The estimated surface free energy of the materials was analyzed with a Contact Angle Meter (DM-701, Kyowa Interface Science Co., Ltd., Tokyo, Japan) using three probe liquids (0.5–1 μL/drop)—de-ionized water, diiodomethane, and ethylene glycol at 21 °C, and relative humidity of 21%. The average contact angle values were then analyzed for surface free energy (mJ/m2), using vOGT [62 ].
Nanoscope 8 multimode afm
The Nanoscope VIII Multimode AFM is an atomic force microscope designed for high-resolution imaging and analysis of surfaces at the nanoscale. It provides a versatile platform for a wide range of applications in materials science, biology, and nanotechnology. The instrument utilizes a cantilever-based probe to measure the topography and properties of a sample, enabling users to study surface features with sub-nanometer resolution.
Lab products found in correlation
11 protocols using nanoscope 8 multimode afm
AFM Characterization of Surface Morphology
The estimated surface free energy of the materials was analyzed with a Contact Angle Meter (DM-701, Kyowa Interface Science Co., Ltd., Tokyo, Japan) using three probe liquids (0.5–1 μL/drop)—de-ionized water, diiodomethane, and ethylene glycol at 21 °C, and relative humidity of 21%. The average contact angle values were then analyzed for surface free energy (mJ/m2), using vOGT [62 ].
AFM Imaging of Fungal Conidia
Single-Molecule Force Probing of Protein Interactions
SMFS of FnBPA A Domain Interactions
AFM Imaging of Substrates in Liquid
a commercial AFM (Nanoscope VIII MultiMode AFM, Bruker Nano Inc.,
Nano Surfaces Division, Santa Barbara, CA) equipped with a 150 μm
× 150 μm × 5 μm scanner (J-scanner). The glass
substrates were fixed on a steel sample puck using a small piece of
adhesive tape. Images were recorded in PBS buffer at room temperature
(∼22 °C) using the peak force tapping mode.57 (link) For this purpose, a quartz fluid cell was used.
The mounted samples were immediately transferred into the AFM liquid
cell while avoiding dewetting. Oxide-sharpened microfabricated Si3N4 cantilevers were used (SNL-10, Bruker Nano Inc.,
Nano Surfaces Division, Santa Barbara, CA). The spring constants of
the cantilevers were measured using the thermal noise method, yielding
values around 0.2 N/m. The curvature radius of silicon nitride tips
was about 12 nm (manufacturer specifications). The deflection sensitivity
was calibrated by recording the response of the cantilever on a bare
glass substrate (cleaned as described above), considered as an infinitely
stiff surface. All topographic images shown in this article were flattened
using a third-order polynomial to correct surface tilt and eliminate
bow effects.
Atomic Force Microscopy Imaging Protocol
X-ray Photoelectron Spectroscopy of Peptide-Treated Titanium
Bacterial Surface Force Measurements
Atomic Force Microscopy Imaging of Biofilms
Atomic Force Microscopy Characterization of Surfaces
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