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Tm4000plus 2 sem

Manufactured by Hitachi
Sourced in Japan

The TM4000Plus II SEM is a scanning electron microscope (SEM) manufactured by Hitachi. It is designed to provide high-quality imaging and analysis of a wide range of samples. The SEM utilizes an electron beam to scan the surface of a sample, generating detailed information about its topography and composition.

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2 protocols using tm4000plus 2 sem

1

SEM Preparation of Leaf Blade Samples

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For SEM, mature blades were cut into small (~2 × 2 mm2) pieces, immediately fixed for 1 h in 4% (w/v) paraformaldehyde in PBS and then washed thrice (3 × 15 min) with the same buffer. For better imaging, fixed specimens were gently brushed and rinsed with distilled water to remove excess epiphytes, then wiped carefully with filter paper. Cleared samples were frozen in liquid nitrogen and directly observed under a Hitachi TM4000Plus II SEM (Hitachi, Tokyo, Japan) at 10 kV. Micrographs were acquired with the TM4000 software.
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2

Skin Microstructure Analysis by SEM

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Samples where fixed and dehydrated for analysis through SEM. Fresh skin samples where immersed in 10% v/v formalin overnight and subsequently gradually dehydrated using a series of ethanol solutions as follows: 30% ethanol 2 h, 50% ethanol 2 h, 70% ethanol 2 h, 100% ethanol overnight (all % v/v). Before imaging, samples where removed from the solution, air dried, fixed on an aluminum sample holder stubs using double sided adhesive carbon tape and finally the remaining solvent was removed in vacuum for 10 min. Images were acquired using a Hitachi TM4000Plus II SEM using a 15 keV acceleration voltage in secondary electron mode (SE) at a 6 mm working distance.
Rat, mouse and human abdominal skins were studied with SEM. One group was sensitized by adhesive tape strippings (10 or 20 times); the other group was native without mechanical sensitization (no tape strippings).
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