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13 protocols using sputter coater

1

Scanning Electron Microscopy of Thymol-Treated Bacteria

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JM109-Thyr and original JM109 strains were observed by scanning electron microscopy (SEM). After overnight incubation in LB broth at 37 °C, bacterial cells were suspended to OD 600 = 0.5 in LB broth and divided into two sterile Eppendorf tubes to which thymol was added to one tube at a concentration of 100 μg l− 1, whilst the other was left untreated as a control. Samples were incubated in a rotary shaker set at 200 rpm and 37 °C. After 2 h, the cells were harvested by centrifugation at 14,000x g for 2 min, washed twice and suspended in phosphate buffer saline (PBS). Each suspension (200 μl) was placed on poly-L-lysine-coated glass cover slips for 15 min on both sides. Adhered bacteria were fixed with a solution of 2.5% glutaraldehyde pH 7 for 15 min. After fixation, samples were washed with water for 15 min, dehydrated by increasing serial dilution of ethanol (30, 50, 70, 80, 90%) immersions for 10 min each and for 1 h in 100%. Samples were dried in a Balzers critical point dryer CPD 030 (Bal-Tec, Germany), and metal coated in a sputter coater (Edwards, UK). All samples were observed with a field emission Quanta SEM equipped with a cold stage and a cryo-preparation chamber (Thermo Fisher Scientific, MA, USA). The experiment was performed in triplicate.
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2

Imaging Fungal Responses to Bacterial VOCs

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Experiment J. The OP assay with cellophane agar was used for SEM observations. The mycelium of H. abietinum strain 10 exposed to the VOCs of P. protegens strain CHA0 grown on LBA was compared to the mycelium of the same fungal strain exposed to the VOCs of CHA0 grown on PDA (i.e., LBA vs. PDA). CHA0 was grown on LBA or PDA for 2 days, and H. abietinum strain 10 was grown on PDA for 5 days, both at 27°C in the dark. Then, the bacterium and fungal plates were joined without the lid and sealed, so the exposure to VOCs started. SEM inspections were made at 15 and 30 min, 1, 3, 6, 12, 24, 48, and 168 h of exposure to VOCs. Three replicates (plates) per treatment and time point were used, and three cellophane squares per plate were sampled at each time point. Cellophane squares were taken from the fungal colony edge for observing the actively growing hyphae. Cellophane squares were placed firmly onto aluminum stubs for SEM by double-sided carbon tape and directly subjected to gold/palladium sputter coating (Edwards Sputter Coater) under 10–1 mbar gas pressure and 20 mA current for 1 min. Coated samples were placed in the chamber of an SEM Hitachi TM 3000 Tabletop Microscope and observed in Standard Mode Observation with 15KV voltage supply and 5 × 10–3 mbar gas pressure.
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3

Characterization of Nanostructured Materials

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TEM images were obtained using a JEOL JEM-2100 electron microscope at an accelerating voltage of 100 kV. SEM images were obtained using a field-emission scanning electron microscopy (model JEOL 7600F) at an acceleration voltage of 5 kV. Prior to analysis, the samples were coated with gold layer using an Edwards Sputter Coater to enhance their conductivity. To prepare the sample, 0.4 mL of the sample solution was taken and centrifuged at the speed of 12g for 8 min (for bowls, bottles, and cucurbits), or 1.5g for 12 min (for more complex interconnected structures). The supernatant was removed, and the precipitate solution was dropped on a copper grid, which was pre-treated by a Harrick Plasma cleaner for 30 s to remove oxidations. For DLS measurement, 1 mL of the sample solution was injected to a four sides transparent glass cuvette, and then capped to avoid volatilize of solvent. A model ZEN 5600 from Malvern, and a back-scattering mode with an angle of 173° was used for all the measurements. SAED and HR-TEM were performed on a JEOL JEM-3010 TEM at 300 kV. HAADF-STEM imaging and EELs spectrum were carried out on a FEI-Titan ST electron microscope operated at 300 kV.
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4

Morphological Analysis of Effervescent Formulation

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EF-2 was placed on a brass stub with the application of double-sided adhesive tape, and then coated in a vacuum chamber with a thin layer of gold for 30 seconds (Sputter coater, Edwards, S150A, England, UK) to prepare it as electrically conductive. The pictures were taken at an excitation voltage of 20 kV (Electron probe microanalyzer, JEOL, JXA-840A, Tokyo, Japan) to check the surface morphology of the selected formula. A confocal laser scanning microscope was used to examine the surface morphology of EF-2. A Biorad MRC 1024 Laser Scanning Confocal Imaging System (Hemel Hempstead, UK), equipped with an argon ion laser (American Laser Corp, Salt Lake City, UT, USA) and a Zeiss Axiovert 100 microscope (Carl Zeiss, Oberkochen, Germany) was used to examine the effervescent formulation.
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5

