Tecnai g2 f30 microscope

Manufactured by Philips

The TECNAI G2 F30 is a transmission electron microscope manufactured by Philips. It is designed to provide high-resolution imaging and advanced analytical capabilities for materials science and biological research. The core function of the TECNAI G2 F30 is to enable the observation and analysis of samples at the nanometer scale.

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Lab products found in correlation

S 4700, by Hitachi (2 mentions)

Close spelling variants of this product

Tecnai F30 (9 citations) TECNAI G2 (6 citations) Tecnai G2 F30 (2 citations)

3 protocols using tecnai g2 f30 microscope

SEM and TEM Analysis of Nanomaterials

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A scanning electron microscopy (SEM)
study (Figures S3–S6) of the obtained
materials was performed
using a FE-SEM (Hitachi S-4700, Japan) equipped with a standard secondary
electron (SE) detector at an operating voltage of 15 kV at the magnification
range of ×5000 to ×100 000.
A transmission
electron microscopy (TEM) (Figures 1, 2, S1, and S2) analysis was performed using a TECNAI G2 F30 microscope
(FEI-Philips, Holland) equipped with a high-angle annular dark field
detector at an operating voltage of 300 kV. The powder samples were
added to acetone (chromatographic grade) and sonicated. A drop of
the suspension was then deposited on a copper grid with a thin carbon
film. After acetone evaporation, sample particles remaining on the
film were studied.

Protsak I.S., Gun’ko V.M., Henderson I.M., Pakhlov E.M., Sternik D, & Le Z. (2019). Nanostructured Amorphous Silicas Hydrophobized by Various Pathways. ACS Omega, 4(9), 13863-13871.

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Synthesis and Characterization of Carbon Quantum Dots

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1,2-Ethylenediamine
(99%) was obtained from Sinopharm Chemical Reagent Co., Ltd. (Shanghai,
China). Acrylic acid (99%), glycidyl methacrylate (GMA, 97%), 2,2′-azodiisobutyronitrile
(AIBN, 99%) and methyl methacrylate (MMA, 99%), and all other reagents
purchased from Aladdin Industrial Corporation (Shanghai, China) were
used directly in the as-received condition without further purification.
PMMA (M_w = 43 982) used in this
work was supplied by Alfa Aesar (Shanghai, China). Photoluminescence
(PL) emission spectra were performed on an RF-5301 PC spectrophotometer
with a 450W xenon lamp as the excitation source. FTIR spectra were
measured on a Nexus 912 AO446 spectrophotometer in the range of 4000–400
cm^–1. ¹H NMR spectra of the samples were
measured with an Ascend 400 spectrometer with D₂O and deuterated
chloroform as solvents. The morphology and microstructure of the CQDs
were determined by high-resolution transmission electron microscopy
(HRTEM) on a Philips Tecnai G2 F30 microscope with an accelerating
voltage of 200 kV. UV–vis absorption spectra were measured
on a UV–vis spectrophotometer Lambda 750. X-ray photoelectric
spectrometry (XPS) was performed on a PHI 5000 VersaProbe to reveal
the interaction between the elements of the CQDs.

Li Y., Wang Y.Q., Liu D., Gao Y., Wang S.N, & Qiu H. (2021). Dual-Emission Ratiometric Fluorescent Probe Based on Lanthanide-Functionalized Carbon Quantum Dots for White Light Emission and Chemical Sensing. ACS Omega, 6(22), 14629-14638.

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Particulate Morphology Analysis by TEM and SEM

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TEM (TECNAI G2 F30 microscope (FEI–Philips, Amsterdam, The Netherlands), operating voltage 300 kV) was used to analyze the particulate morphology of samples (Figure 1 and Figures S1 and S2 in Electronic Supplementary Material (ESM) file). The powder samples were added to acetone (chromatographic grade) and sonicated. A suspension drop was then deposited onto a copper grid covered by a thin carbon film. After acetone evaporation, the dry sample remaining on the film was studied.
SEM (FE–SEM, Hitachi S–4700, Tokyo, Japan, operating voltage of 15 kV, and magnification of ×5000–100000) (Figure 2, Figures S3 and S4) was used to analyze the morphological features of the dried powder samples.

Protsak I., Gun’ko V.M., Turov V.V., Krupska T.V., Pakhlov E.M., Zhang D., Dong W, & Le Z. (2019). Nanostructured Polymethylsiloxane/Fumed Silica Blends. Materials, 12(15), 2409.

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