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Jsm 6610lv scanning electron microscope

Manufactured by JEOL
Sourced in Japan, United States

The JSM-6610LV is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution images of surface topography and composition. The JSM-6610LV utilizes a tungsten filament electron gun to produce a focused electron beam that scans the sample's surface, generating signals that are detected and used to create images. The instrument is capable of operating in a low vacuum environment, allowing for the examination of a wide range of samples without the need for extensive sample preparation.

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38 protocols using jsm 6610lv scanning electron microscope

1

Comprehensive Characterization of CoMoS Catalysts

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Example 3

Characterization of the Activated CoMoS Catalysts

Textural properties of the catalysts were evaluated via N2 adsorption-desorption isotherm analysis at 77 k using a Micromeretics ASAP 2020. The catalysts (approximately 0.1 g each) were initially degassed under flowing argon at 523 k for 2.5 h. The BET method was used to calculate the surface area, whereas absorption branch of BJH method was applied to calculate the pore size and pore volume of the catalysts.

FTIR spectra of the catalysts were recorded on a Nicolet 6700 FTIR spectrometer with a wavelength range of 400-4000 cm−1. The FTIR sample pellets were prepared using a mixture of the respective catalyst and KBr at a weight ratio of 1:100.

Catalyst crystallinity and the distribution of CoMo on the silica support were determined by scanning the catalysts' X-ray diffraction pattern between 20 to 80° 2θ at 40 kV and 40 mA using a Rigaku Ultima IV X-ray diffractometer.

Surface morphology of the catalysts was imaged using a JEOL JSM-6610LV scanning electron microscope. Element mapping with the corresponding EDX spectrum were recorded using an energy dispersive X-ray spectrometer.

The degree of Mo sulfidation of the catalysts due to different activation conditions were determined by X-ray photoelectron spectroscopy (XPS) using a PHI 5000 Versa Probe II, ULVAC-PHI Inc. spectroscope.

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2

Metallographic Analysis of Implant Abutments

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The metallographic study was performed using a Secondary Electron (SE) detector of JEOL JSM-6610LV scanning electron microscope (JEOL, Peabody, MA, USA), with the accelerating voltage amounting up to 20 keV. The investigation was carried out in several magnifications ranging from 500× up to 2500×.
An EDS X-MAX 80 microanalyzer (Oxford Instruments, Abingdon, UK) was applied to perform the qualitative and quantitative microanalysis of the chemical constitution.
Three samples of each implant abutment study group (Astra and Apollo) were evaluated before and after the corrosion tests.
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3

Scanning Electron Microscopy of H. pylori

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A morphological analysis of H. pylori bacteria after exposure to the MIC and a sub-MIC was performed by scanning electron microscopy (SEM). For sample preparation, culture medium containing bacteria exposed to paepalantine was aliquoted and centrifuged at 4000 rpm for 5 min. The supernatant was discarded, and 1 mL of 0.1 M sodium cacodylate buffer (pH 7.2) was added. After centrifugation, the cell pellet was resuspended with 200 µL of 0.1 M sodium cacodylate buffer (pH 7.2). One aliquot was placed in the center of a cover slip and allowed to dry. The material was then fixed with 2.5% glutaraldehyde in 0.1 M sodium cacodylate buffer (pH 7.2) for 30 min. Finally, the sample was dehydrated with alcohol, and the material was sputter coated for analysis in a JEOL® JSM-6610LV scanning electron microscope (Tokyo, Japan) at an accelerating voltage of 10 kV [56 (link),57 (link),58 (link)].
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4

SEM Analysis of Fungal Mycelia

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The SEM analysis was performed according to our previous method [17 (link)]. The mycelia of P. digitatum and P. italicum were obtained from 2-day cultures grown in potato dextrose broth (PDB) at 25 ± 2°C, 150 rpm. These were treated with p-anisaldehyde at 0, 1/2 MIC and MIC for 2 h, respectively. The mycelia morphologies of the samples were directly obtained with a JSM-6610LV scanning electron microscope (JEOL, Japan).
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5