Surface Morphology Analysis of Formulations

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OC-SD, OC-PF formulations, and their placebo formulations were placed on a brass stub using double-sided adhesive tape. They were then coated in a vacuum chamber with a thin layer of gold for 30s (Sputter coater, Edwards, S150A, England, UK) to execute electrically conductive fields. The images were then captured at an excitation voltage of 20 kV (Electron probe microanalyzer, JEOL, JXA-840A, Tokyo, Japan) to explore the surface morphology of each examined formulation.
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6

Morphological Analysis of 3D Porous PEDOT:PSS

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Surface porous pattern and the cross-section morphology of 3D porous PEDOT: PSS were investigated with JEOL JSM-7500FA field emission SEM (the acceleration voltage of 5.0 kV, emission current of 10 mA). Surface morphology of pristine PEDOT: PSS thin film, Pt, bended PEDOT: PSS thin film and bended Pt were investigated by Leica DM6000 Optical Microscope. Serial connection Platinum (Pt) was coated by Edwards Sputter Coater. Thickness of various electrodes were measured by Mitutoyo spiral micrometer.
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7

Ultrastructural Analysis of Triatomine Nymphs

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The fifth instar nymphs from T. sherlocki and T. lenti(Figure 1) were cleaned using an ultrasound device. Next, the structures were dehydrated in alcohol, dried in an incubator at 45ºC for 20 min, and fixed in small aluminum cylinders with transparent glass. Sputtering metallization was then performed on the samples for 2 min at 10 mA in an Edwards sputter coater. After metallization, the samples were studied and photographed using a Topcon SM-300 scanning electron microscope (SEM), according to Rosa et al.26. The images obtained were processed (background, contrast, brightness) using the GNU Image Manipulation Program v2.0.2 (GIMP) software free and open-source image editor, and the structures were described and compared.
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8

Coverslip Preparation for TIRF Microscopy

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Glass coverslips (Thickness No. 1) were washed with 3 M NaOH for 1 h, followed by one wash in piranha solution (40% (v/v) hydrogen peroxide, 60% (v/v) sulphuric acid) for 1 h and treatment with air plasma (Sputter Coater, Edwards) for 10 min. Imaging chambers were prepared from these coverslips using double-sticky tape and passivated glass slides as counter surfaces as described (Bieling et al, 2010 (link)). All microscopy was performed at 25 ± 1°C with a total internal reflection fluorescence microscope (Nikon) equipped with a 100× objective (Nikon, 1.49 NA Oil, APO TIRF). The imaging system was equipped with the following lasers: 150 mW 488 nm, 150 mW 561 nm laser (both Coherent Sapphire) and 100 mW 641 nm (Coherent Cube). Images were acquired with a back illuminated EMCCD camera (iXonEM+ DU-897E, Andor, UK) controlled with μManager software (http://micro-manager.org/wiki/Micro-Manager). The size of each pixel was 105 × 105 nm.
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9

Optical and Electron Microscopy of Hydrogel Structures

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Optical microscopy was employed using a LEICA M205A optical microscope to measure the average diameter for all GG-MA:CHT microstructure bundles and used to calculate the structure volume over the fixed structure length of 10-30 mm. This method assumed a consistent structure cross-section by calculating an average for each structure diameter over multiple randomly selected points (n=5). SEM microscopy was carried out using a JEOL JSM-7500FA Field Emission Electron Microscope (FE-SEM) to further investigate the structure diameter and morphology. Hydrogel structure bundles were flash-frozen in liquid nitrogen and freeze-dried for 72 hrs before being sputter-coated with platinum (Pt) using an Edwards sputter-coater (coating thickness; 10 nm). The images were captured at 15 kV or 20 kV.
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10

Multimodal Characterization of Samples

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SEM images were obtained using a JEOL JSM-7800F field-emission scanning electron microscope at an acceleration voltage of 5 or 10 kV on a tilt stage. Before SEM imaging, the samples were coated with a layer of Pt using an Edwards Sputter Coater to enhance its conductivity. The optical images were collected via a COSSIM CMY-310 optical microscope. Raman spectrums were obtained via an inVia™ confocal Raman microscope system from Renishaw under a 532 nm laser.
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