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Raman system model 1000 spectrometer

Manufactured by Renishaw
Sourced in United Kingdom

The Raman system model 1000 spectrometer is a laboratory instrument designed for Raman spectroscopy. It is a compact and versatile system that can be used to analyze the molecular composition of materials. The spectrometer uses a laser to excite the sample, and the resulting Raman scattering is detected and analyzed to provide information about the sample's chemical structure and composition.

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2 protocols using raman system model 1000 spectrometer

1

Characterizing Nanomaterial Composition and Structure

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The powder X-ray diffraction (XRD) patterns were recorded on a Rigaku D/Max 2550× -ray diffractometer with Cu Kα radiation (λ = 1.5418 Å). The X-ray photoelectron spectroscopy (XPS) was performed on an ESCALAB 250× -ray photoelectron spectrometer with a monochromatic X-ray source (Al Kα hυ = 1486.6 eV). The Raman spectra were obtained with a Renishaw Raman system model 1000 spectrometer with a 20 mW air-cooled argon ion laser (514.5 nm) as the exciting source. The transmission electron microscope (TEM) images were obtained with a Philips-FEI Tecnai G2S-Twin microscope equipped with a field emission gun operating at 200 kV. The scanning electron microscope (SEM) images were obtained with a JEOL JSM 6700 F electron microscope. Inductively coupled plasma atomic emission spectroscopy (ICP-OES) was performed on a Perkin-Elmer Optima 3300DV ICP spectrometer.
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2

Comprehensive Materials Characterization Protocol

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Scanning electron microscopy (SEM) was carried out on a JEOL JSM 6700 F electron microscope (Japan). The nitrogen absorption and desorption investigation were obtained on a Micromeritics model. The powder X-ray diffraction (XRD) patterns were obtained by a Rigaku D/Max 2550 X-ray diffractometer (Japan) using Cu Kα radiation (λ = 1.5418 Å). X-ray photoelectron spectroscopy (XPS) were carried out on an ESCALAB 250 X-ray photoelectron spectrometer with a monochromatic X-ray source (Al Kα hμ = 1486.6 eV) (USA). Raman was carried out on a Renishaw Raman system model 1000 spectrometer (UK) by using a 532 nm excitation source. Transmission electron microscopy (TEM), high-resolution TEM (HRTEM) images, and energy-dispersive X-ray spectroscopy (EDS) spectra were obtained by a Philips-FEI Tecnai G2S-Twin equipped with a field emission gun operating at 200 kV (Netherlands). UV-Vis diffuse reflectance analyzes were performed on a PerkinElmer Lambda 20 UV-vis spectrometer (USA). Work functions of the as-obtained materials were obtained on a scanning Kelvin probe system (KP Technology Ltd) in the air (UK). O2 temperature-programmed desorption (O2-TPD) analyzes were performed on a Micromeritics AutoChem 2920 II system (USA). ASAP 2020 M system (USA).
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