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Multimode nanoscope 5

Manufactured by Veeco
Sourced in United States

The Multimode-Nanoscope V is a versatile atomic force microscope (AFM) system designed for high-resolution imaging and analysis of a wide range of samples. It features a stable and precise scanning system, advanced control electronics, and a comprehensive suite of imaging and analysis modes.

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7 protocols using multimode nanoscope 5

1

Tapping Mode AFM Analysis of PANI Films

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The topography of the deposited PANI film was analyzed using a Nanoscope V MultiMode atomic force microscope (Veeco, San Jose, CA, USA). Scans were conducted at a frequency of 0.999 Hz using a Si tip in tapping mode. The surface roughness and structure were evaluated in a 5 μm × 5 μm area of the sample using the instrumental software (6.13).
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2

Atomic Force Microscopy of Biomolecules

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For the atomic force microscopy (AFM) measurements, samples were diluted with deionized H2O to yield a final concentration of 1 μM. Then the sample (20 μL) was applied onto freshly cleaved muscovite mica and allowed to dry. Data were acquired in the tapping mode on a Nanoscope V multimode atomic force microscope (Veeco Instruments, USA).
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3

Atomic Force Microscopy of E. coli Protein-AgNP Interactions

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Whole protein was extracted from E. coli BW25113 using the method mentioned above and filtered with a 100-kDa ultrafilter to remove cell debris. The collected proteins (1 mg/ml) were treated with 1 μg/ml AgNPs at 37°C for 10, 20, and 30 min. After the reaction, the protein solutions were redissolved in double-distilled water (ddH2O) to reach a final concentration of 10 μg/ml, and 5 μl of each sample was deposited onto a newly caved mica surface at room temperature. Images were acquired with an atomic force microscope (MultiMode NanoScope-V; Veeco Instruments, Plainview, NY, USA). The scan rate was 1 Hz, the feedback value was 5.289, and ScanAsyst Auto Control was used. NanoScope Analysis software was used for data processing.
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4

Atomic Force Microscopy of Diluted Samples

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Samples were diluted 1:1,000 with ultrapure water (Milli-Q®, MA, United States) and dropped onto freshly cleaved mica plates, with the addition of 10 µl of 10 mM CaCl2 solution. After 15 min, plates were washed with ultrapure water, and the excess was removed with filter paper (Whatman, Germany). Images were obtained at room temperature by a Multimode-Nanoscope V (Veeco, Santa Barbara, CA, United States) from the Nanoscopy Laboratory from the Theoretical and Applied Physical Chemistry Research Institute (INIFTA, CONICET, La Plata, Argentina). The microscope was operated in tapping mode, with an etched silicon probe model RTesp-Bruker (cantilever resonance frequency: 300 kHz; force constant 42 N/m; tip radius 8–12 nm). Typical scan rates were carried out at 1 Hz.
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5

Protein-SDS and Protein-Heparin Interactions

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Wt and Arg173Pro (0.2 mg/mL) proteins were incubated with 0.2 mM SDS (either at pH 7.4 or 5.0) for 48 h at 37°C. Complex formation was detected by the binding to ThT as described above. Protein binding of heparin was tested following incubation of 0.2 mg/mL proteins with heparin at a 2:1 heparin/protein molar ratio for 48 h at 37°C. In order to confirm whether binding to heparin results in the formation of high molecular weight complexes, the incubation mixtures were analyzed by PAGGE. In a separate experiment, the Arg173Pro variant was incubated at 0.5 mg/mL and pH 7.4 for 24 h at 37°C in the absence or in the presence of heparin, and morphology was compared by atomic force microscopy (AFM) as described previously [13 (link)]. All images were obtained at room temperature using a Multimode-Nanoscope V (Veeco, Santa Barbara, CA) operating in tapping mode with an etched silicon Probe model Arrow-NCR-50 Nano World (cantilever resonance frequency: 258 kHz, Force constant 42 N/m; tip radius 5–10 nm). Typical scan rates were 1–1.5 Hz.
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6

Characterization of Functionalized Graphene

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Atomic force microscope (AFM) images of rGO-PVP and rGO-PVP-RGD were taken on a MultiMode Nanoscope V scanning probe microscopy (SPM) system (Veeco, USA). Commercially available AFM cantilever tips with a force constant of ~48 N m−1 and resonance vibration frequency of 330 kHz were used. The scanning rate was set at 0.7 to 1 Hz. Transmission electron microscopy (TEM) images were acquired using a JEM-2010 (JEOL Ltd., Japan) operated at an accelerating voltage of 200 kV. UV-Vis spectra were measured at 20 °C using a UV-2550 UV-Visible spectrophotometer (Shimadzu, Japan) equipped with a 10-mm quartz cell, where the light path length was 1 cm. Fluorescence spectra were recorded on a FL-4600 spectrofluorimeter (Hitachi, Japan). The Fourier transform infrared (FTIR) spectra were recorded on a Bruker EQUINOX 55 FTIR Spectrometer.
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7

Atomic Force Microscopy Analysis

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AFM measurements were performed on MultiMode Nanoscope V (Veeco, Plainview, NY, USA) operating in tapping mode. Noncontact polysilicon cantilevers with high aspect ratio were used (TipsNano, Estonia, resonant frequency—120 kHz, Q-factor—350). Image processing was performed using Gwyddion (Chechen) software (Version 2.62).
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