The structure and morphology of Co3O4/N-HPGC were investigated using a JEM-2100 transmission electron microscope (TEM, JEOL, Japan). The elemental analysis of samples was determined by X-ray photoelectron spectra (XPS) on a VG Escalab 250 spectrometer (Thermo Scientific, USA). The X-ray diffraction (XRD) patterns were obtained by a D8 Advance X-ray diffractometer (Bruker, Germany) equipped with a Cu Kα radiation source (λ = 0.15418 nm) at a scanning rate of 5° min−1. N2 adsorption–desorption isotherms were measured using a Quantachrome Autosorb-iQ-MP (USA) analyzer at −196 °C with a relative pressure ranging from 0.0112 to 0.9948. The specific surface area was calculated by the Brunauer–Emmett–Teller (BET) model.
Vg escalab 250 spectrometer
Manufactured by Thermo Fisher Scientific
Sourced in United States
The VG ESCALAB 250 spectrometer is a versatile surface analysis instrument designed to provide high-performance X-ray photoelectron spectroscopy (XPS) capabilities. It is capable of analyzing the chemical composition and electronic structure of solid surfaces and thin films.
Automatically generated - may contain errors
Lab products found in correlation
D8 advance x ray diffractometer, by Bruker (1 mentions)
Jem 2100 transmission electron microscope, by JEOL (1 mentions)
Uv 3100, by Shimadzu (1 mentions)
Uv 3150, by Shimadzu (1 mentions)
Uv 3600, by Shimadzu (1 mentions)
Esca 3400, by Shimadzu (1 mentions)
Jem arm200f, by JEOL (1 mentions)
D max 2550 diffractometer, by Rigaku (1 mentions)
2010 microscope, by JEOL (1 mentions)
Pyris 1 tga analyzer, by PerkinElmer (1 mentions)
Rf 5301pc spectrofluorophotometer, by Shimadzu (1 mentions)
4 protocols using vg escalab 250 spectrometer
1
Structural and Compositional Analysis of Co3O4/N-HPGC
2
Characterization of Nanomaterial Samples
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The UV-vis absorption spectra were obtained by Shimadzu UV-3100, UV-3150 and UV-3600 spectrometers. STEM measurements were carried out by a JEOL JEM-ARM200F equipped with an EDS analyzer (acceleration voltage: 80 kV). XPS was recorded by a Shimadzu ESCA-3400 with Mg Kα (12 kV, 30 mA) using as an X-ray source. The binding energy was standardized using the Pt 4 f peak at 71.0 eV for Au-containing clusters and Au 4 f peak at 84.0 eV for other samples. XPS measurements for position dependence were carried out with VG ESCALAB 250 spectrometer (Thermo Fisher Scientific K.K.), using monochromatized Al Kα X-ray radiation (1486.6 eV). The system was operated at 15 kV and 200 W. The base pressure of the analysis chamber was less than 10−8 Pa. The pass energy was 50.0 eV (wide scan) and 20 eV (individual narrow scan). These characterization were carried our using transfer vessel to avoid moisture/air exposure of the samples. Standardization was achieved using the C 1 s transition (284.8 eV). Background removal was carried out with the Thermo Electron Advantage analysis software package.
3
Comprehensive Characterization of Nanomaterials
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Photoluminescence spectra were recorded on a Shimadzu RF-5301PC spectrofluorophotometer. Transmission electron microscopy (TEM) observations were performed on a JEOL-2010 microscope operating at 100 kV. Zeta-potential measurements were obtained with a Brookhaven 90Plus Zeta laser light scattering system. Element analysis mapping image was recorded on a FEI TECNAI G2 transmission electron microscope operating at 200 kV. X-ray diffraction (XRD) patterns were collected on a Rigaku D/MAX2550 diffractometer. X-ray photoelectron spectroscopy (XPS) measurements were carried out on a Thermo VG ESCALAB 250 spectrometer. Thermogravimetric analyses (TGA) were taken on a Perkin Elmer Pyris 1 TGA analyzer under N2 atmosphere.
4
X-ray Photoelectron Spectroscopy Analysis
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XPS analysis was performed using a VG ESCALAB 250 spectrometer (ThermoFisher Scientific, Waltham, MA, USA) calibrated against the reference binding energies (BE) of clean Cu (932.6 eV), Ag (368.2 eV), and Au (84 eV) samples. Survey spectra and high-resolution spectra of the C 1s, B 1s, N 1s, O 1s, and Pd 3d core-level regions were collected at a take-off angle of 90° and a pass energy of 100 and 20 eV, respectively, using an Al Kα monochromated X-ray source (hν = 1486.6 eV). Data processing was performed using the CasaXPS analysis software using a Shirley-type background, component peaks defined by BE, Full Width at Half Maximum (FWHM) and Gaussian/Lorentzian envelopes. BEs of the component peaks were corrected with reference to the C 1s peak for –CH2—CH2– bonds set at 285.0 eV.
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