Afm5500m
The AFM5500M is a high-performance atomic force microscope (AFM) developed by Hitachi. It is designed to provide accurate and reliable surface characterization at the nanoscale level. The AFM5500M utilizes a precise piezoelectric scanner and sophisticated control electronics to enable the measurement of topography, adhesion, stiffness, and other surface properties with high resolution and sensitivity.
Lab products found in correlation
3 protocols using afm5500m
Characterization of Material Morphology
Comprehensive Characterization of NG Gel
Characterization of Fluorescent Carbon Dots
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