Rotaflex ru 200

The diffraction patterns of the polymer films were obtained on a Rigaku Rotaflex RU-200 X-ray diffractometer (Rigaku Co., Ltd., Tokyo, Japan) with a rotating copper anode (characteristic radiation wavelength 0.1542 nm). Flat films were fixed in 6 layers on an aluminum frame. The exposure was carried out in the “transmission” geometry in the angular range of 2.5–50 degrees in 2θ according to the Bragg–Brentano scheme. Then the resulting diffraction patterns were processed using the Fityk program; after subtracting the background line, they were presented as a sum of several Gaussian peaks. The angular position of these peaks was recalculated into the interplanar distances using the Bragg equation. The peak areas were used to calculate the specific intensities of the maxima (from the ratio of the total intensity of all observed peaks), and the sizes of their characteristic coherent scattering regions (CSRs) were estimated from their integral widths using the Scherrer equation.

The diffraction patterns of the polymer samples were obtained using a Rigaku Rotaflex RU-200 X-ray diffractometer (Rigaku Co., Ltd., Tokyo, Japan) with a rotating copper anode (characteristic radiation wavelength 0.1542 nm). The flat films were fixed in 6 layers on an aluminum frame, and the shooting was carried out in the “transmission” geometry in the angular range of 2.5–50 degrees in 2θ according to the Bragg–Brentano scheme. Next, the resulting diffraction patterns were processed using the Fityk program; after subtracting the background line, they were presented as a sum of several Gauss peaks. The positions of these peaks were recalculated into the interplanar spacing using the Wulf–Bragg formula.

The X-ray diffraction spectra were obtained using a Rigaku Rotaflex RU-200 (Tokyo, Japan) with a rotating copper anode (Cu Kα, emission; Ni, filter) at apparatus operating conditions 30 kV–100 mA. X-ray photography was performed using a horizontal wide-angle goniometer, the Rigaku D/MAX-RC (Tokyo, Japan), using the Bragg–Brentano scheme in θ–2θ geometry. Scanning was carried out at a 5–55° angle range at 2θ, with a speed of 2°/min and 0.04° increment. A scintillation counter was used as a detector of the diffracted X-ray emission. Measurements were taken at 20 °C and at −190 °C. A specialized low-temperature attachment was used to obtain a diffraction pattern of the specimen, cooled down to liquid nitrogen temperature (−196 °C). Membrane specimens with a thickness of 500 μm were mounted to a vertical copper table. The diffraction patterns that were obtained were processed using the Fityk program (by Marcin Wojdyr, Poland): background noise was subtracted, and diffraction patterns were approximated using the deconvolution technique by the sum of several Gaussian peaks [46 (link)].