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Supra gemini

Manufactured by Zeiss
Sourced in Germany

The Supra Gemini is a scanning electron microscope (SEM) produced by Zeiss. It is designed to provide high-resolution imaging and analysis of various samples. The Supra Gemini utilizes a field emission electron source to generate a focused electron beam, which is then scanned across the surface of the sample to create an image.

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2 protocols using supra gemini

1

Visualizing Bifidobacterium Adhesion to IgG-Treated Cells

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Scanning electron microscopy (SEM) was employed to visualise the attachment of Bifidobacterium cells to IgG treated HT-29 cells versus untreated HT-29 cells. For adhesion assays, HT-29 cells (approximately 1 × 105 cells/mL) were seeded in 12-well tissue culture plates (Merck) on microscopy cover glasses in McCoy’s 5A modified medium (Merck) and incubated at 37 °C in a humidified atmosphere of 5% CO2, until reaching 90 to 100% confluency. HT-29 cells were exposed to 16 mg/mL colostral IgG as described previously. Non-supplemented McCoy’s 5A medium was used as a non-treated control (NT). The adhesion assay was performed as previously described above. After 2 h of incubation with B. longum 8809, the cells were then observed by Scanning Electron Microscopy (SEM) using the method of Khokhlov et al. (2012 ). The HT-29 monolayer was washed three times with 1 mL PBS and fixed with 4% (w/v) glutaraldehyde (Merck), in 0.1 M phosphate (PB) buffer, (pH 6.8–7.4) for 1 h at room temperature. After washing three times with PBS, the HT-29 monolayer was dehydrated in a graded ethanol series (25% v/v, 50% v/v, 75% v/v, 95% v/v and 100% v/v). The cells were air dried and sputter coated with chromium gold (Emitech K550X, Ashford, UK). The microscope cover glasses were then examined with a Field Emission Scanning Electron Microscope at 7 kV (FE-SEM; Zeiss Supra Gemini, Darmstadt, Germany).
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2

Scanning Electron Microscopy of Powder Samples

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Powders were stored at 0% and 54.4% RH before scanning electron microscopy observation. Samples were imaged using a field emission scanning electron microscope (FE-SEM; Zeiss Supra Gemini, Darmstadt, Germany) at 2.00 kV. Samples were mounted on double-sided carbon tape, attached to scanning electron microscope stubs, and then sputter-coated with chromium (K550X, Emitech, Ashford, UK). Representative micrographs were taken at 1,000× and 5,000× magnification to visualize surface morphology.
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