
The EDX data were processed using the Pathfinder X-ray Microanalysis
software v1.3. The SEM micrographs and EDX spectra are shown in Figure S1 in the Supporting Information (SI).
Establishing surface cleanliness is crucial when studying cation effects
on CO2RR and HER, as we have previously shown that, for
instance, polishing alumina particles can contaminate the gold surface
and promote water reduction by the release of Al3+ ions
in an acidic electrolyte.28 (link)
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3

Characterizing Gold GDEs by SEM and EDX

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The gold GDEs topography and composition were characterized by Scanning Electron Microscopy (SEM) in an Apreo SEM (ThermoFisher Scientific). Micrographs were obtained using an acceleration voltage of 10 kV and an electron beam current of 0.8 nA. Energy Dispersive X-Ray Spectroscopy (EDX) was used for elemental analysis (Oxford Instruments X-MaxN 150 Silicon Drift detector). EDX data processing was done with the Pathfinder™ X-ray Microanalysis software v1.3. The data is displayed in atomic percentage for easier visualization, however, the quantification was performed in automatic mode, without providing external standards.
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4

Characterization of C-nPd Film Morphology

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The topography and morphology of the films were studied with scanning electron microscopy (SEM) with energy dispersive X-ray (EDX) composition analysis. These investigations were performed with the JEOL JSM-7600F field emission scanning electron microscope. For this purpose, the film samples were prepared on an alumina tape substrate. Observations of the surface topography were carried out at 5 keV incident electron beam energy. The microscope was equipped with an energy dispersive X-ray (EDX) spectrometer using X-MaxN 150 Silicon Drift Detector (Oxford Instruments). Due to the small thickness of the C-nPd layer, the quantitative analysis was carried out at a 5 kV accelerating voltage.
X-ray diffraction (XRD) studies were performed with a Rigaku SmartLab 3 kW diffractometer at room temperature in the θ/2θ scanning mode with CuKα radiation and Si:Li semiconductor detector. Diffraction measurements were performed in grazing incidence primary beam geometry (GIXD).
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