Jsm 5600lv sem
The JSM-5600LV is a low-vacuum scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and microanalysis capabilities for a wide range of samples, including those that are not entirely dry or conductive. The JSM-5600LV can operate in both high and low vacuum modes, allowing it to accommodate a variety of specimen types. Its core function is to capture detailed images and gather analytical data about the surface and composition of materials at the micro and nanoscale level.
Lab products found in correlation
14 protocols using jsm 5600lv sem
Microsphere Size Characterization via Coulter Counter and SEM
Microparticle Shape Evaluation in Biomedical Applications
Embryo Ultrastructure Analysis by TEM and SEM
Micromorphological Analysis of Printed Parts
Evaluating Surface Roughness of PCL Scaffolds
The water contact angle test was also employed to evaluated the PCL scaffolds with Mw: 150,000 before and after NaOH treatment, which were performed on the produced PCL film. The film were then treated with NaOH as introduced before. Contact angles of deionized water drops were recorded and calculated with Image J software.
Comprehensive Analytical Techniques
Surface Morphology Analysis of Dental Specimens
Multimodal Characterization of Iron-Doped Particles
Structural Characterization of Novel Compounds
LX1180 were characterized by Fourier transform infrared (FTIR) spectroscopy
(Nicolet NEXUS 670, American Nicolet Corporation, Madison, Wisconsin).
The images of GSH-SMIP and NMIP were characterized by a scanning electron
microscope (SEM, JSM-5600LV SEM, JEOL, Tokyo, Japan). The mass spectrometry
analysis of GSH-SMIP was carried out using a time-of-flight mass spectrometer
(TOF, MicroTof Q II, Bruker).
Structural Characterization of Fatty Acids
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