As-synthesized products were characterized by means of a D/max-2550 PC X-ray diffractometer (XRD; Rigaku, Cu-Kα radiation), a scanning electron microscopy (SEM; S-4800), and a transmission electron microscopy (TEM; JEM-2100 F) equipped with an energy-dispersive X-ray spectrometer (EDX).
D max 2550 pc x ray diffractometer xrd
Manufactured by Rigaku
Sourced in Japan
The D/max-2550 PC X-ray diffractometer (XRD) is a laboratory instrument designed for the analysis of crystalline materials. It utilizes X-ray diffraction technology to identify and characterize the structure of various solid-state materials. The core function of the D/max-2550 PC XRD is to provide precise and reliable measurements of the atomic and molecular structure of samples.
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Lab products found in correlation
Jem 2100f, by Rigaku (3 mentions)
S4800, by Rigaku (2 mentions)
Jem 2100f, by JEOL (1 mentions)
Arx 400 nmr spectrometer, by Bruker (1 mentions)
Quantum yield spectrometer c11347 quantaurus qy, by Hamamatsu Photonics (1 mentions)
Lambda 365 spectrophotometer, by PerkinElmer (1 mentions)
Fls980 fluorescence spectrophotometer, by Edinburgh Instruments (1 mentions)
Asap 2020, by Micromeritics (1 mentions)
6 protocols using d max 2550 pc x ray diffractometer xrd
1
Comprehensive Material Characterization
2
Synthesis of Porous Se@SiO2 Nanospheres
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Porous Se@SiO2 nanospheres (College of Chemistry and Chemical Engineering, Shanghai University of Engineering Science, Shanghai, China) used herein were synthesized as described in our previous study.21 (link),23 (link) Firstly, Cu2−xSe nanocrystals were prepared and mixed with n-hexanol, n-hexane, deionized water, Triton X-100, and tetraethyl orthosilicate. [Cu(NH3)4]2+ was developed by adding ammonium hydroxide to the mixture. Oxygen was used to oxidize Se2− to develop Se quantum dots. In an alkaline environment, the silica was coated upon the Se quantum dots by orthosilicate hydrolysis, thus forming solid Se@SiO2 nanospheres. Then, the solid Se@SiO2 nanospheres were coated with polyvinylpyrrolidone. After treatment with hot water, the Se@SiO2 nanospheres formed porous structures. Porous Se@SiO2 nanospheres were characterized by means of a D/max-2550 PC X-ray diffractometer (XRD; Rigaku Corporation, Tokyo, Japan; Cu-Kα radiation) and transmission electron microscopy (TEM; JEM-2100F; JEOL, Tokyo, Japan). Synthesized porous Se@SiO2 nanospheres were then dispersed in deionized water for subsequent experiments.
3
Porous Se@SiO2 Nanocomposite Synthesis
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Porous Se@SiO2 nanocomposites were prepared according to our previous method35 (link), and characterized by means of a D/max-2550 PC X-ray diffractometer (XRD; Rigaku, Cu-Kα radiation), a transmission electron microscopy (TEM; JEM-2100F). Besides the control release of Se were repeated at PH 7.4. As-synthesized porous Se@SiO2 nanocomposites were dispersed in deionized water for further use.
4
Synthesis and Characterization of Porous Se@SiO2 Nanoparticles
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Porous Se@SiO2 nanoparticles were synthesized as described previously.24 (link) The average particle size and morphology were observed using transmission electron microscopy (TEM; JEM-2100F). The Se@SiO2 nanoparticles were characterized using a D/max-2550 PC X-ray diffractometer (XRD; Rigaku, Cu-Kα radiation). The porous Se@SiO2 nanocomposite was dispersed in phosphate buffered solution (PBS) to make a stock of 10 mg/mL and stored at 4 °C for further use.
5
Comprehensive Analytical Characterization Protocol
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All chemicals were purchased from J&K Chemistry, Sigma-Aldrich and TCI, and used directly without further purification. Cells were obtained from the American Type Culture Collection.
1H NMR and 13C NMR spectra were recorded with a Bruker ARX 400 NMR spectrometer. High-resolution mass spectra (HRMS) were recorded on a GCT premier CAB048 mass spectrometer operating in a MALDI-TOF mode. UV-Vis absorption spectra were recorded on a PerkinElmer Lambda 365 Spectrophotometer. Photoluminescence (PL) spectra were recorded on a Fluorolog®-3 Spectrofluorometer. The absolute fluorescence quantum yield was measured using a Hamamatsu quantum yield spectrometer C11347 Quantaurus QY. The lifetime was measured on an Edinburgh FLS980 fluorescence spectrophotometer equipped with a xenon arc lamp (Xe900). Single crystal X-ray diffraction was performed on a D/max-2550 PC X-ray diffractometer (XRD; Rigaku, Cu-Kα radiation). The crystal data were collected on an Oxford Diffraction Xcalibur Atlas Gemini ultra instrument. The scanning electron microscope image was taken using a JSM-6390 scanning electron microscope. The fluorescence images were taken by confocal laser scanning microscope (CLSM) (Zeiss, Germany).
1H NMR and 13C NMR spectra were recorded with a Bruker ARX 400 NMR spectrometer. High-resolution mass spectra (HRMS) were recorded on a GCT premier CAB048 mass spectrometer operating in a MALDI-TOF mode. UV-Vis absorption spectra were recorded on a PerkinElmer Lambda 365 Spectrophotometer. Photoluminescence (PL) spectra were recorded on a Fluorolog®-3 Spectrofluorometer. The absolute fluorescence quantum yield was measured using a Hamamatsu quantum yield spectrometer C11347 Quantaurus QY. The lifetime was measured on an Edinburgh FLS980 fluorescence spectrophotometer equipped with a xenon arc lamp (Xe900). Single crystal X-ray diffraction was performed on a D/max-2550 PC X-ray diffractometer (XRD; Rigaku, Cu-Kα radiation). The crystal data were collected on an Oxford Diffraction Xcalibur Atlas Gemini ultra instrument. The scanning electron microscope image was taken using a JSM-6390 scanning electron microscope. The fluorescence images were taken by confocal laser scanning microscope (CLSM) (Zeiss, Germany).
6
Comprehensive Characterization of Synthesized Products
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The as-synthesized products were characterized with a D/max-2550 PC X-ray diffractometer (XRD; Rigaku, Cu-Ka radiation), a scanning electron microscope (SEM; S-4800), a transmission electron microscope (TEM; JEM-2100F) equipped with an energy dispersive X-ray spectrometer (EDX), and an X-ray photoelectron spectrometer (ESCALab MKII) with an excitation source of Mg-K radiation. The surface area and pore size distribution of the products were determined by Brunauer-Emmett-Teller (BET) nitrogen adsorption-desorption and Barrett-Joyner-Halenda (BJH) methods (Micromeritics, ASAP2020). The electrical properties of samples were tested in situ by using a TEM-scanning tunneling microscope (TEM-STM) holder (commercialized by Nanofactory Instruments AB, GÖteborg, Sweden), which was arranged within a 200 kV high resolution TEM (JEM-2100F) with beam-blank irradiation of a low illumination.
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