Scanning electron microscopy (SEM) was conducted with a ZEISS EVO MA 15 SEM. The Energy Dispersive Spectroscopy (EDS) detector was a silicon drift detector (SDD) X-MaxN 150 mm2 by Oxford Instruments. EDS mappings were analysed with AZTEC 4.2. Thin sections were prepared from c. 30 µm thick slices and the microscopical analysis conducted with a Keyence VHX-6000 digital microscope. All specimens are housed in the Provincial Museum Division, The Rooms Corporation of Newfoundland and Labrador, St. John’s, Newfoundland, Canada (NFM).
X maxn 150 mm2
Manufactured by Oxford Instruments
Sourced in Japan
The X-MaxN 150 mm2 is an energy-dispersive X-ray (EDX) detector designed for use in scanning electron microscopes (SEMs) and other X-ray analysis systems. It features a silicon drift detector (SDD) with an active area of 150 mm2, providing high-resolution X-ray spectroscopy capabilities. The X-MaxN 150 mm2 is optimized for rapid and sensitive elemental analysis of a wide range of sample types.
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4 protocols using x maxn 150 mm2
1
Scanning Electron Microscopy and EDS Analysis
2
Characterization of Calcite Grains
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We observed the polished sections using an FE-SEM (JEOL, JSM-7001F, at Kyoto University) equipped with energy-dispersive x-ray spectroscopy (EDX) (Oxford Instruments, X-MaxN 150 mm2) operated at 10 kV and selected 12 calcite grains belonging to type 1 (25 ) ~30 to 50 μm in size (CC-3, CC-6, CC-7, CC-10, CC-25, CC-27, CC-36, C5K, C7K, C10K, C15K, and C16K), which are less cracked and seem to have inclusions [process (1) in fig. S1].
3
Imaging Mycobacterium NTM and Ash Cultures
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NTM colony morphologies were imaged on a dissecting microscope at total magnification of 80X (Ken‐A‐Vision). Acid‐fast isolates were identified with Ziehl‐Neelsen staining and imaged by light microscopy at total magnification of 1,000× using a Laxco SeBa Pro 4 microscope.
SEM was performed on Kīlauea‐derived M. abscessus and Mycobacterium chelonae that were cultured with volcanic ash. NTM and ash cultures were prepared by inoculating 1 × 106 NTM cells into 1 ml 7H9 broth containing 1 mg of fine ash and incubated on a rotary shaker at 37°C for 48 hr. The NTM‐ash cultures were deposited onto Whatman No. 5 filter paper (2.5 μm) and fixed by submersion in 2.5% glutaraldehyde diluted with 0.1 M cacodylate buffer. Imaging and chemical analyses were conducted on a Tescan VEGA3 Variable Pressure SEM equipped with two Oxford Instruments XmaxN 150 mm2 silicon drift detectors for EDX.
SEM was performed on Kīlauea‐derived M. abscessus and Mycobacterium chelonae that were cultured with volcanic ash. NTM and ash cultures were prepared by inoculating 1 × 106 NTM cells into 1 ml 7H9 broth containing 1 mg of fine ash and incubated on a rotary shaker at 37°C for 48 hr. The NTM‐ash cultures were deposited onto Whatman No. 5 filter paper (2.5 μm) and fixed by submersion in 2.5% glutaraldehyde diluted with 0.1 M cacodylate buffer. Imaging and chemical analyses were conducted on a Tescan VEGA3 Variable Pressure SEM equipped with two Oxford Instruments XmaxN 150 mm2 silicon drift detectors for EDX.
4
Analyzing Itokawa Regolith Particles
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We examined surface features of 10 regolith particles (average diameters = 68–241 μm) including iron sulfide (Supplementary Table. 1 ) using a field emission SEM (FE-SEM; Hitachi SU6600) at the ESCuC after the initial routine description. The particles were placed on an Au-coated holder for SEM observations, without a conductive coating, using an electrostatically controlled micromanipulation system. Until these SEM observation, the Itokawa particles had never been exposed to an atmospheric environment, thus minimizing the contamination and alteration of the studied particles66 (link). We performed secondary electron (SE) imaging at accelerating voltages of 1.5 and/or 2.0 kV under high vacuum with an electron beam current of ~10 pA.
Three Itokawa particles (RA-QD02-0286, RA-QD02-0292, and RA-QD02-0325) were transferred onto an adhesive carbon-conductive tape for further analysis. We determined the elemental compositions of their surfaces with an energy-dispersive X-ray spectrometer (EDX) using an FE-SEM (Hitachi SU6600) equipped with a X-MaxN 150 mm2 (Oxford Instruments) in JAXA and an FE-SEM (Hitachi SU6600) equipped with a Bruker XFlash® FlatQUAD detector at the Institute for Molecular Science (IMS, Higashi-Okazaki, Japan). The accelerating voltage for SE imaging was 1.5 kV, whereas for EDS analysis we used 5 and 10 kV.
Three Itokawa particles (RA-QD02-0286, RA-QD02-0292, and RA-QD02-0325) were transferred onto an adhesive carbon-conductive tape for further analysis. We determined the elemental compositions of their surfaces with an energy-dispersive X-ray spectrometer (EDX) using an FE-SEM (Hitachi SU6600) equipped with a X-MaxN 150 mm2 (Oxford Instruments) in JAXA and an FE-SEM (Hitachi SU6600) equipped with a Bruker XFlash® FlatQUAD detector at the Institute for Molecular Science (IMS, Higashi-Okazaki, Japan). The accelerating voltage for SE imaging was 1.5 kV, whereas for EDS analysis we used 5 and 10 kV.
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