Nano-indentation was performed on a MTS NanoXp, with a spherical diamond tip (~4.2 μm radius, 90° cone angle, from Synton MDP) to a maximum displacement of 500 nm with 50 µm spacing between indents. Indent impressions were imaged using a Zeiss Merlin FEG SEM. Surface morphology was determined using a Digital Instruments Dimension 3100 AFM in contact mode using Bruker CONTV-A tips (nominal tip radius 10 nm).
Dimension 3100 afm
Manufactured by Bruker
Sourced in United States
The Dimension 3100 AFM is an atomic force microscope produced by Bruker. It is designed to provide high-resolution imaging and analysis of surface topography at the nanoscale level. The instrument uses a sharp, oscillating probe to scan the surface, allowing users to visualize and measure features with sub-nanometer resolution.
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11 protocols using dimension 3100 afm
1
Nanoscale Surface Characterization
2
High-Resolution Atomic Force Microscopy
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Atomic force microscopy was conducted on the etched specimens using a Dimension 3100 AFM (Bruker, Billerica, MA, USA), using a tapping technique to obtain the image. To obtain a high-resolution image, the scan rate was set at 0.5 Hz and the tip velocity was 30 µm/s.
3
Nanomechanical Characterization of Dentin
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A Dimension 3100 AFM (Bruker, Santa Barbara, CA, USA) was used with a TAP 150GD-G cantilever made from silicon with a gold reflex coating, resonant frequency of 150 kHz, and a nominal spring constant of 5 N/m (Budget Sensors, Bulgaria) for imaging the surface and nanoindentation to calculate the Young’s modulus of dentin35 (link). After calibrating the spring constant and deflection sensitivity of the cantilever, force curves were measured by moving the tip into the dentin surface up to a constant force of 125 nN. (n = 3) Each of the force curves were 100 nm apart in a 1 μm2 grid. The Young’s Modulus was calculated from the contact portion of the force curve using the Hertzian model 5 μm2 images were measured using tapping mode and were processed and analyzed using a commercial software NanoScope Analysis.
4
Measuring Tendon and Hydrogel Elasticity
5
Tapping Mode AFM Imaging of dsDNA
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All samples were imaged in tapping mode (amplitude modulation), in air, with a Bruker Dimension 3100 AFM (Bruker Nanosurfaces, Santa Barbara, USA) using OTESPA etched Si probes. Substrates were randomly sampled to ensure a statistically relevant population of dsDNA molecules were observed, typically n ≈ 1000 dsDNA per sampled population. We note, only samples where the termini could be discerned unambiguously, that fell entirely within the imaging area, and that did not overlap with one and other, were analyzed.
6
Imaging of Cross-linked Cellulose Fibres
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Small sections of fibre were imaged using scanning electron microscopy (SEM) or AFM. Samples for SEM were secured to an aluminium stub with carbon tape, sputter-coated with a thin layer of gold and viewed under a JEOL 820 SEM in secondary electron mode. For AFM, fibre sections were placed onto 10 × 5 mm microscope slides using silver dag, and imaging was carried out using the Bruker Dimension 3100 AFM in tapping mode with an MPP-11100-10 probe. Multiple regions of 2 × 2 µm were considered. Images of fibres cross-linked with 0.25 mM cross-linking concentration were compared with those previously taken of standard cross-linked fibres and those without any cross-linking (imaged using multimode AFM with Nanoscope III control). Only fibres with this low cross-linking concentration were imaged so as to investigate whether fibrillar structure was maintained even with significant reduction in concentration.
7
AFM Imaging of Bacterial Cell Morphology
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Bacterial cultures of S. mutans DSM 20523 (72 h) and P. aeruginosa (PAO1; 24 h) were grown in TSB at 37 °C. The overnight cultures were washed twice (5,500 g, 3 min) in dH2O and the bacteria were then incubated in 5–7 mg/ml OligoG CF-5/20 for 20 min. Excess OligoG CF-5/20 was removed (2,500 g, 6 min) before resuspending the bacterial cells in dH2O and drying on 0.01% poly-L-lysine coated mica plates for imaging. A Dimension 3100 AFM (Bruker) was employed, using tapping mode operation in air (0.8 Hz scan speed).
8
Exfoliation and Transfer of MoS2 Flakes
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The samples were prepared on thin
microscope glass (170 μm) coverslips (Menzel-Gläser #1.5
D 263 M). The coverslips were cleaned in acetone and isopropyl alcohol
at 50 °C in ultrasonicator and then dried with compressed nitrogen,
followed by O2 plasma cleaning.
