S 4800 scanning electron microscope
The S-4800 is a scanning electron microscope (SEM) manufactured by JEOL. It is capable of high-resolution imaging and analysis of surface structures and compositions of a wide range of materials. The S-4800 SEM utilizes a field emission electron source to provide high-quality images with minimal distortion.
Lab products found in correlation
9 protocols using s 4800 scanning electron microscope
Characterization of Nanostructured Materials
Comprehensive Nanoparticle Characterization Methods
Comprehensive Characterization of Nanomaterials
Characterization of Crystalline Structures
Characterization of Aerogel Morphology
Ultrasound-Assisted Synthesis of Rare-Earth Nanomaterials
Ultrasound synthesis was assisted by an ultrasonic homogenizer (220 V, 950 W) (Ningbo Scientz Biotechnology Co., Ltd.). Powder X-ray diffraction (XRD) analyses were performed on a Bruker D8 Advance diffractometer with Cu Kα radiation, and scanning electron microscopy (SEM) observations were performed with a Hitachi S-4800 scanning electron microscope, and the morphology and sizes of as-prepared materials were analyzed with JEOL 2100 high resolution transmission electron microscope (HRTEM) (JEOL, Japan). An EMGA-920 Oxygen Elemental Analyzer (HORIBA, Japan) was used to determine the oxygen content. The chemical composition of the products was examined with X-ray photoelectron spectrometer (XPS, ESCALAB 250Xi, ThermoFisher). UV-Visible absorption spectra were recorded on a UV-A390 spectrometer (AOE Instruments, Shanghai, China) with 1.0 cm path length.
Photoelectrochemical Characterization of Modified ITO
Comprehensive Structural Characterization of Products
Characterization of Zr-Phy-DES Material
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