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36 protocols using 2100plus

1

Transmission Electron Microscopy Sample Preparation

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Copper grids (CF200-Cu, Electron Microscopy
Sciences) and holey carbon grids (HC200-Cu, Electron Microscopy Sciences)
were plasma treated (15 s, O2/H2) on a Gatan
Solaris plasma cleaner. Samples for TEM were prepared by adding a
4 μL sample to the grid and incubating for 30 s, after which
excess solution was blotted off with filter paper, and the sample
was dried overnight. Samples for cryo-TEM were prepared with a Leica
EM GP automatic plunge freezer. Samples (4 μL) were added to
a grid in an environmental chamber (relative humidity 90%, temperature
20 °C). Excess suspension was blotted on filter paper, and the
obtained film was vitrified in liquid ethane. Samples were stored
in liquid nitrogen until the day of use.
TEM samples were imaged
on a JEOL 2100F or JEOL 2100Plus using 200 kV, while cryo-TEM samples
were imaged only on the JEOL 2100Plus using 200 kV with the minimum
dose system. Cryo-TEM samples were imaged at −170 °C on
a Gatan914 cryo-holder for cryo-TEM imaging. Micrographs were taken
using the Gatan Orius SC1000 camera at a magnification of either 30 000×
or 15 000×.
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2

Ultrastructural Analysis of Pollen Viability

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Pollen samples were fixed with 4% paraformaldehyde, 2.5% glutaraldehyde in 0.1 M Sorenson’s Phosphate (SP) buffer at pH 7.2 overnight (Ruzin, 2000). They were washed 4× with SP buffer and centrifuged at 35,000 rpm for 5 min. Pollen was embedded in 2% low melting agarose before dehydration through a series of increasing concentrations of ethanol and infiltration with LRWhite resin (AGR1281, Agar Scientific Ltd., Stansted, Essex, UK). Samples were embedded in capsules and polymerized in a 60 °C nitrogen oven overnight. The resin blocks were cut into 100 nm slices and placed onto Pioloform-carbon-coated copper grids for staining with 2.5% uranyl acetate for 20 min [39 (link)]. Samples were rinsed with dH2O, stained with 3% lead citrate for 3 min and rinsed with dH2O again. Imaging was done using a JEOL 2100Plus transmission electron microscope (JEOL, Tokyo, Japan) at 200 kv. A range of representative pollen was imaged, from fertile-looking to non-viable. Particular attention was paid to pollen from heat-stressed plants that appeared viable to explain why it was unable to adhere to the stigma and form pollen tubes.
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3

Characterization of Ni-Al2O3 Cermet Films

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Ni NPs prepared
from several batches with the same condition were collected. The morphology
and chemical composition of Ni NPs and Ni–Al2O3 cermet films from each batch were characterized and confirmed
reproducibility using scanning electron microscopy (SEM) coupled with
the X-ray analysis (EDS), high-resolution transmission electron microscopy
(HRTEM; JEOL-2100 Plus operated at 200 kV), and energy-dispersive
X-ray fluorescence (EDXRF), respectively. The phases of the samples
were determined by X-ray diffraction (XRD). The reflectance (R) of the Ni–Al2O3 cermet films
was measured using a UV–vis–NIR spectrophotometer (Agilent
technologies, Cary 5000) over a wavelength range of 300–2500
nm with an integrating sphere. The solar absorptance was calculated
from eq 2: where Is(λ)
is the solar spectral radiation of air mass 1.5 from standard ASTM
G173 and R(λ) is the measured reflectance at
a specific wavelength λ (wavelength interval λ1 to λ2 = 300–2500 nm).
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4

Transmission Electron Microscopy Imaging

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αS samples from the end point of the aggregation kinetics were collected. Five microlitres of these samples were put onto glow-discharged Formvar/carbon-coated, 200-mesh, copper grids for 1 min. The samples were dried with a filter paper, and then washed twice with Milli-Q water for 1 s, and removed each time with filter paper. The sample was stained by incubating the grids with 5 µl Uranyl Acetate Zero (Agar Scientific) for 30 s, followed by removal of the excess stain with a filter paper. The grids were left to air dry for 2 h. The samples were imaged using a Transmission Electron Microscopy Jeol 2100 Plus (JEOL), operating at an accelerating voltage of 200 kV. Multiple grids were screened in order to obtain representative images of the samples.
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5

Particle Characterization by TEM

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The particles’ size and morphology were characterized using a transmission electron microscope (TEM; JEOL-2100 Plus, JEOL, Akishima, TYO, Japan). Samples were diluted 50-fold in deionized water, dropped onto a carbon grid, stained with phosphotungsten (1% w/w), dried in a dry cabinet overnight and observed under 100 kV with a magnification of ×25k and ×100k. The particles’ size and morphology were determined for an average of more than 50 particles for each sample.
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6

