Kappa ccd diffractometer
The Kappa CCD diffractometer is a single-crystal X-ray diffraction instrument manufactured by Bruker. It is used for the determination of crystal structures and the analysis of chemical compositions. The core function of the Kappa CCD diffractometer is to collect high-quality X-ray diffraction data from single-crystal samples.
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13 protocols using kappa ccd diffractometer
Single-crystal X-ray Diffraction Analysis
X-Ray Crystallography of Organic Compounds
Example 5
X-Ray Crystallography. X-ray diffraction data were collected on either a Nonius kappaCCD diffractometer (MoK□ X-rays: 1,9-DMeiPrPT) or a Bruker-Nonius X8 Proteum diffractometer (CuK□ X-rays: 1,9-DMeEPT, 1,9-DMePhPT). Raw data were integrated using the Denzo-SMN package23 (kappaCCD) or by APEX2 (X8 Proteum).24 Scaling and merging for all datasets were performed using SADAB S.25 All structures were solved using SHELXT26 and refined with SHELXL-2014/7.27 Hydrogen atoms were included using the riding-model approximation. Non-hydrogen atoms were refined with anisotropic displacement parameters. Atomic scattering factors were taken from the International Tables for Crystallography, vol. C.28 Reference is made to
Structural Analysis of HDMPA Polymorphs
Data collection was carried out at 90 K on a Nonius kappaCCD diffractometer with MoKα radiation (λ = 0.71073 Å),33 and at 296 K on a Bruker SMART APEX II diffractometer.
Cell refinement and data reduction were done using SCALEPACK and DENZO-SMN for the low temperature structure,34 and SADABS and Bruker SMART for the room temperature structure. Structure solution and refinement were carried out using the SHELXS and SHELXL2016 programs, respectively.35,36 (link)Powder X-ray diffraction (PXRD) data for each sample were collected on a Rigaku X-ray diffractometer with CuKα radiation (40 kV, 40 mA, λ = 1.5406 Å) between 5.0–50.0° (2θ) at ambient temperatures. The finely ground sample was placed on a quartz plate in an aluminum holder.
Single-Crystal Structure Determination of Abexinostat Tosylate
Example 4
A saturated solution of abexinostat tosylate in 2,2,2-trifluoroethanol is prepared by stirring a suspension for 24 hours at ambient temperature, followed by filtration. 1 mL of the resulting solution is then poured into a 1.8-mL HPLC vial, to which 0.25 mL of water is added. The solution is maintained at ambient temperature for 75 minutes. After centrifuging and then drying, the solid is isolated for analysis. From among the crystals obtained a crystal of sufficient quality is taken for single-crystal X-ray diffraction analysis. The crystalline structure of the above single crystal was determined using a Bruker Kappa CCD diffractometer equipped with an FR590 generator having a molybdenum anticathode (λMoKα1=0.7093 Å) with an angular range from 2° to 27.5° in terms of θ. The following parameters were established:
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- crystal unit cell: triclinic
- unit cell parameters: a=10.467 Å, b=14.631 Å, c=20.159 Å, α=73.971°, β=79.040°, γ=72.683°
- space group: P−1
- number of molecules in the unit cell: 4
- volume of the unit cell: Vunit cell=2813.0 Å3
- density: d=1.345 g/cm3.
Structural Analysis of AS Adsorbent Materials
Characterization of Organic Compounds
Single-Crystal X-Ray Diffraction Analysis of UPJS-17
[29] Hydrogen atoms were refined isotropically and all other atoms anisotropically. Hydrogen atoms residing on aromatic carbon atoms were included in an ideal position with the C−H bond fixed to 0.95 Å and Uiso(H) assigned to 1.2 Ueq of the adjacent carbon atom. The contribution of guest molecules located in the pores was substracted by the SQUEEZE procedure in Platon.
[18] (link) The structure figures were drawn using DIAMOND software.
[30] Crystal data for
Deposition Number
NMR Characterization of Antimicrobial Compounds
Single Crystal X-Ray Diffraction Analysis
Structural Analysis of Organometallic Compounds
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