Spectrum one spectrometer

The Fourier Transform Infrared spectroscopy (FTIR) spectra of the composites were recorded on a PerkinElmer Spectrum one Spectrometer (PerkinElmer, Shelton, CT, USA) equipped with diamond crystal and an incident angle of 45° was used. The atmospheric compensation function that minimises effect of atmospheric water and CO₂ on the sample spectra, without the need for reference or calibration spectra. The Absolute Virtual Instrument (AVI) in PerkinElmer actively standarises instrument response to improve repeatability and protect data integrity. The instrument was operated under the following conditions: 4000–650 cm⁻¹ wave number range, 4 cm⁻¹ resolution, and 16 scans. The specimen dimension was 2 mm × 2 mm × 1 mm for both untreated and coupling agent treated composites, and the average of three measurements was used.

GO was characterized using a Zetasizer Nano ZS (Malvern, Herrenberg, Germany), and the lateral size was calculated as reported previously. Representative images were obtained with NanoWizard II AFM (JPK Instruments AG, Berlin, Germany), as reported previously. The chemical analysis of the surfaces was obtained using attenuated total reflectance-Fourier transform infrared (ATR-FTIR) spectroscopy (Spectrum One spectrometer from Perkin Elmer, Waltham, MA, USA) as previously reported [47 (link)]. The surfaces were directly laid on the ATR crystal, and the spectra were recorded in the wave number range of 4000–550 cm⁻¹.

FTIR measurements were performed using a Perkin Elmer Spectrum One spectrometer (Perkin Elmer, Waltham, MA). The spectra were measured using transmittance mode in KBr (Merck, Germany) pellets containing 1% in weight powder samples. The pellets were prepared using a press (Equilab, Madrid, Spain) under 5000 kg_f for 1 h with the help of a 13 mm pellet die (Carver, Wabash, IN, USA).

Collected tillers at the R1 developmental stage were ground to ½ mm (40 mesh) particle size and the crystallinity index was measured by Fourier transform infrared (FTIR). Spectra were collected using a diamond crystal of an attenuated total reflectance (ATR) accessory of a Perkin Elmer Spectrum One spectrometer (Waltham, MA). Spectra were collected over the range of 4000–650 cm⁻¹ in the absorbance mode, with 1 cm⁻¹ resolution and eight scans per spectra. Ten spectra were collected for each sample. The data were then ATR corrected and normalized in the Spectrum One software. The index of crystallinity was calculated by the intensity ratio between the bands at 1422 and 899 cm⁻¹, assigned to CH₂ bending mode and deformation of anomeric CH, respectively [39 (link)]. Statistical analysis was achieved with triplicate measures of biomass collected using SAS^® (Version 9.3 SAS Institute Inc.) programming of mixed model ANOVA with LSD.

¹H NMR (500 MHz), ¹³C NMR (75 MHz), and ³¹P NMR spectra were recorded using a Bruker Avance III 500 MHz spectrometer. The appropriate frequencies using either residual CDCl₃ or DMSO
-d₆as internal reference (for ¹H and ¹³C) were applied for the analysis of NMR data. Perkin–Elmer Spectrum One spectrometer was used for attenuated total reflectance Fourier transform infrared (ATR–FTIR) spectroscopy. Impedance Spectroscopy was measured by using Hioki 3532 LCR meter at room temperature. Size-exclusion chromatography (SEC) was performed with a system consisting of a Waters 515 pump, a RI Waters 2410 and PSS GRAM 1000 column. DMF (with LiBr, 3 g L^–1) was used as the mobile phase (flow rate 1 mL min^–1) at 60 °C. Pullulans from PSS (Polymer Standard Service (PSS), Mainz, Germany) were used as standards. SEM analysis was performed using a Philips XL30 ESEM-FEG/EDAX instrument by the backscattered electrons (BSE) and the secondary electrons (SE) detectors. The measurements of TEM were carried out on a JEOL JEM-2100 with a LaB6-cathode (200 kV). Camera is a Gatan Orius SC1000 CCD. CV measurements were carried out using a Radiometer Analytical PST050 potentiostat, interfaced to PC running Voltamaster 4.0 software. Absorbance spectrum was recorded using a Shimadzu UV-2600 Spectrometer.

X-ray diffraction (XRD) and X-ray fluorescence (XRF) analyses were conducted to confirm the mineralogy and chemical composition of the adsorbents. The XRD patterns were recorded by a PANalytical X’Pert Pro X-ray diffractometer (Malvern Panalytical) using monochromatic CuKα1 radiation (λ=1.5406 Å) at 45 kV and 40 mA. Diffractograms were collected within the 2θ range 10°–90° at 0.017° intervals and with a scan step time of 100 s. The crystalline phases and structures of the adsorbents were analyzed using the HighScore Plus software (Version 4.0, PANalytical). The peaks were identified according to the International Centre for Diffraction Data (ICDD) (PDF-4+ 2020 RDB). The phases were quantified through Rietveld analysis using HighScore. XRF spectra were recorded by a PANalytical Axios mAX XRF spectrometer, wherein the samples were prepared as loose powders using a mylar film under helium atmosphere at 4 kW.
The Fourier transform infrared spectroscopy (FTIR) spectra of the adsorbents were collected using a Perkin Elmer Spectrum One spectrometer equipped with an attenuated total reflectance unit.

Fourier transform infrared spectroscopy (FTIR-ATR) was used to detect the changes in the structure of the polymer blends. FTIR-ATR analysis was performed at ambient temperature using a Perkin Elmer Spectrum One spectrometer, Waltham, MA, US. Spectra in attenuated total reflection (FTIR-ATR) mode were recorded in the frequency region of 400–4000 cm⁻¹ using a Diamond ATR system with a ZnSe lens. The spectra were recorded with a resolution of 2 cm⁻¹ by coadding the results of 10 scans.