Invia reflex micro raman spectrometer

All the nanostructures’ characterization was performed with the synthesis product in powder form. In order to study the morphology and elemental composition of the nanostructures, scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) inside an AURIGA CrossBeam workstation were performed (Zeiss, Oberkochen, Germany). The structural characterization was carried out by X-Ray diffraction (XRD) using X’Pert PRO MRD diffractometer (PANalytical, Royston, UK) with Cu Kα radiation and the data acquisition range was 10–90° (2θ) with a step size of 0.033°. Fourier-transform infrared (FTIR) spectra were acquired in the range of 4000–525 cm⁻¹ with 4 cm⁻¹ resolution and 45° incident angle. The data was recorded using a Smart iTR attenuated total reflectance (ATR) sampling accessory (Thermo Scientific, Waltham, MA, USA) equipped with a single bounce diamond crystal on a Thermo Nicolet 6700 Spectrometer (Thermo Scientific, Waltham, MA, USA). Raman spectra were acquired using an inVia Reflex micro-Raman spectrometer (Renishaw, Wotton-under-Edge, UK) equipped with an air-cooled CCD detector and a HeNe laser using a 532 nm laser excitation with a power of 50 mW, with 0.3 cm⁻¹ resolution. All measurements were obtained with an intensity of 50 µW at room temperature in a range of 100–1600 nm, using an integration time of 2 scans (10 s each).