The frozen samples were then mounted on a holder under liquid nitrogen in a specialized loading station (EM VCM; Leica) and transferred under cryogenic conditions (EM VCT500; Leica) to a sample preparation freeze fracture device (EM ACE900; Leica). In that device, the samples were fractured by the rapid stroke of a cryogenically cooled knife, exposing the inner part of the sandwiched disks. After fracturing, the samples were etched at -100°C for 10 min to sublime ice from the sample surface, and were coated with 3 nm carbon.
Samples were imaged in a Gemini SEM (Zeiss) by a secondary electron in-lens detector, while maintaining an operating temperature of −120°C (