The MoS2 flakes were mechanically exfoliated from a crystal (HQ Graphene)
into a polydimethylsiloxane (PDMS) stamp. Then the flakes were transferred
to glass coverslips via dry-transfer technique.60 (link) Thicknesses of the studied flakes were measured in ambient
conditions using a Bruker Dimension 3100 AFM in noncontact mode. The
thickness was obtained with the Gwyddion software. The error bar is
given by statistical analysis of several areas of the scan (seeSI section 2).
microscope glass (170 μm) coverslips (Menzel-Gläser #1.5
D 263 M). The coverslips were cleaned in acetone and isopropyl alcohol
at 50 °C in ultrasonicator and then dried with compressed nitrogen,
followed by O2 plasma cleaning.
The MoS2 flakes were mechanically exfoliated from a crystal (HQ Graphene)
into a polydimethylsiloxane (PDMS) stamp. Then the flakes were transferred
to glass coverslips via dry-transfer technique.60 (link) Thicknesses of the studied flakes were measured in ambient
conditions using a Bruker Dimension 3100 AFM in noncontact mode. The
thickness was obtained with the Gwyddion software. The error bar is
given by statistical analysis of several areas of the scan (see
9
Graphene Characterization using Raman Spectroscopy
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The graphene for laser spot size determination in the Supporting Information was made by mechanical exfoliation and then transferred to a PMMA substrate.33 (link) The CVD graphene was grown on copper using a conventional methane feedstock and was then transferred onto PET film as described in the Supporting Information . For the bending test, the CVD graphene/PET film was attached to PMMA beam by PMMA solution adhesive.
SEM images were obtained using a Philips XL30 FEGSEM. The sample surface was coated with gold before analysis. AFM images were obtained from the surfaces of the CVD graphene using a Dimension 3100 AFM (Bruker) in the tapping mode in conjunction with the “TESPA” probe (Bruker).
Raman spectra were obtained using Renishaw 1000 spectrometers equipped with an argon laser (λ = 514 nm). The sample on the PMMA was deformed in a four-point bending rig, with the strain monitored using a resistance strain gauge attached to the PMMA beam adjacent to the CVD graphene/PET film.33 (link) In all cases, the incident laser polarization is kept parallel to the strain. The simulation of Raman spectra was carried out using Wolfram Mathematica 9.
SEM images were obtained using a Philips XL30 FEGSEM. The sample surface was coated with gold before analysis. AFM images were obtained from the surfaces of the CVD graphene using a Dimension 3100 AFM (Bruker) in the tapping mode in conjunction with the “TESPA” probe (Bruker).
Raman spectra were obtained using Renishaw 1000 spectrometers equipped with an argon laser (λ = 514 nm). The sample on the PMMA was deformed in a four-point bending rig, with the strain monitored using a resistance strain gauge attached to the PMMA beam adjacent to the CVD graphene/PET film.33 (link) In all cases, the incident laser polarization is kept parallel to the strain. The simulation of Raman spectra was carried out using Wolfram Mathematica 9.
10
Characterization of Graphene Oxide by FTIR, XRD, AFM, and Raman
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Transmission mode Fourier-transform infrared (FTIR) spectrum was obtained from dried GO powder mixed with KBr, using a Nicolet 5700 spectrometer (ThermoFisher Scientific Inc.). X-ray diffraction (XRD) was carried out on dried GO powder using an X’Pert DY609 X-ray diffractometer (Philips) with a Cu-Kα radiation source (λ=1.542 Å). Atomic force microscope (AFM) images were obtained using a Dimension 3100 AFM (Bruker) in the tapping mode in conjunction with a ‘TESPA’ probe (Bruker).
Raman spectra were obtained using Renishaw 1000/2000 spectrometers and a Horiba LabRAM HR Evolution spectrometer equipped with HeNe lasers (λ=633 nm) with laser spot sizes of around 1–2 μm. The incident laser polarization was parallel to the strain, whereas the scattered radiation was randomly polarized. The specimens were deformed in a four-point bending rig, and the strain was measured using a strain gauge placed close to the region being analysed [24 (link)].
Raman spectra were obtained using Renishaw 1000/2000 spectrometers and a Horiba LabRAM HR Evolution spectrometer equipped with HeNe lasers (λ=633 nm) with laser spot sizes of around 1–2 μm. The incident laser polarization was parallel to the strain, whereas the scattered radiation was randomly polarized. The specimens were deformed in a four-point bending rig, and the strain was measured using a strain gauge placed close to the region being analysed [24 (link)].
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