Axis ultra dld x ray photoelectron spectrometer

The transmission electron microscopic (TEM) images were obtained on a JEOL JEM-2100F transmission electron microscopy (Tokyo, Japan). The X-ray photoelectron spectra (XPS) were recorded on a Kratos AXIS ULTRA DLD X-ray photoelectron spectrometer (Tokyo, Japan). The Fourier transform infrared spectra (FTIR) were acquired on a Bruker Tensor II FTIR spectrometer (Bremen, Germany). The UV-vis was performed on a Lambda 950 absorption spectrophotometer (PerkinElmer, Llantrisant, UK). Nanosecond fluorescence lifetime assays and photoluminescence spectra were recorded by FLS 980 fluorescence spectrometer steady-state model and time-correlated single-photon counting (TCSPC) system (Edinburgh Instruments Ltd, England), respectively. The quantum yields (QYs) of the as-prepared carbon dots were determined using quinine sulfate in 0.1 M H₂SO₄ (literature QYs: 54.6%) as the standard sample by comparing the integrated fluorescence intensities (excitation at 360 nm) and absorbance values at 360 nm of the carbon dots aqueous solutions with those of quinine sulfate, which was determined by FLS 980 spectrophotometer.^{26,27 (link)}

FESEM images
of the precipitates were recorded using a Hitachi S-4800 field emission
scanning electron microscope (Hitachi Limited, Japan) with an operating
voltage of 5.0 kV. The samples were sputter-coated with Au for 25
s prior to imaging. TEM, HRTEM, SAED, and electron diffraction (EDX)
measurements were carried out using a JEM-2100 transmission electron
microscope (JEOL, Japan) at 200 kV. Powder XRD patterns were obtained
on a Rigaku D/max-2400 X-ray diffractometer (Japan) with Cu Kα
radiation (40 kV, 40 mA) at a scanning rate of 0.02°/s in the
2θ range from 10 to 80°. XPS experiments were performed
on a Kratos Axis UltraDLD X-ray photoelectron spectrometer (England)
with a monochrome X-ray source using AlKα (1486.6 eV) radiation.
The measured binding energies were corrected by referencing the C
1s line to 284.5 eV. TGA was carried out on a TGA/NETZSCH STA449 F3
instrument under a nitrogen atmosphere at a heating rate of 10 °C/min
from 27 °C to 800 °C. The Brunauer–Emmett–Teller
(BET) method was employed to calculate the specific surface areas
(S_BET). The room-temperature photoluminescence
spectra were acquired on a Hitachi F-7000 luminescence spectrometer
using a Xe lamp with an excitation wavelength of 325 nm. The UV–vis
spectra of the ZnO samples were measured on a UV-1750 UV–vis
spectrophotometer.

Transmission electron microscopy (TEM) and high-resolution TEM images (HRTEM) were taken on a JEOL JEM-2100 microscope with an accelerating voltage of 60 kV. Fourier transform infrared (FT-IR) spectra were recorded in the form of KBr pellets with a BRUKER TENSOR 27 spectrometer. X-ray photoelectron spectroscopy (XPS) measurements were conducted on a Kratos AXIS ULTRA DLD X-ray photoelectron spectrometer with mono X-ray source Al Kα excitation (1486.6 eV). The excitation and emission spectra of l-/d-CQDs aqueous solution were collected on a Horiba Fluoromax-4 luminescence spectrometer using Xe lamp as excitation source. The circular dichroism spectra (CD) and ultraviolet-visible (UV-vis) absorption spectra of samples aqueous solution were obtained on a JASCO J-1500 spectropolarimeter.

Crystallographic data for the synthesized nanoparticles were investigated by powder X-ray diffraction (P-XRD). The P-XRD pattern of the SBO NPs was recorded using a BRUKER ECO D8 advance with Cu Kα radiations (λ = 0.15406 nm) at room temperature. The FT-IR spectrum of the synthesized nanoparticle (as pellets in KBr) was recorded using a IRTRACER-100 FT-IR spectrometer. The morphology of the synthesized NPs was investigated by high-resolution transmission electron microscopy (HR-TEM, JEOL, JEM-2100 plus, Japan) and high-resolution scanning electron microscopy (HR-SEM, Thermo Scientific, Apreos), with energy-dispersive spectroscopy (EDS) and mapping to elemental analysis. A Kratos Axis Ultra-DLD X-ray photoelectron spectrometer was utilised in order to carry out the X-ray photoelectron spectroscopic (XPS) investigations.