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Neoarm 200 f

Manufactured by JEOL
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The NEOARM 200 F is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging and elemental analysis of a wide range of samples. It features a stable electron optical system, advanced detector technologies, and user-friendly software for efficient and reliable operation.

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Lab products found in correlation

Jem 2100 plus, by JEOL (1 mentions) Tristar 2 3020, by Micromeritics (1 mentions) Xf416 cmos camera, by TVIPS (1 mentions) Dimension edge system, by Bruker (1 mentions) Helios nanolab g3 uc, by Thermo Fisher Scientific (1 mentions) Tecnai g2 spirit microscope, by Thermo Fisher Scientific (1 mentions)

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NEOARM (17 citations)

6 protocols using neoarm 200 f

1

Detailed Characterization of Crystalline Samples

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The crystalline structures of the prepared samples were analyzed by XRD (Bruker‐AXS Micro‐diffractometer D8 ADVANCE) equipped with a CuKα radiation source (λ=1.54 Å) with a scan rate of 3° min−1. The crystallinity was further examined by Raman spectroscopy (Renishaw, with a 532 nm excitation laser). The samples were focused with a ×50LWD objective lens and exposed to emission line for 10 s.
TEM, HRTEM and EDX were conducted by JEM‐2100 Plus (JEOL) electron microscope operating at 200 kV. The HAADF‐STEM was conducted on JEOL NEOARM 200 F with 200 kV of accelerating voltage.
Nitrogen adsorption‐desorption isotherms were measured on Micromeritics Tristar II 3020 instrument at −196 °C. The specific surface area was estimated by the Brunauer–Emmett–Teller (BET) method, and the pore size distribution was obtained from the Barrett–Joyner–Halenda (BJH) desorption isotherm. The CO2‐TPD profile was measured on Micromeritics Autochem II ASAP 2920.
XPS was conducted on a 1486.6 eV X‐ray photoelectron spectrometer (ESCALAB Xi‐type) using AlKα source.
Lu S., Zhang Y., Mady M.F., Egwu Eleri O., Mekonnen Tucho W., Mazur M., Li A., Lou F., Gu M, & Yu Z. (2022). Sulfur‐Decorated Ni−N−C Catalyst for Electrocatalytic CO2 Reduction with Near 100 % CO Selectivity. Chemsuschem, 15(19), e202200870.
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2

TEM Imaging of Beam-Sensitive Samples

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TEM imaging was performed using JEOL NEOARM 200 F with a Schottky-type field emission gun at an accelerating voltage of 200 kV. The microscope was equipped with TVIPS XF416 CMOS camera. The alignment was performed using standard gold nanoparticles film method. Because of the low beam stability of the sample, the dose of electrons was kept below a current density of 2 pA/cm2.
Roth W.J., Sasaki T., Wolski K., Song Y., Tang D.M., Ebina Y., Ma R., Grzybek J., Kałahurska K., Gil B., Mazur M., Zapotoczny S, & Cejka J. (2020). Liquid dispersions of zeolite monolayers with high catalytic activity prepared by soft-chemical exfoliation. Science Advances, 6(12), eaay8163.
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3

TEM Imaging of Gold Nanoparticles

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TEM imaging
was performed using JEOL NEOARM200F at accelerating voltage of 200
kV. The microscope was equipped with a Schottky-type FEG and TVIPS
XF416 CMOS camera. The alignment was performed by a standard method
using a carbon film covered with gold nanoparticles. The electron
dose was kept below a current density of 3 pA/cm2 because
of the low beam stability of the samples.
Roth W.J., Sasaki T., Wolski K., Ebina Y., Tang D.M., Michiue Y., Sakai N., Ma R., Cretu O., Kikkawa J., Kimoto K., Kalahurska K., Gil B., Mazur M., Zapotoczny S., Čejka J., Grzybek J, & Kowalczyk A. (2021). Exfoliated Ferrierite-Related Unilamellar Nanosheets in Solution and Their Use for Preparation of Mixed Zeolite Hierarchical Structures. Journal of the American Chemical Society, 143(29), 11052-11062.
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4

Comprehensive Characterization of Carbon Electrodes

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The morphology of the carbon‐based electrodes is assessed using a FEI Helios NanoLab G3 UC. The secondary electron (SE) images were taken at 5 keV electron energy with a specimen tilt of 30°. Transmission electron microscopy (TEM) and high‐resolution transmission electron microscopy (HRTEM) for graphene were carried out using a JEOL NEOARM 200F operating at 80 kV equipped with a cold field emission gun and 4k×4k Gatan OneView CCD‐camera. TEM and HRTEM for MWCNTs were performed with a JEOL 3010HT operating at an acceleration voltage of 300 kV that equipped with a LaB6 emitter and a 1k×1k Gatan multi scan CCD‐camera. Surface topography and roughness were characterized by atomic force microscopy (AFM) with a dimension edge system (Bruker). A silicon AFM probe was used in tapping (intermittent) mode within an active area of 5×5 and 10×10 μm2, respectively. The optical transmission of the counter electrodes was measured using a Varian‐Cary UV‐vis‐NIR spectrometer. Raman spectra of the carbon‐based electrodes were collected upon excitation at 785 nm (Raman‐HR‐TEC, StellarNet).
Wahyuono R.A., Jia G., Plentz J., Dellith A., Dellith J., Herrmann‐Westendorf F., Seyring M., Presselt M., Andrä G., Rettenmayr M, & Dietzek B. (2019). Self‐Assembled Graphene/MWCNT Bilayers as Platinum‐Free Counter Electrode in Dye‐Sensitized Solar Cells. Chemphyschem, 20(24), 3336-3345.
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5

Porous Platinum Film Growth Characterization

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The porous platinum film growth on the platinum-coated copper grids was examined using a TEM JEOL NEOARM 200F operating at 200 keV.
Stanca S.E., Vogt O., Zieger G., Ihring A., Dellith J., Undisz A., Rettenmayr M, & Schmidt H. (2021). Electrochemical growth mechanism of nanoporous platinum layers. Communications Chemistry, 4, 98.
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6

TEM and HRSTEM Analysis of Nanoparticles

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Transmission electron microscopy (TEM) measurements were done at the Tecnai G2 Spirit microscope from FEI operating at 120 kV, and high-resolution scanning TEM (HRSTEM) measurements were carried out on JEOL NEOARM 200 F operating at 200 kV equipped with Schottky-FEG cathode and CS corrector, respectively. In both techniques, the toluene dispersion of NPs was dropped at the Cu grid with 400 mesh coated by carbon foil. The TEM micrographs were taken in bright-field mode, and the size distribution was made by manually measuring at least 200 particle sizes from different TEM micrographs in ImageJ software.67 (link) Acquisition of HRSTEM micrographs was made in annular bright (ABF) and dark-field (ADF) mode.
Gerina M., Sanna Angotzi M., Mameli V., Gajdošová V., Rainer D.N., Dopita M., Steinke N.J., Aurélio D., Vejpravová J, & Zákutná D. (2023). Size dependence of the surface spin disorder and surface anisotropy constant in ferrite nanoparticles. Nanoscale Advances, 5(17), 4563-4570.
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