The morphology of demineralized and remineralized tooth surfaces was examined by scanning electron microscope (JSM-5510, JEOL, Tokyo, Japan) operating at 10 kV. Prior to the study, the samples were coated under an inert argon atmosphere for 30 s with gold using a sputter-coater (JSC 1200, JEOL, Japan).
Jsc 1200
Manufactured by JEOL
Sourced in Japan
The JSC 1200 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a high-brightness electron gun and advanced electron optics to achieve nanometer-scale resolution. The JSC 1200 can be used for various applications, including materials science, nanotechnology, and life sciences research.
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Lab products found in correlation
4 protocols using jsc 1200
1
Morphology of Demineralized and Remineralized Tooth Surfaces
2
Scanning Electron Microscopy of Fractured Polymer Surfaces
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The morphology of fractured surface of dry IPN and SN samples was examined using a scanning electron microscope (JSM-5510, JEOL, Tokyo, Japan) operating at 10 kV. Prior to the observations, the samples surface was coated with gold for 30 s using a sputter-coater (JSC 1200, JEOL, Japan) under argon atmosphere.
3
Scanning Electron Microscopy of IPN Fractures
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The morphology of fractured surfaces of IPNs with various compositions was examined by scanning electron microscope JSM-5510, JEOL, Tokyo, Japan, operating at 10 kV. The samples were prepared for imaging by coating them with gold for 30 s using a sputter-coater JSC 1200, JEOL, Japan, under argon atmosphere.
4
Characterizing Gatekeeper-Modified Nanoparticles
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The size and structure of the gatekeeper-modified nanoparticles were characterized using transmission electron microscopy (JEOL JEM 2100 h STEM (200 kV; point resolution = 0.23 nm)). Samples were prepared by placing a water suspension of the nanoparticles on a polymer microgrid supported on a Cu grid. The water was further evaporated under a vacuum. The surface morphology was additionally examined on a scanning electron microscope (JSM 5510, JEOL, Tokyo, Japan) operating at 10 kV. Before imaging, the samples were coated with gold for 30 s using a sputter-coater (JSC 1200, JEOL, Tokyo, Japan) in an inert argon atmosphere.
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