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Miniflex automated x ray diffractometer

Manufactured by Rigaku
Sourced in United States

The MiniFlex automated X-ray diffractometer is a compact, benchtop instrument designed for phase identification and quantification of crystalline materials. It utilizes a 600 W X-ray source to generate X-rays that interact with the sample, producing a diffraction pattern that can be analyzed to determine the sample's crystalline structure and composition. The MiniFlex is a versatile tool that can be used in a variety of applications, including materials science, chemistry, and geology.

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2 protocols using miniflex automated x ray diffractometer

1

Polymer Characterization by XRD

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Physical states of all the synthesized polymers were determined by XRD analysis. TB and PBCs were analyzed at room temperature by MiniFlex automated X-ray diffractometer (Rigaku, The Woodlands, Texas, USA) equipped with Ni-filtered Cu-kα radiation (30 kV and 15 mA). The diffraction angle was ranging from 5° to 45° with 1° per min of increment. Jade 8+ (Material Data, Inc, Livermore, CA) was employed to process the diffraction patterns.
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2

Characterization of Docetaxel Nanomicelle Formulation

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To perform the 1H NMR experiment, the freeze-dried powder of DTX nanomicellar formulation (F-2) and blank nanomicellar formulation were dissolved in D2O at a concentration of 2 mg/mL. The 1H NMR spectra was recorded on Varian Inova 400 MHz NMR spectrometer (Varian, Palo Alto, CA, USA) at 25 °C. Chemical shifts were measured in parts per million (0–12 ppm) with a delay period of 4 s. For easy comparison, spectra from all three samples including solvent blank (D2O) are plotted in one graph (Figure 2a). FT–IR spectra was acquired on Thermo-Scientific Nicolet iZ10, with an ATR diamond and DTGS detector, using pure DTX, blank, and DTX loaded nanomicelles (F-2) at a scanning range of 650–4000 cm−1 (Figure 3). XRD analysis was carried out to determine the crystallinity of the formulation components of the DTX alone, DTX nanomicelles (F-2), and blank nanomicelles (Figure 4). The MiniFlex-automated X-ray diffractometer (Rigaku, The Woodlands, TX, USA) was used which is equipped with Ni-filtered Cu Kα radiation operating at 30 kV and 15 mA at room temperature. The diffraction angle covered was from 2θ = 5° to 2θ = 40° with a step size of 0.05°/step and a counting time of 2.5 s/steps (1.2°/min) for 30 min. The diffraction patterns were processed using Jade 8+ software (Materials Data, Inc., Livermore, CA, USA).
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