Cryo-TEM Analysis of UV-Irradiated Vesicles

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Bright-Field TEM was carried out on a JEOL 2100Plus (JEOL, Japan) using a minimum dose setup. Vesicles prepared in DI water at a 10 mg/ml concentration were irradiated for 10 min with UV-C before being prepared under cryo conditions to retain their structure using a Leica EM GP cryo plunge freezer. A volume of 5 µl of the sample was pipetted onto a holey carbon grid and the sample was allowed to settle on the grid for 30 s before blotting. The side where the sample was deposited was blotted twice for 1 s to remove any excess solution before rapid freezing in liquid ethane. The frozen sample was then transferred to the TEM under liquid nitrogen conditions.
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7

Comprehensive Characterization of MSiNPs

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The compositional analysis of the MSiNPs was measured by X-ray fluorescence (XRF) using the Spectrometer Panalytical AXIOS model. Transmission electron microscopy (TEM) observations were performed using a JEOL 2100 Plus working at an accelerating voltage of 200 kV. The particle size distribution was measured from TEM-recorded images using ImageJ software. The textural parameters and the nanoporosity were measured by N2 adsorption–desorption on a Micromeritics Tristar 3020 gas adsorption analyzer at 77 K after degassing the samples at 523 K (250 °C) for 2 h in a nitrogen stream. The textural parameters, surface area, and nanopore size were calculated according to the accepted methods in the literature [40 (link)]. The chemical bonds and functional groups, before and after amino functionalization, were evaluated by Fourier transform infrared (FT-IR) spectroscopy using a JASCO 6200 spectrometer in a transmission configuration. The amino functionalization of the nanoparticles was also qualitatively tested using salicylaldehyde (84160, Fluka & Sigma-Aldrich; Saint Louis, MO, USA) [41 (link)].
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8

Characterization of Ceramic Spheres

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The microstructures
of ceramic spheres were observed by a scanning electron microscope
(SEM, S8010, Hitachi). The crystalline phases of the samples were
characterized via X-ray diffraction (XRD, D8 Advance, Bruker). The
compressive strength of ceramic spheres was obtained using a universal
testing machine (AGS-X-10 kN, Shimadzu). The compressive strength
of the spheres is defined as the fracture load per their maximum cross-sectional
area, and the average strength was obtained by measuring 10 samples
for each at each data point,37 (link) which has
been added in the revised manuscript. Fourier transform infrared (FTIR)
spectroscopy was performed on a Nicolet iN10 FT-IR microscope (Thermo
Nicolet Corp.). The morphologies and EDX analysis of the specimens
were obtained on a transmission electron microscopy (TEM, JEOL-2100Plus).
N2 adsorption/desorption isotherms of samples were determined
via a surface area analyzer (TriStar I13020, Micromerities). Pore
size distribution and the specific surface area were obtained by the
BJH method and BET method, respectively.
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9

Comprehensive Characterization of Photoelectrodes

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The surface morphology of the as-prepared photoelectrodes were examined using a field emission scanning electron microscope (FE-SEM, JSM-7610FPlus, JEOL, Tokyo, Japan). Transmission electron microscope equipped with an energy-dispersive X-ray spectroscope (TEM/EDX) and high-resolution TEM (HRTEM) analyses were conducted by JEOL2100 Plus, operated at 200 keV. The crystalline phases of the photoanodes were characterized by X-ray diffraction (XRD; Bruker, D8 Discover, Germany) using the Cu Kα radiation in a 2θ range of 20°–80°. The functional group of the photoelectrodes were analyzed by FTIR spectroscopy and recorded over a region of 4000–650 cm−1 (Nicolet 6700, Thermo Scientific, USA). Raman spectra were recorded over a spectral range of 200–1000 cm −1 and collected on a Horiba XploRA PLUS instrument, Japan. The elemental states were analyzed by X-ray photon spectroscopy (XPS, Kratos AXIS Ultra DLD). The light absorption spectra were investigated by a UV-Vis spectrophotometer (JASCO V-630).
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10

Characterization of Synthesized Samples

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The synthesized samples were characterized for X-ray Diffraction (XRD), High-Resolution Transmission Electron Microscopy (HR-TEM) and Vibrating Sample Magnetometer (VSM). XRD was carried out using Panalytical X’Pert Pro equipped with x’Celerator solid-state detector and manufactured by Panalytical, Netherlands. The sample was firmly placed onto the glass slide, which was carefully laid down onto the sample holder. XRD was performed at the Sophisticated Analytical Instrumentation Facility (SAIF), Panjab University, Chandigarh, India. HR-TEM was performed using Jeol 2100 Plus, Japan, at CIL, Panjab University, Chandigarh, India. A drop of the solution of powdered sample dispersed in ethanol was then carefully placed onto the copper grid. The grid was eventually air-dried under room temperature and was used for imaging after half an hour. Vibrating Sample Magnetometer (VSM) data was obtained through the Microsense EZ instrument. All the samples were characterized at room temperature. HighScore Plus software was used for the XRD analysis of the samples.
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