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Avatar ft ir spectrometer

Manufactured by Thermo Fisher Scientific
Sourced in United States

The AVATAR FT‐IR spectrometer is a Fourier Transform Infrared (FT-IR) spectrometer designed for analytical laboratory applications. It uses infrared light to analyze the molecular composition of samples. The spectrometer collects and measures the absorption of infrared light by different molecules in the sample, providing information about the sample's chemical structure and identity.

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4 protocols using avatar ft ir spectrometer

1

Characterization of Nanofiber Materials

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Fourier Transform Infrared (FTIR) spectrophotometry was recorded on a Thermo AVATAR FT-IR spectrometer (Chicago, IL, USA). The crystalline structure of the samples was analyzed using X-ray diffraction (XRD, PHILIPS, PW1730, The Netherlands). The average size distribution and the surface charge of samples were obtained using Dynamic Light Scattering (DLS) and zeta potential measurements. Scanning Electron Microscopy (SEM) was also used to characterize the prepared samples’ morphology and diameter. The diameter of nanofibers was calculated using image analysis software (Digmizer, version 4.6.1, MedCalc software). The mechanical properties were studied using the testing machine (STM-20). Water contact angle measurements were carried out using the contact angle analyzer (OCA 15 plus, Dataphysics, Germany). To perform this test, a water droplet volume of 4 µL was used. Brookfield E230 was used for measuring viscosity.
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2

Comprehensive Characterization of CS-MMT-NCQDS-DOX

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X‐ray diffraction (XRD) pattern was obtained from the samples by X‐ray diffraction (XRD, PHILIPS, PW1730, Netherlands) using Cu/Kα (1.54056 Å,40 kv,30 Ma) in the 2θ range from 5˚ to 80˚ (0.05 deg step size and 1 s per step). The data were collected using HighScore Plus version3. To determine interactions between components in the samples of CS‐MMT, CS‐MMT‐NCQDs, CS‐MMT‐NCQDs‐DOX, Fourier transform infrared (FTIR) spectrophotometry were recorded from the samples on a Thermo AVATAR FT‐IR spectrometer (Chicago, Illinois, US) at room temperature. The scanning range of the spectrum was between 600 and 4000 cm−1. Employing MALVERN ZEN3600 (Malvern, UK), dynamic light scattering (DLS) and zeta potential measurements were respectively done for determining the average size distribution and the surface charge of nanoemulsions. Field‐emission scanning electron microscopy (FESEM, TESCAN MIRA III, Brno, Czechia) was also used to characterize the CS‐MMT‐NCQDs‐DOX morphology. The sonication of solutions was carried out before conducting experiments.
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3

Comprehensive Structural Characterization of Nanomaterials

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The structure of some prepared samples was studied using the powder X-ray diffraction (XRD) by a Philips PW 1730 (Netherlands) diffractometer with Cu Kα (λ = 1.54056 Å) radiation. The diffraction angle (2θ) range in this analysis was 10°–90°. Fourier-transform infrared spectroscopy (FT-IR) of some samples was carried out on a Thermo AVATAR FTIR spectrometer (USA) in the wavenumber range of 400–4000 cm-1. The structural morphology and the elemental composition of nanostructures were assessed by the FESEM MIRA III instrument (TESCAN, Czech Republic) with the techniques of field emission scanning electron microscopy (FE-SEM) and energy-dispersive X-ray (EDX) spectroscopy, respectively. The specific surface area and the porosity of most active photocatalyst was compared with similar ternary nanocomposite by N2 adsorption at 77 °K on a BEL PREP VAC II high precision surface area and pore size analyzer (BELSORP-MINI II model, BEL, Japan) and estimated using the Brunauer–Emmett–Teller (BET), and the Barrett–Joyner–Halenda (BJH) methods, respectively.
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4

Characterization of Nanocatalyst Materials

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The solvents and starting materials were purchased from Merck (Germany) and Sigma‐Aldrich (USA). Fourier Transform Infrared (FT‐IR) spectra of the prepared samples were recorded on a Thermo AVATAR FT‐IR spectrometer in the wavenumber range of 400–4000 cm−1 using spectroscopic‐grade and pure KBr. Powder X‐ray diffraction (XRD) patterns were recorded at room temperature with a Philips X‐Pert 1710 diffractometer using Co Kα radiation (λ=1.78897 Å) at a voltage of 40 kV and current of 40 mA to study the crystalline structure of the nanocatalyst, data were recorded from 10° to 80° (2θ) with the scan speed of 0.05° s−1. The morphology of nanoparticles was studied using Scanning Electron Microscopy (SEM; TESCAN MIRA II) equipped with Energy‐Dispersive X‐ray (EDX) spectroscopy. Transmission Electron Microscopy (TEM) images were obtained using a CM120 apparatus with an accelerating voltage of 100 kV.
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