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Model 3980

Manufactured by Spectra-Physics

The Spectra-Physics Model 3980 is a precision laboratory instrument designed for scientific research applications. It functions as a wavelength-stabilized helium-neon laser, providing a stable and coherent light source. The device operates at a wavelength of 632.8 nanometers and delivers an output power of up to 5 milliwatts. It is equipped with features to ensure consistent performance and reliability in a laboratory setting.

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6 protocols using model 3980

1

Fluorescence Lifetime Measurements by Streak Camera

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The fluorescence lifetimes
were obtained by streak-camera measurements. A frequency doubled Ti-Saphire
Laser (Tsunami, Newport Spectra-Physics GmbH) was used as the light
source to generate the 390 nm excitation pulses. The pulse-to-pulse
repetition rate of the laser was reduced to 4 kHz by a pulse selector
(Model 3980, Newport Spectra-Physics GmbH). The emission was recorded
using a CHROMEX 250IS spectrograph and a Hamamatsu HPD-TA streak-camera.
The power of the pump-pulse used was in the range of 0.2 mW, and the
OD of the sample at the excitation wavelength was in the range of
0.05 to 0.1.
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2

Emission Lifetime Measurements of Ruthenium Complexes

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The setup for emission lifetime measurements of ruthenium complexes both in solution and grafted onto NiO film has been described previously.53 (link) A Hamamatsu HPDTA streak camera in concert with a Ti:sapphire laser (Tsunami, Newport Spectra-Physics GmbH) was used. To record emission, the repetition rate of the laser was reduced to 400 kHz using a pulse selector (Model 3980, Newport Spectra-Physics GmbH) and the fundamental output of the oscillator was frequency doubled to yield 390 nm pump pulses. For dye-sensitized NiO films, the sample was placed in aca. 60° angle with respect to the excitation beam and emission light is collected from the front side of the sample in a 90° geometry. The emission spectra of ruthenium complexes both in solution and grafted onto NiO films were recorded at wavelengths between 580 and 720 nm.
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3

Single Particle Photoluminescence Measurements

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Single particle PL measurements were performed
on a home-built microscope setup. The excitation wavelength (400 nm)
was generated by frequency doubling a 800 nm laser (MaiTai, 80 MHz,
100 fs). The repetition rate was reduced to 1 MHz by a pulse selector
(Spectra Physics, Model 3980). The excitation was focused onto the
NPLs using a microscope objective (50×, NA = 0.80), and the PL
from the NPLs was collected from the same objective. The pump fluence
was around 20 μJ/cm2. The PL was recorded with an
EMCCD (Prom EM HS, Princeton) camera attached to a spectrometer (Acton
SP2300, Princeton). The sample was prepared by drop casting a dilute
CBC solution onto precleaned glass cover slides.
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4

Time-Resolved Fluorescence Spectroscopy Protocol

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The fluorescence lifetimes were measured with a partially home-built time-correlated single photon counting (TCSPC) setup as previously described (40 (link)). For excitation, a mode-locked titanium-doped sapphire (Ti:Sa) laser (Tsunami 3941-X3BB, Spectra-Physics, Darmstadt, Germany) was pumped by a 10 W continuous wave diode pumped solid state laser (Millennia eV, Spectra-Physics, 532 nm). The Ti:Sa laser provided pulses of 775 nm central wavelength with a repetition rate of 80 MHz. With the help of an acousto-optic modulator, the repetition rate was reduced to 8 MHz and the excitation wavelength of 388 nm was obtained by SHG in a BBO crystal (frequency doubler and pulse selector, Model 3980, Spectra-Physics). Excitation pulses of about 0.1 nJ at 388 nm were applied to the sample. The sample was prepared in a 10 × 4 mm quartz cuvette (29-F/Q/10, Starna) with a fixed temperature of 20°C. Emission filters (GG395, GG400, Schott AG, Mainz, Germany) suppressed excitation stray light. The instrument response function (IRF, FWHM 200 ps) was obtained without emission filters using a TiO2 suspension as scattering sample. For single-photon detection, a photomultiplier tube (PMT, PMA-C 182-M, PicoQuant, Berlin, Germany) and a TimeHarp 260 PICO Single PCIe card (PicoQuant) were used. Multi-exponential fitting was carried out with FluoFit Pro 4.6 (PicoQuant) (64 ).
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5

Photophysical Characterization of Luminescent Materials

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UV–vis absorption spectra were measured with a UV–visible NIR spectrophotometer system (HITACHI U‐3310). Steady‐state emission spectra were measured with a spectrofluorometer (Edinburgh FLS920) and lifetime decay profiles were measured with a time‐correlated single photon counting (TCSPC) system coupled with a mode‐locked Ti:Sapphire laser (Spectra Physics, Model 3960) followed by a pulse picker (Spectra Physics, Model 3980). The picked pulse then passed through a frequency‐doubling crystal (BBO) to generate the excitation source. Last, the polarizer between the sample chamber and detector was set at magic angle relative to the excitation source in order to eliminate the polarization effects. All solution samples were degassed using at least three freeze‐pump‐thaw cycles. Photoluminescence quantum yields in solution at RT were calculated using Coumarin 102 (C102) in methanol (Q.Y. = 0.87) as the standard with corrections on refractive indices of different solvents, while quantum yields in PMMA thin film were measured by an integrated sphere. Lifetimes for thin films were performed by an Edinburgh FLS980 time‐correlated single photon counting (TCSPC) system with an EPL‐375 diode laser as the excitation source.
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6

Time-Resolved Luminescence Analysis of Thin Films

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For emission lifetime measurements a Hamamatsu HPDTA streak camera is employed. A Ti:sapphire laser (Tsunami, Newport Spectra-Physics GmbH) is used as the light source. The repetition rate of the laser is reduced to 400 kHz using a pulse selector (Model 3980, Newport Spectra-Physics GmbH). Afterwards the fundamental beam of the oscillator is frequency doubled to yield the 375 nm pump beam. The thin film sample is placed in a ca. 451 angle with respect to the excitation beam and emission light is collected from the back side of the sample in 901 geometry. The emission is detected by the streak camera via a CHROMEX spectrograph that images a 140 nm broad spectral window on the entrance slit of the streak scope. The experimental response of the streak camera is determined by the scattering signal of a blank NiO x -nanoparticle film. The deconvolution of the experimental response function and the luminescence decay is done in GNU Octave. 41
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