Ultrastructural Analysis of Fungal Conidia

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The conidial morphology of both strains was analyzed by transmission electron microscopy (TEM) and scanning electron microscopy (SEM), and ex vivo human skin infection was analyzed by SEM. The cell wall thickness was measured at 10 points for each conidium, in a total of 20 conidia from each strain, using ImageJ software.
Briefly, for SEM, conidia and skin fragments were fixed with 3% glutaraldehyde in 0.1 % phosphate buffer (v/v) (pH 7.2) at 4 °C for 2 h. After washing in 0.1 % phosphate buffer (pH 7.2), samples were post-fixed with 1% osmium tetroxide (v/v) for 2 h and dehydrated in an ethanol gradient. Samples were sputter-coated with gold and analyzed using a JEOL JSM-6610 LV scanning electron microscope at an acceleration of 25 kV. For TEM, conidia were harvested from 15-days Sabouraud agar plates and fixed with 2% glutaraldehyde and 2% paraformaldehyde in 0.1M cacodylate buffer (pH 7.2) for 24 h following post-fixation with 1% osmium tetroxide for 1 h at room temperature. After washing in water, conidia were treated with 0.5% uracil acetate, dehydrated in an ethanol gradient, and embedded in epoxy resin at 60°C for 48 h. After washing with propylene oxide, the samples were cut into ultrathin sections and analyzed using the JEOL JEM-100 CXII electron microscope and a Hamamatsu ORCA-HR digital camera.
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6

Surface Morphology Evaluation by SEM

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To evaluate the surface morphology, the same samples used for profilometry were coated with gold-palladium (Quorum Technologies Polaron SC7620, Newhaven, East Sussex, UK) and observed under SEM (JSM-6610 LV Scanning electron microscope, JEOL USA) with 50X, 500X and 5000X magnifications and 15 kV voltage.
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7

Biofilm Visualization in Human Nails

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The samples were initially fixed using 3% glutaraldehyde in 0.1% phosphate buffer (v/v) (pH 7.2) at 4 °C for 24 h and rinsed with 0.1% phosphate buffer (pH 7.2). Osmium tetroxide (1%) was used during the post-fixation step. Subsequently, the samples were dehydrated in an increasing ethanol gradient involving successive baths of increasing ethanol concentrations. Gold was then spray-coated on these samples to visualise biofilms formed in human nails. A JEOL JSM-6610 LV scanning electron microscope at an acceleration voltage of 25 kV was used for visualisation.
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8

Characterization of Sintered β-TCP Scaffolds

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3D-printed, sintered ß-TCP rectangular prisms (each one 12 × 12 × 1.5 mm3) were polished using increasing (specifically, 320, 400, 600, and 1000) grit silicon carbide paper each at 200 rpm for 1 min. The polished scaffolds were characterized for morphology following sputter coating with gold and palladium (STEM Hitachi S5500). SEM imaging was obtained using a JEOL JSM-6610LV Scanning Electron Microscope (JEOL Ltd, Akishima, Tokyo, Japan) at an applied voltage of 20 kV and a magnification factor of up to ×2500.
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9

Scanning Electron Microscopy of Infested Samples

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The infested samples were double fixed with 4% glutaraldehyde and osmium tetroxide overnight and then washed with 0.01 mol·L−1 pH 6.8 PBS (phosphate buffered saline) 6 – 8 times. After washing, the samples were dehydrated by gradient ethanol, dehydrated in 100% acetone twice, and then replaced with isoamyl acetate twice. After the sample was dried using a K850 CO2 critical point dryer (EMITECH, UK) at room temperature, it was glued and coated. A JSM-6610LV scanning electron microscope was used for observation and photography (JEOL, Japan) at 15 kV.
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10

Characterization of Activated CoMoS Catalysts

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Example 3

Characterization of the Activated CoMoS Catalysts

Textural properties of the catalysts were evaluated via N2 adsorption-desorption isotherm analysis at 77 k using a Micromeretics ASAP 2020. The catalysts (approximately 0.1 g each) were initially degassed under flowing argon at 523 k for 2.5 h. The BET method was used to calculate the surface area, whereas absorption branch of BJH method was applied to calculate the pore size and pore volume of the catalysts.

FTIR spectra of the catalysts were recorded on a Nicolet 6700 FTIR spectrometer with a wavelength range of 400-4000 cm−1. The FTIR sample pellets were prepared using a mixture of the respective catalyst and KBr at a weight ratio of 1:100.

Catalyst crystallinity and the distribution of CoMo on the silica support were determined by scanning the catalysts' X-ray diffraction pattern between 20° to 80° 20 at 40 kV and 40 mA using a Rigaku Ultima IV X-ray diffractometer.

Surface morphology of the catalysts was imaged using a JEOL JSM-6610LV scanning electron microscope. Element mapping with the corresponding EDX spectrum were recorded using an energy dispersive X-ray spectrometer.

The degree of Mo sulfidation of the catalysts due to different activation conditions were determined by X-ray photoelectron spectroscopy (XPS) using a PHI 5000 Versa Probe II, ULVAC-PHI Inc. spectroscope.

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