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Auriga fib sem workstation

Manufactured by Zeiss
Sourced in Germany

The Auriga FIB/SEM workstation is a dual-beam system that combines a high-resolution field emission scanning electron microscope (FE-SEM) and a focused ion beam (FIB) column. The system is designed for high-resolution imaging, material analysis, and site-specific sample preparation.

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2 protocols using auriga fib sem workstation

1

FIB/SEM Imaging of Trophozoites

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Trophozoites were allowed to attach to laser marked slides (LASERMarking, Munich, Germany) in a silicon anaerobic chamber at 37°C. Slides were rinsed with PBS, pH 7.2 and immediately fixed with 2.5% (v/v) glutaraldehyde (Science Services GmbH, Munich, Germany) in 75 mM cacodylate (Sigma-Aldrich), 75 mM NaCl, 2 mM MgCl 2 for 30 min, followed by 3 washing steps in cacodylate buffer. Cells were stained with DAPI, sealed with a coverslip and Fixogum (Marabu GmbH, Tamm, Germany) to prevent drying during LM investigation on Zeiss Axiophot fluorescence light microscope. The positions of cells of interest (ROIs) were marked on a template, with the same coordinates. For documentation, epifluorescence, phase contrast and DIC images were taken to retrieve the ROIs in FIB/SEM. All other steps, i.e. postfixation, ultrathin embedding, mounting, imaging in a Zeiss Auriga FIB/SEM workstation operating under SmartSEM (Carl Zeiss Microscopy, Oberkochen, Germany) and image analysis using Amira (Thermo Fisher Scientific, USA) were carried out as described in [70 (link),71 (link)].
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2

Characterization of Phosphate Block Copolymers

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The FTIR spectra were recorded on a Nicolet 6700 FT-IR Spectrometer by using a Smart Orbit accessory. 1H NMR and 31P NMR spectra of the phosphate block copolymer were performed on a Bruker NMR instrument (400 MHz) in CDCl3. When performing 31P NMR spectroscopy, tri-n-octylphosphineoxide (TOPO) was used as the external standard in order to calculate the phosphorus content within the block copolymers. GPC was conducted using a PL-GPC 50 plus (Agilent Tech) at 1.0 mL/min and 35 °C with tetrahydrofuran (THF) as the mobile phase and polystyrene as the calibration reference. UV-Vis spectroscopy was completed using a Cary 5000 UV-Vis-NIR spectrometer (Agilent Tech). Atomic absorption (AA) spectroscopy was performed on an AAnalyst 800 atomic absorption spectrometer (Perkin Elmer) with the calcium hollow cathode lamp (422.7 nm) as the radiation source. SEM images for preconditioned, treated and etched enamel blocks were collected using a Zeiss Auriga FIB-SEM workstation. The specimens were not sputtered by gold or any other metal, but an InLens detector at an accelerating voltage of 2 kV was employed in order to obtain high resolution images.
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