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Genesis edx system

Manufactured by Thermo Fisher Scientific

The Genesis EDX System is a compact and versatile energy-dispersive X-ray (EDX) spectrometer designed for elemental analysis. It provides rapid and accurate identification and quantification of elements present in a wide range of samples. The system utilizes advanced silicon drift detector technology to deliver high-resolution X-ray spectroscopy capabilities.

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5 protocols using genesis edx system

1

Characterization of Nanomaterials by SEM and EDX

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Scanning electron microscopic (SEM) imaging was performed using a Hitachi SU-8000 electron microscope (Hitachi High-Technologies Europe GmbH, Krefeld, Germany). Reflection electron microscope (REM) was performed in a Philips XL30 microscope (Philips, Eindhoven, The Netherlands) at 15 KeV and 21 µA. The samples were coated with 20–25 Å gold in an argon atmosphere.
For energy-dispersive X-ray (EDX) spectroscopy an EDAX Genesis EDX System attached to the scanning electron microscope (Nova 600 Nanolab, FEI, Eindhoven, The Netherlands) was used, using the operation mode 10 kV and a collection time of 30–45 s.
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2

Scanning Electron Microscope EDX Analysis

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The energy-dispersive X-ray spectroscopy (EDX) analyses were performed with an EDAX Genesis EDX System included to a scanning electron microscope (Nova 600 Nanolab, FEI, Eindhoven; The Netherlands).
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3

SEM Visualization and Surface Roughness Analysis

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After sputter coating (Leica EM ACE200, Wetzlar, Germany) with gold in an argon atmosphere scanning electron microscopic (SEM) visualization was performed either with a Philips XL30 ESEM-FEG (environmental scanning electron microscope]/EDAX [energy dispersive X-ray spectroscopy] system (Philips, Eindhoven, The Netherlands) or a HITACHI SU 8000 electron microscope (Hitachi High-Technologies Europe GmbH, Krefeld, Germany). For EDX spectroscopy an EDAX Genesis EDX System attached to the scanning electron microscope (Nova 600 Nanolab; FEI, Eindhoven, The Netherlands) operating at 10 kV with a collection time of 30–45 s was used.
The light microscopic images were taken with a VHX-600 Digital Microscope from KEYENCE (Neu-Isenburg, Germany). The surface roughness of the tooth samples was measured with the software provided by the manufacturer.
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4

Energy Dispersive X-ray Spectroscopy

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Energy dispersive X-ray (EDX) spectroscopy was performed with an EDAX Genesis EDX System attached to a scanning electron microscope (Nova 600 Nanolab; FEI, Eindhoven, The Netherlands) operating at 10 kV with a collection time of 30–45 s. Areas of approximately 10 µm2 were analyzed by EDX.
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5

Physicochemical Characterization of Microparticles

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X-ray diffraction (XRD) of the dried microparticle powder was performed with a Philips PW1820 diffractometer equipped with a monochromatic Cu-Kα radiation (λ = 1.5418 Å, 40 kV, 30 mA, 5 s, Δθ = 0.02), as described [27 ].
Energy dispersive X-ray (EDX) analysis was carried out with an EDAX Genesis EDX System attached to a scanning electron microscope (Nova 600 Nanolab; FEI, Eindhoven, The Netherlands) operating at 10 kV with a collection time of 30–45 s.
Fourier-transform infrared (FTIR) spectroscopy was conducted in an ATR-FTIR spectroscope/Varian 660-IR spectrometer (Agilent, Santa Clara; CA), equipped with a Golden Gate ATR unit (Specac, Orpington; UK). Each spectrum represents the average of 100 scans with a spectral resolution of 4 cm-1 (typically 550–1800 cm-1). A baseline correction, smoothing, and analysis of the spectra were achieved with the Varian 660-IR software package 5.2.0 (Agilent). The graphical display and annotation of the spectra were achieved with Origin Pro (version 8.5.1; OriginLab, Northampton; MA). The spectral peaks were assigned according to published data [14 ,28 (link)–31 (link)].
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